臺灣博碩士論文加值系統

影像殘留（Image Sticking）是影響液晶平面顯示器可靠度品質的關鍵因素之一。影像殘留的生成原因眾多且交互作用關係複雜故分析不易。但我們可藉由閃爍（Flicker）訊號最小化以調整適當的驅動參數電壓，減少面板累積的殘存電荷進而改善影像殘留的問題。
目前平面顯示器業界的現行測量系統無法測得面板極高和極低灰階（Gray Level）下的閃爍訊號，因此無法對驅動電壓做最佳化使得低灰階電壓長期驅動於不正確的位置，增加面板殘存電荷的累積。有鑑於此，本研究嘗試開發一套對所有灰階都能穩定測量閃爍訊號的系統。
我們比較業界現行的閃爍量測系統和自製閃爍量測系統的量測灰階範圍，證實自製閃爍量測系統的量測灰階範圍較廣，甚至可涵蓋所有範圍。最後我們經由影像殘留確認現行面板與自製閃爍量測系統各自設定的電壓參數的結果差異。

Image sticking is one of the important factors to influence the quality and reliability of liquid crystal displays (LCDs). The mechanism of producing image sticking is very complicate, and it is not easy to analyze and overcome. However, the image sticking of LCDs can be improved by adjusting the driving to reach a minimized flicker signal, which can reduce the ions accumulation on the surfaces.
The flicker measurement system adopted by current LCDs industry have limits for measuring the flicker signals of LCDs operated at the high and low gray levels. Therefore, the driving of LCDs cannot be optimized at the low gray levels, and it causes the ions accumulation on the surfaces.
In this work, a flicker measurement system suitable for all grey levels was proposed and developed. The performance of our developed system was compared to the commercial system. The results showed that our system had superior detection sensitivity of flicker for all grey levels. Finally, we compared the driving setting, determined by the minimization of flicker signal, and the corresponding imaging sticking.

摘要 I
Abstract II
誌謝 III
目錄 V
表目錄 VIII
圖目錄 IX
第一章 緒論 1
1-1 前言 1
1-2 研究動機 1
1-3 影像殘留介紹 2
1-4 本論文研究重點及目的 3
第二章 原理與理論 4
2-1 影像殘留產生 4
2-2 量測閃爍訊號 12
2-3 鎖相放大原理 21
2-4 濾波器 30
第三章 實驗方法與內容 35
3-1 鎖相放大實際設計 35
3-2 鎖相放大器檢測 37
3-3 參考訊號轉換 43
3-4 濾波器設計 46
3-5 系統設計架構 47
3-6 實際面板量測 49
第四章 實驗結果 55
4-1 新舊系統測量範圍比較 55
4-2 各灰階中心電壓值＆Feed-through趨勢 63
4-3 電壓差＆階數差比較 66
4-4 影像殘留結果分析 67
第五章 結論與未來展望 70
參考文獻 72

[1] G. H. Heilmeier, L. A. Zanoni and L. A. Barton, “Dynamic Scattering: A New Electrooptic Effect in Certain Classes of Nematic Liquid Crystals,” IEEE, 56 (7), 1162−1171 (1968).
[2] H. Kawamoto, “The History of Liquid-Crystal Displays,” IEEE, 90 (4), 460−500 (2002).
[3] D.-G. Lee, I.-H. Kim, H.-S. Soh, and B. C. Ann, “A Measurement and Analysis Method of 影像殘留 in LCD,” SID, 33 (1), 324−327 (2002).
[4] P.-L. Chen, S.-H. Chen and F.-C. Su, “An effective method for evaluating the image-sticking effect of TFT-LCDs by interpretative modelling of optical measurements,” Liq. Cryst., 27 (7), , 965−975 (2000).
[5] 魏霖杰，“分析殘餘直流電造成畫面閃爍的影響” ，中興大學，碩士論文，民國九十三年。
[6] 吳明坤，“STN LCD 於不同信號下之影像殘留”，逢甲大學，碩士論文，民國九十四年。
[7] 楊士明，“液晶顯示器畫面產生抖動閃爍成因探討及解決方法之研究”，國立成功大學，碩士論文，民國九十三年。
[8] S. Kamagami, K. Sunohara, Y. Tanaka and H. Morita, “Display performance improvement in a TFD-LCD with reduced image-sticking,” SID, 1 (2), 219−222 (1991).
[9] 黃炳文，“STN LCD 影像殘留現象之探討”，逢甲大學，碩士論文，民國九十四年。
[10] 黃子洋，“液晶盒離子電荷動態分析”，國立交通大學，碩士論文，民國一百年。
[11] K. H. Yang and T. C. Chieu, “Transport Properties of Ions in Ferroelectric Liquid Crystal Cells,” Jpn. J. Appl. Phys., 28 (11), 2240−2246 (1989).
[12] K. H. Yang, T. C. Chieu, and S. Osofsky, “Depolarization field and ionic effects on the bistability of surface-stabilized ferroelectric liquid crystal devices,” Appl. Phys. Lett., 55 (2), 125−127 (1989).
[13] M. Mizusaki, T. Miyashita, T. Uchida, Y. Yamada, and Y. Ishii, “Generation mechanism of residual direct current voltage in a liquid crystal display and its evaluation parameters related to liquid crystal and alignment layer materials,” J. Appl. Phys., 102 (1), 014904−014910 (2007).
[14] M. Mizusaki, T. Miyashita, and T. Uchida, “Behavior of ion affecting 影像殘留 on liquid crystal displays under application of direct current voltage,” J. Appl. Phys., 108 (10), 104903−1049039 (2010).
[15] M. Mizusaki, T. Miyashita, and T. Uchida, “Kinetic analysis of 影像殘留 with adsorption and desorption of ions to a surface of an alignment layer,” J. Appl. Phys., 112 (4), 044510−044519 (2012).
[16] 戴亞翔，TFT-LCD面板的驅動與設計，五南圖書出版公司，台北，2006年。
[17] T. Tsukada, TFT/LCD Liquid-Crystal Displays Addressed by Thin-Film Transistors, Gordon and Breach Publishers, Tokyo, Japan, 1996.
[18] 林啟湟，液晶物理學講義-廣視角技術原理，P19~20，中山大學液晶顯示及應用實驗室。
[19] Stanford Research Systems, About Lock-In Amplifiers Application, http://www.thinksrs.com/downloads/PDFs/ApplicationNotes/AboutLIAs.pdf
[20] Analog device, AD630 Balanced Modulator/Demodulator Data Sheet, http://www.analog.com/static/imported-files/data_sheets/AD630.pdf
[21] Analog device, MT-048 TUTORIAL: Op Amp Noise Relationships: 1/f Noise, RMS Noise, and Equivalent Noise Bandwidth, http://www.analog.com/static/imported-files/tutorials/MT-048.pdf
[22] S. K. Sengupta, J. M. Farnham, and J. E. Whitten, “A Simple Low-Cost Lock-In Amplifier for the Laboratory,” J. Chem. Educ., 82 (9), 1399−1401 (2005).
[23] Texas Instruments, CMOS Micropower Phase-Locked Loop: CD4046B, http://www.ti.com/lit/ds/symlink/cd4046b.pdf