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In this thesis, the functional AlGaAs/InGaAs/GaAs heterostructure-emitter and heterostructure-base bipolar transistors (HEHBT's) with an abrupt or a graded confinement layer are fabricated and demonstrated. Due to the insertion of InGaAs quantum well at E-B junction, the discontinuity of valence band can be enchanced and the injection efficiency can be increased. The current gain of 280 and 120 are obtained, respectively. The optimum design of the n-GaAs emitter can eliminate the potential spike and get the low offset voltage of 100 mV. From the theoretical analysis, we know that the transistor operation of HEHBT is a function of emitter-base voltage. In addition, an interesting S-shaped multiple negative differential resistance (NMDR) phenomena are observed under the inverted operation mode. This is may be attributed to an avalanche multiplication and sequential two-stage barrier lowering effect resulting from electron accumulation at AlGaAs/GaAS heterointerface and InGaAs quantum well, respectively. Due to the excellent transistor characteristic and MNDR phenomenon, the HEHBT's are suitable for amplification and multiple-valued logic applications.
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