臺灣博碩士論文加值系統

本研究在建立一套簡易式短波紅外光電檢測系統，使用於780nm~1600nm光譜區域。本系統主要由發射電路、接收電路與信號處理電路三單元組成。發射端係以脈衝驅動電路驅動短波紅外線雷射產生短波紅外線脈衝光，接收端係由AlGaAs光電檢知器、訊號放大電路，及帶通濾波電路組成，用以偵測短波紅外線。本裝置檢測波長範圍為900nm~1700nm，短波紅外光源工作電壓為2.6V~3.5V，讀取電路解析度為0.01V。系統開發完成之後進行980nm和1550nm波段光學鏡片穿透率量測，以確認系統穩定度。經實驗結果，藍寶石鏡片其平均穿透率73.5％，B270鏡片其平均穿透率76.5％。
本文首創建立片狀水果即時線上短波紅外線檢測技術，由量測片狀水果穿透率可以進行水果生產品質管控。利用量測穿透率大小，以得知水果品質的好壞。未來水果反射率開發完成將可進一步分辦水果外觀品質好壞。此系統的優點為帶通區域檢測、光學系統簡單、脈衝式雷射二極體光源不易受環境干擾。

In this study, a simple electric optical measurement system applicable for the wavelength range of 780nm to 1600nm has been established. This system is mainly composed of three units which include a transmitter, a receiver and signal processing circuit. The transmitter uses pulse driven circuit to drive short wave infrared laser and produce short wave infrared pulsed light. The receiver consisting of AlGaAs photo detector, signal amplification circuit, and band-pass filter circuit detects short wave infrared light. The detection wavelength range of this device is from 900nm to 1700nm, the operating voltage of short wave infrared source is from 2.6V to 3.5V, and the reading resolution of device is 0.01V. After the system has been developed, we measure the optical transmittance of 980nm and 1550nm wavelength in order to confirm system stability. Through the results of the experiment, the average transmittance of sapphire and B270 optical plate is 73.5% and is 76.5%, respectively.
This system pioneered on sliced fruit shortwave infrared measurement technology can simply control the quality of fruit by measuring the transmittance of sliced fruit that identifies whether the quality of fruit is good or bad. As long as developed in the future, the fruit reflection measurement will have great advancement in analyzing the quality of fruit merely from its appearance. The additional advantages of this system contain the band pass filter circuit, the unsophisticated optical systems, and the pulsed modulation laser light source which is not easily interfered in the external environment.

目 錄
誌 謝 i
摘 要 ii
Abstract iii
圖目錄 viii
表目錄 xi
第一章 緒 論 1
1.1研究背景與動機 1
1.2研究目的及方法 2
1.3文獻回顧 3
1.3.1近紅外線概說 3
1.3.2短波紅外成像儀 3
1.3.3近紅外感測器的應用與儀器設計 5
1.4論文架構 8
第二章 原 理 9
2.1光檢測波段 9
2.2短波紅外量測原理 11
2.3雷射二極體工作原理與用途 16
2.4自動必v控制電路(Auto Power Control) 22
2.5光電檢知二極體工作原理與等效模型 23
2.5.1 光電檢知二極體的工作模式 23
2.5.2 光電檢知二極體的等效電路模型與結構 25
2.6放大電路 27
2.7濾波電路 28
2.7.1帶通濾波器 28
2.8穿透率原理 31
第三章 系統架構 33
3.1雷射二極體發射電路 34
3.2 PIN光電檢知二極體接收電路 38
3.3 信號處理單元 42
3.3.1 硬體架構 42
3.3.2 電路圖 43
第四章 實驗結果與討論 47
4.1發射接收電路印證與量測前基準設定 47
4.2 980nm及1550nm雷射二極體量測前校正 49
4.3光學元件穿透率量測 53
4.3.1 藍寶石(Sapphire)穿透率量測 54
4.3.2 B270光學鏡片穿透率量測 57
4.3.3 蘋果切片穿透率量測 59
第五章 結論與未來展望 63
參考文獻 64

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