參 考 文 獻
[CHE]S. W. Chen, S. H. Wu, and S. W. Lee, “Interfacial Reactions in the Sn-(Cu)/Ni, Sn-(Ni)/Cu, and Sn/(Cu,Ni) Systems”, Journal of Electronic Materials, Vol. 32, No. 11, 2003
[CHO1]W. K. Choi, S. K. Kang, Y. C. Sohn and D. Y. Shih “Study of IMC Morphologies and Phase Characteristics Affected by the Reactions of Ni and Cu Metallurgies with Pb-Free Solder Joints”,Electronic Components and Technology Conference, p.1190, 2003
[CHO2]W. K. Choi and H. M. Lee, “Effect of Ni Layer Thickness and Soldering Time on Intermetallic Compound Formation at the Interface between Molten Sn-3.5Ag and Ni/Cu Substrate”, Journal of Electronic Materials”, Vol. 28, No. 11, 1999
[HO1]C. E. Ho, R. Y. Tsai, Y. L. Lin and C. R. Kao, “Effect of Cu Concentration on the Reactions between Sn-Ag-Cu Solders and Ni”, Journal of Electronic Materials, Vol. 31, No. 6, 2002
[HO2]C. E. Ho, R. Y. Tsai, Y. L. Lin and C. R. Kao,“Strong Effect of Cu Concentration on the Reaction between Lead-Free Microelectronic Solders and Ni”, Chemistry of Materials, Vol. 14, No. 3, 2002
[JEO]Y. D. Jeon, K. W. Paik, A. Ostmann, and Herbert Reichel,“Effect of Cu Contents in Pb-Free Solder Alloys on Interfacial Reactions and Bump Reliability of Pb-Free Solder Bumps on Electroless Ni-P Under-Bump Metallurgy”, Journal of Electronic Materials, Vol. 34, No. 1, 2005
[KAN]S. K. Kang, “Interfacial Reaction Studies on Lead(Pb)-Free Solder Alloys”, IEEE Transactions on Electronics Packing Manufacturing, Vol. 25, No. 3, 2002
[KIM]S. H. Kim, J. Y. Kim, J. Yu and T. Y. Lee, “Residual Stress and Interfacial Reaction of the Electroplated Ni-Cu Alloy Under Bump Metallurgy in the Flip-Chip Solder Joint”, Journal of Electronic Materials, Vol.33, No.9, 2004
[KOR1]T. M. Korhonen, P. Su, S. J. Hong, M. A. Korhonen, and C. Y. Li, “Development of Under Bump Metallizations for Flip Chip Bonding to Organic Substrate”, Journal of Electronic Materials”, Vol. 28, No. 11, 1999
[KOR2]T. M. Korhonen, P. Su, S. J. Hong, M. A. Korhonen, and C. Y. Li,“Reactions of Lead-Free Solders with CuNi Metallizations”, Journal of Electronic Materials, Vol. 29, No.10, 2000
[KAN]S. K. Kang, D. Y. Shih, and K. Fogel, “Interfacial Reaction Studies on Lead-Free Solder Alloys”,Transactions on Electronics Packaging Manufacturing, Vol. 25, No.3, 2003
[KOR3]T. M. Korhonen, P. Su, S. J. Hong, M. A. Korhonen, and C. Y. Li,“Under Bump Metallizations for Lead Free Solders”, Electronic Components and Technology Conference, p1106-1110, 2000
[LIN]C. H. Lin, S. W. Chen, and C. H. Wang, “Phase Equilibria and Solidification Properties of Sn-Cu-Ni alloya”, Journal of Electronic Materials, Vol. 31, No.9, 2002
[NIC]M. A . Nicolet and M. Bartur, J. Vac. Sci. Thchnol, p786- 793,1981
[RAH]A. Rahn, “The Basics of Soldering”, John Wiely&Son, New York, 1993
[SHA]A. Sharif, Y. C. Chan, “Dissolution kinetics of BGA Sn-Pb and Sn-Ag
solders with Cu substrates during reflow”, Materials Science and Engineering B106, p126-131, 2004
[SU]P. Su, T. Korhonen, M. Korhonen, and C. Y. Li, “Intermetallic Phase Formation and Growth Kinetics at the Interface between Molten Solder and Ni-Containing Under Bump Metallization”, Electronic Components and Technology Conference, p1712- 1718, 2000
[WAS]R. J. Wassink, “Soldering in Electronics”, Electrochemical Pub. Ltd, p99, 1984
[YIN]R. Y. Ying,“Electrodeposition of Copper-Nickel Alloys from Citrate Solutions on a Rotating Disk Electrode”, Journal of the Electrochemical Society, Vol. 135, No.12, 1988
[田福助] 田福助,電化學理論與應用,高立圖書有限公司,1987。
[方景禮] 方景禮,電鍍添加劑總論,表面技術雜誌第161期,1996。[呂宗興] 呂宗興,電子構裝技術的發展歷程,工業材料115期,p49,1996。[高振宏] 高振宏,TPCA教育訓練課程,Solder Bump Technologies,2002
[莊東漢] 莊東漢,電子月刊第八卷第三期,p226-236。
[蕭本俐] 蕭本俐碩士論文,國立中央大學化工所,2000。
[劉家明] 劉家明碩士論文,國立中央大學化工所,2000。
[陳文泰] 陳文泰碩士論文,國立中央大學化工所,2002。
[蕭麗娟] 蕭麗娟碩士論文,國立中央大學化工所,2002。
[李明勳] 李明勳碩士論文,國立中央大學化工所,2002。
[李守維] 李守維碩士論文,國立清華大學化工所,1998。
[林志豪] 林志豪碩士論文,國立清華大學化工所,2001。