臺灣博碩士論文加值系統

掃描鏈診斷被視為提高晶片良率的重要議題之一。在這篇論文中，我們提出了將掃描鏈分群以提高掃描鏈診斷品質之演算法，其中包含利用邏輯閘關係建立控制關係圖，然後利用關係圖進行分群演算法。實驗結果顯示我們能將掃描鏈診斷之可疑掃描細胞範圍縮小至二到三，能降低投入物理檢查之成本，提高掃描鏈診斷之品質。

Scan chain diagnosis has become a critical issue to yield loss in modern technology. In this thesis, we present a scan chain partition algorithm to improve scan chain fault diagnosis resolution. In our scan chain partition algorithm,
we rst construct a controllability graph by netlist ependency, then perform the partition algorithm to decide which scan chain a scan cell belongs to. The experimental results show that our method can reduce the number of suspect scan cells from 378-4 to at most 2-3 for most cases of ITC'99 benchmarks.

Contents
1 Introduction 2
2 Motivation 5
2.1 Full-masked Diagnosis Technique . . . . . . . . . . . . . . . . 5
2.2 Motivational Example . . . . . . . . . . . . . . . . . . . . . . 8
3 Partition Algorithm 10
3.1 Scan Chain Partitioning . . . . . . . . . . . . . . . . . . . . . 11
3.1.1 Construction of Controllability Graph . . . . . . . . . . 11
3.1.2 Partition of Controllability Graph . . . . . . . . . . . . 17
4 Experimental Results 20
4.1 Experimental Environment and Design Flow . . . . . . . . . . 20
4.2 Comparison Result . . . . . . . . . . . . . . . . . . . . . . . . 22
5 Conclusions 25

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