|
[1] L. Cobb, “The causes of global warming: A graphical approach”, http://www.quaker.org/clq/2007/TQE158-EN-GlobalWarming-V1.html, vol. 7, pp. 158, 2007. [2] M. A. Green, “Recent developments and future prospects for third generation and other advanced cells”, Center for Photovoltaic Devices and Systems, University of New South Wales, 2006. [3] G. Conibeer, M. Green, R. Corkish, Y. Cho, E. C. Cho, C. W. Jiang, T. Fangsuwannarak, E. Pink, Y. Huang, T. Puzzer, T. Trupke, B. Richards, A. Shalav, and K. L. Lin, “Silicon nanostructures for third generation photovoltaic solar cells”, Thin Solid Films, vol. 511-512, pp. 654-662, 2006. [4] E. C. Cho, M. A. Green, G. Conibeer, D. Song, Y. H. Cho, G. Scardera, S. Huang, S. Park, X. J. Hao, Y. Huang, and L. V. Dao , “Silicon quantum dots in a dielectric matrix for all-silicon tandem solar cells”, Advances in OptoElectronics, vol. 2007, pp. 69578, 2007. [5] G. Conibeer, M. Green, E. C. Cho, D. Konig, Y. H. Cho, T. Fangsuwannarak, G. Scardera, E. Pink, Y. Huang, T. Puzzer, S. Huang, D. Song, C. Flynn, S. Park, X. Hao, and D. Mansfield, “Silicon quantum dot nanostructures for tandem photovoltaic cells”, Thin Solid Films, vol. 516, pp. 6748-6756, 2008. [6] M. S. Yang, K. S. Cho, J. H. Jhe, S. Y. Seo, J. H. Shin, K. J. Kim, and D. W. Moon, “Effect of nitride passivation on the visible photoluminescence from Si-nanocrystals”, Appl. Phys. Lett., vol. 85, pp. 3408, 2004. [7] H. Bo, M. Z. Quan, X. Jing, Z. Lei, Z. N. Sheng, L. Feng, S. Cheng, S. Ling, Z. C. Yue, Y. Z. Shan, and Y. Y. Ting, “Characterization of AZO/p-Si heterojunction prepared by DC magnetron sputtering”, Mater. Sci. Semicond. Process., vol. 12, pp. 248-252, 2009. [8] C. Agashe, O. Kluth, J. Hupkes, U. Zastrow, B. Rech, and M. Wuttig, “Efforts to improve carrier mobility in radio frequency sputtered aluminum doped zinc oxide films”, J. Appl. Phys., vol. 95, pp.4, 2004. [9] K. K. Kim, S. Niki, J. Y. Oh, J. O. Song, T. Y. Seong, S. J. Park, S. Fujita, and S. W. Kim, “High electron concentration and mobility in Al-doped n-ZnO epilayer achieved via dopant activation using rapid-thermal annealing”, J. Appl. Phys., vol. 97, pp. 066103, 2005. [10] S. Mridha, and D. Basak, “Aluminium doped ZnO films: electrical, optical and photoresponse studies”, J. Phys. D: Appl. Phys., vol. 40, pp. 6902-6907, 2007. [11] D. Song, E. C. Cho, G. Conibeer, Y. Huang, C. Flynn, and M. A. Green, “Structural characterization of annealed Si1-xCx/SiC multilayers targeting formation of Si nanocrystals in a SiC matrix”, J. Appl. Phys., vol. 103, pp. 083544, 2008. [12] X. J. Hao, A. P. Podhorodecki, Y. S. Shen, G. Zatryb, J. Misiewicz, and M. A. Green, “Effects of Si-rich oxide layer stoichiometry on the structural and optical properties of Si QD/SiO2 multilayer films”, Nanotechnology, vol. 20, pp. 485703, 2009. [13] T. W. Kim, C. H. Cho, B. H. Kim, and S. J. Park, “Quantum confinement effect in crystalline silicon quantum dots in silicon nitride grown using SiH4 and NH3”, Appl. Phys. Lett., vol. 88, pp. 123102, 2006. [14] S. Park, E. Cho, D. Song, G. Conibeer, and M. A. Green, “n-type silicon quantum dots and p-type crystalline silicon heteroface solar cells”, Sol. Energy Mater. Sol. Cells, vol. 93, pp. 684-690, 2009. [15] M. L. Tu, Y. K. Su, and C. Y. Ma, “Nitrogen-doped p-type ZnO films prepared from nitrogen gas radio-frequency magnetron sputtering”, J. Appl. Phys., vol. 100, pp. 053705, 2006. [16] C. Wang, Z. Ji, J. Xi, J. Du, and Z. Ye, “Fabrication and characteristics of the low-resistive p-type ZnO thin films by DC reactive magnetron sputtering”, Mater. Lett., vol. 60, pp. 912-914, 2006. [17] C. C. Lin, S. Y. Chen, S. Y. Cheng, and H. Y. Lee, “Properties of nitrogen-implanted p-type ZnO films grown on Si3N4/Si by radio-frequency magnetron sputtering”, Appl. Phys. Lett., vol. 84, pp. 24, 2004. [18] M. Dutta, and D. Basak, “p-ZnO/n-Si heterojunction: Sol-gel fabrication, photoresponse properties, and transport mechanism”, Appl. Phys. Lett., vol.92, pp. 212112, 2008. [19] D. K. Hwang, M. S. Oh, Y. S. Choi, and S. J. Park, “Effect of pressure on the properties of phosphorus-doped p-type ZnO thin films grown by radio frequency-magnetron