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研究生:黃駿杰
研究生(外文):Huang, Chun-Chieh
論文名稱:以卷積神經網路為基礎之 TFT-LCD瑕疵分類模型
論文名稱(外文):A TFT-LCD Defect Classification Model Based on Convolutional Neural Network
指導教授:張永佳張永佳引用關係
指導教授(外文):Chang, Yung-Chia
口試委員:唐麗英張永佳張桂琥孟憲明
口試委員(外文):Tang, Li-YingChang, Yung-ChiaChang, Kuei-HuMeng, Hsien-Ming
口試日期:2018-06-21
學位類別:碩士
校院名稱:國立交通大學
系所名稱:工業工程與管理系所
學門:工程學門
學類:工業工程學類
論文種類:學術論文
論文出版年:2018
畢業學年度:106
語文別:中文
論文頁數:41
中文關鍵詞:自動光學檢測深度學習卷積神經網路壞點資料擴增
外文關鍵詞:Automatic Optical Inspection (AOI)deep learningConvolutional Neural Network (CNN)dead dotsdata argumentation
相關次數:
  • 被引用被引用:3
  • 點閱點閱:536
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  • 下載下載:15
  • 收藏至我的研究室書目清單書目收藏:0
由於科技的日新月異,人們對於技術與品質的要求也日益提高,與人們生活息息相關的顯示螢幕亦是如此,隨著對於顯示螢幕品質的要求提高,被當成面板檢驗標準的壞點數目更是一個值得重視的問題。傳統的人眼檢測未來勢必將逐漸被淘汰,由於人眼檢測不僅可能會造成職業傷害,檢出的良率也是一個值得商榷的問題。因此,以機器視覺取代人眼檢測的自動光學檢測推行將是勢在必行。本研究將以自動光學檢測為基準,建構一個以卷積神經網路為基礎的TFT-LCD壞點分類模型,並透過台灣某知名筆電品牌商之實際面板影像資料實證之。近年對於TFT-LCD壞點的相關分類研究,大多數是以機器學習方法透過人為的影像處理以及特徵值計算,最後利用單層的演算法分類之。本研究最大的突破在於省去人為對於影像的特徵值計算以及影像的前處理過程,而整體判別的準確度也能達到99.4%的高準確度,能夠成功有效的分類TFT-LCD的壞點。
Since the ever-changing technology nowadays, people are increasing their request for skill and qualities as well as the display screens. As the level of the quality of display screens rise, the numbers of dead dots that used to be the inspection standard become a problem that can’t be ignored. Traditional inspection methods that inspected by humans may cause occupational injuries and fatigue and also harm the yield rate. Therefore, the trend of using Automatic Optical Inspection (AOI) instead of the traditional way is inevitable. This research is based on AOI, constructing a TFT-LCD defect classification model based on Convolutional Neural Network, evidenced with practical data provided by one well-known laptop brand in Taiwan. The related researches for dead dots recently are most thorough machine learning which processes images and calculates feature values first and finally classifies it with the algorithm. The breakthrough of this research is that there is no need to process images and calculate feature values. Besides, the distinguish rate is up to 99.4% so that we can say it’s effective to classify dead dots for TFT-LCD.
第一章 緒論 1
1.1 研究背景與動機 1
1.2 研究目的 3
1.3 論文架構 3
第二章 文獻探討 5
2.1 TFT-LCD面板瑕疵檢測 5
2.2 深度學習 7
2.2.1 深度學習 7
2.2.2 資料擴增(Data Augmentation) 9
2.2.3 深度學習模型 11
第三章 研究方法 17
3.1 問題描述 17
3.2 模型建置 17
3.3 影像瑕疵判別流程 21
3.4 評估指標 22
第四章 實例驗證 24
4.1 開發環境 24
4.2 研究資料 24
4.3 模型實例展示 27
4.4 判別成果 29
4.4.1 紅色檢測型態之壞點檢測分類結果 29
4.4.2 綠色檢測型態之壞點檢測分類結果 31
4.4.3 藍色檢測型態之壞點檢測分類結果 32
4.4.4 整體判別準確度 35
第五章 結論與未來建議 36
5.1 結論與貢獻 36
5.2 未來研究方向 36
參考文獻 38
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