|
1.Cheng, C. S., “A neural network approach for the analysis of control chart patterns,” International Journal of Production Research, 35, 3, 667-697 (1997). 2.Chih, W. H., and Rollier D. A., “Diagnostic characteristics for bivariate pattern recognition scheme in SPC,” International Journal of Quality & Reliability Management, 11, 53-66 (1992). 3.Chih, W. H., and Rollier D. A., “A methodology of pattern recognition schemes for two variables in SPC,” International Journal of Quality & Reliability Management, 12, 86-107 (1995). 4.Chinnam, R. B., “Support vector machines for recognizing shifts in correlated and other manufacturing processes,” International Journal of Production Research, 40, 4449-4466 (2002). 5.Fausett, L., Fundamentals of Neural Networks, Prentice-Hill, Inc., New Jersey (1994). 6.Fletcher, R., Practical methods of optimization, Wiley, New York (2000). 7.Guh, R. S., and Tannock, J. D. T., “A neural network approach to characterize pattern parameters in process control charts,” Journal of Intelligent Manufacturing, 10, 449-462 (1999a). 8.Guh, R. S., and Tannock, J. D. T., “Recognition of control chart concurrent patterns using a neural network approach,” International Journal of Production Research, 37, 1743-1765 (1999b). 9.Guh, R. S., and Hsieh, Y. C., “A neural network based model for abnormal pattern recognition of control charts,” Computers & Industrial Engineering, 36, 97-108 (1999). 10.Hassan, A., Baksh, M., Shaharoun, A. M., and Jamaluddin, H., “Improved SPC chart pattern recognition using statistical features,” International Journal of Production Research, 41, 1587-1603 (2003). 11.Hotelling, H., “Multivariate quality control-illustrated by the air testing of sample bombsights,” in Techniques of Statistical Analysis, eds. C. Eisenhart, M. W, Hastay and W. A. Wallis, New York : McGraw –Hill, 111-184, (1947). 12.Hsu, C. W., and Lin, C. J., “A comparison of methods for multiclass support vector machines,” IEEE Transactions on Neural Networks, 13, 415-425 (2002). 13.Hush, D. R., and Horne, B. G., “Progress in supervised neural networks,” IEEE Signal Processing Magazine, January, 8-39 (1993). 14.Hush, D. R., Salas, J. M., and Horne, B. G., “Error surfaces for multi-layer perceptrons,” IEEE Transactions on System, Man and Cybernetics, 22, 1152-1161 (1992). 15.Jang, K. Y., Yang, K., and Kang, C., “Application of artificial neural network to identify non-random variation pattern on the run chart in automotive assembly process,” International Journal of Production Research, 41, 6, 1239-1254 (2003). 16.Johnson, R. A., and Wichern, D. W., Applied Multivariate Statistical Analysis, Prentice Hall, NJ (2002). 17.Kumar, S., Neural Network: A Classroom Approach, McGraw Hill, New York (2005). 18. Mason, R. L., Chou, Y. M., Sullivan, J. H., Stoumbos, Z. G., and Young, J. C., “Systematic patterns in charts,” Journal of Quality Technology, 35, 1, 47-58 (2003). 19.Minitab. Minitab 14.0 User’s Guide. Minitab Inc (2004). 20.Montgomery, D. C., Introduction to Statistical Quality Control, Wiley, New York (2005). 21.Nelson, L. S., “The Shewhart control chart-tests for special cause,” Journal of Quality Technology, 16, 4, 237-239 (1984). 22.NeuralWare Professional II/Plus. Neural Computing: A Technology Handbook for Professional II/Plus and NeuralWorks Explorer. Pittsburgh: NeuralWare, Inc (1997). 23.Pacella, M., Semeraro, Q., and Anglani, A., “Adaptive resonance theory-based neural algorithms for manufacturing process quality control,” International Journal of Production Research, 42, 4581-4607 (2004). 24.Perry, M. B., Spoerre, J. K., and Velasco, T., “Control chart pattern recognition using back propagation artificial neural networks,” International Journal of Production Research, 39, 15, 3399-3418 (2001). 25.Pham, D. T., and Chan, A. B., “Control chart pattern recognition using a new type of self-organization neural network,” Proceedings of the IMechE, Part I, Journal of Systems and Control Engineering, 212, 115-127 (1998). 26.Pham, D. T., and Chan, A. B., “Unsupervised adaptive resonance theory neural networks for control chart pattern recognition,” Proceedings of the Institution of Mechanical Engineers, Part B, 215, 59-67 (2001). 27.Pham, D. T., and Wani, M. A., “Feature-based control chart pattern recognition,” International Journal of Production Research, 35, 1875-1890 (1997). 28.Ribeiro, B., “Support vector machines for quality monitoring in a plastic injection molding process,” IEEE Transactions on Systems, Man, and Cybernetics- Part C: Applications and Reviews, 35, 401-410 (2005). 29.Rodriguez, J. J., Alonso, C. J., and Maestro, J. A., “Support vector machines of interval-based features for time series classification,” Knowledge-Based Systems, 18, 171-178 (2005). 30.Runger, G. C., Alt, F. B., and Montgomery, D. C., “Contributors to a multivariate statistical process control signal,” Communications in Statistics- Theory and Methods, 25, 2203-2213 (1996). 31.Statistica. Statistica Data Miner. OK: Stat Soft, Inc (2005). 32.Tan, P. N., Steinbach, M., and Kumar, V., Introduction to Data Mining, Addison-Wesley, Boston (2006). 33.Vapnik, V. N., Statistical Learning Theory, Wiley, New York (1998). 34.Vapnik, V. N., The Nature of Statistical Learning Theory, Springer, New York (2000). 35.Western Electric Company, Statistical Quality Control Handbook, Indiana: Western Electric Co. Inc, Indianapolis (1958). 36.Zorriassatine, F., and Tannock, J. D. T., “A review of neural networks for statistical process control,” Journal of Intelligent Manufacturing, 9, 209-224 (1998).
|