sputtering”, Appl. Phys. Lett., vol. 92, pp. 161109, 2008. [20] T. W. Kim, J. W. Shin, J. Y. Lee, J. H. Jung, J. W. Lee, W. K. Choi, and S. Jin, “Electron-beam-induced formation of Zn nanocrystal islands in a SiO2 layer”, Appl. Phys. Lett., vol. 90, pp. 051915, 2007. [21] J. M. Yuk, J. Y. Lee, Y. S. No, T. W. Kim, and W. K. Choi, “Transformation mechanisms from metallic Zn nanocrystals to insulating ZnSiO3 nanocrystals in a SiO2 matrix due to thermal treatment”, Appl. Phys. Lett., vol. 93, pp. 221910, 2008. [22] A. A. Ibrahim, A. Ashour, “ZnO/Si solar cell fabricated by spray pyrolysis technique”, J. Mater. Sci.: Mater. Electron, vol. 17, pp. 835-839, 2006. [23] F. M. Smits, “Measurement of sheet resistivities with the four-point probe”, The Bell System Technical Journal, pp. 711-718, 1957. [24] X. T. Zhang, Y. C. Liu, Z. Z. Zhi, J. Y. Zhang, Y. M. Lu, D. Z. Shen, W. Xu, G. Z. Zhong, X. W. Fan, and X. G. Kong, “Resonant Raman scattering and photoluminescence from high-quality nanocrystalline ZnO thin films prepared by thermal oxidation of ZnS thin films”, J. Phys. D: Appl. Phys., vol. 34, pp. 3430-3433, 2001. [25] C. V. Raman, and K. S. Krishna, “A new type of secondary radiation”, Nature, vol. 121, pp. 501, 1928. [26] K. A. Alim, V. A. Fonoberov, M. Shamsa, and A. A. Balandin, “Micro-Raman investigation of optical phonons in ZnO nanocrystals”, J. Appl. Phys., vol. 97, pp. 124313, 2005. [27] A. Kaschner, U. Haboeck, M. Strassburg, G. Kaczmarczyk, A. Hoffmann, C. Thomsen, A. Zeuner, H. R. Alves, D. M. Hofmann, and B. K. Meyer, “Nitrogen-related local vibrational modes in ZnO:N”, Appl. Phys. Lett., vol. 80, pp. 11, 2002. [28] G. Viera, S. Huet, and L. Boufendi, “Crystal size and temperature measurements in nanostructured silicon using Raman spectroscopy”, J. Appl. Phys., vol. 90, pp. 8, 2001. [29] D. Song, E. C. Cho, G. Conibeer, C. Flynn, Y. Huang, M. A. Green, “Structural, electrical and photovoltaic characterization of Si nanocrystals embedded SiC matrix and Si nanocrystals/c-Si heterojunction devices”, Sol. Energy Mater. Sol. Cells, vol. 92, pp. 474-481, 2008. [30] B. Z. Dong, G. J. Fang, J. F. Wang, W. J. Guan, and X. Z. Zhao, “Effect of thickness on structural, electrical, and optical properties of ZnO:Al films deposited by pulsed laser deposition”, J. Appl. Phys., vol. 101, pp. 033713, 2007. [31] N. R. Aghamalyan, I. A. Gambaryan, E. K. Goulanian, R. K. Hovsepyan, R. B. Kostanyan, S. I. Petrosyan, E. S. Vardanyan, and A. F. Zerrouk, “Influence of thermal annealing on optical and electrical properties of ZnO films prepared by electron beam evaporation”, Semicond. Sci. Technol., vol. 18, pp. 525-529, 2003. [32] X. J. Hao, E. C. Cho, C. Flynn, Y. S. Shen, G. Conibeer, and M. A. Green, “Effects of boron doping on the structural and optical properties of silicon nanocrystals in a silicon dioxide matrix”, Nanotechnology, vol. 19, pp. 424019, 2008. [33] T. Kaneko, M. Wakagi, K. I. Onisawa, and T. Minemura, “Change in crystalline morphologies of polycrystalline silicon films prepared by radio-frequency plasma-enhanced chemical vapor deposition using SiF4+H2 gas mixture at 350 ℃”, Appl. Phys. Lett., vol. 64, pp. 14, 1994. [34] X. J. Hao, E. C. Cho, C. Flynn, Y. S. Shen, S. C. Park, G. Conibeer, and M. A. Green, “Synthesis and characterization of boron-doped Si quantum dots for all-Si quantum dot tandem solar cells”, Sol. Energy Mater. Sol. Cells, vol. 93, pp. 273-279, 2009. [35] Y. Nakano, T. Morikawa, T. Ohwaki, and Y. Taga, “Electrical characterization of p-type N-doped ZnO films prepared by thermal oxidation of sputtered Zn3N2 films”, Appl. Phys. Lett., vol. 88, pp. 172103, 2006. [36] N. Y. Garces, L. Wang, N. C. Giles, L. E. Halliburton, G. Cantwell, and D. B. Eason, “Molecular nitrogen (N2-) acceptors and isolated nitrogen (N-) acceptors in ZnO crystals”, J. Appl. Phys., vol. 94, pp. 1, 2003. [37] S. Mridha, and D. Basak, “Ultraviolet and visible photoresponse properties of n-ZnO/p-Si heterojunction”, J. Appl. Phys., vol. 101, pp. 083102, 2007. [38] Y. Okada, and Y. Tokumaru, “Precise determination of lattice parameter and thermal expansion coefficient of silicon between 300 and 1500 K”, J. Appl. Phys., vol. 56, pp. 2, 1984.
|