Reference
[1] L. G. Ullate, M. T. Sanchez, E. Villanueva, M. Parrilla and J. J. Anaya, ”A three-transducer ultrasonic system for object location in air,”sensors and Actuators, A.37-38,pp. 391-396,1993.
[2] J. A. Gallego-Juarez, G. Rodriguez, J. L. San Emeterio, P. T. Sanz and J.C.Lazaro, “An Acoustic Transducer System for Long-Distance Ranging Applications in Air,” Sensors and Actuators, A.37-38,pp. 397-402, 1993.
[3] S. Egusa, N. Iwaswa, “Piezoelectric Paints : Preparation and Application as Built-in Vibration Sensor Structural Materials,” Journal of Materials Science, Vo1. 28, pp. 1667-1672,1993.
[4] C. Dias and D. K. Das-Gupta, “Polymer/Ceramic Composites for Piezoelectric Sensors,” Sensors and Actuators, A. 37-38, pp. 343-347,
[5] F. Stuar Foster, Linda K.Ryan and Daniel H. Turnbull,”Characterization of Lead Zirconate Titanate Ceramics for Use in Miniature High-Frequency(20-80MHZ) Transducers, “IEEE Trans. Ultrason. Ferroelec. Freq. Contr. Vo1.38, No. 5, pp. 446-453,1991.
[6] P. Curie and J. Curie :Bull.Soc.Min.de France,3,p.90,1880.
[7] W. G. Hankel : Abh. Sachs. , 12, p.457.1881.
[8] W. G. Hankel: Ber. Sachs. , 33 ,.p.52.1881.
[9] B Tang, J. Mommaerts, R. K. Duncan, J. C. Duke, Jr. and D. A. Dillard, “Nondestructive Evaluation of Model Adhesive Joints by PVDF Piezoelectric Film Sensors,” Experimental Mechanics, 102-109, 1993.
[10] 盧平強著，鈦酸鉛鋯薄膜感音器之研製，碩士論文，1995[11] Dhananjay Kumar, K.M. Satyalakshmi, M.S. Hegde, Prakash R. Apte, and Richard Pinto, “LaNiO3: A Promising Material for Contact with Yba2Cu3O7-x Thin Films,” IEEE Trans. Appl. Supercond, vol. 5, no. 4, pp.3498-3503, 1995
[12] Adam Witold Stadler, Grzeforz Wilczynski, “Conduction in RuO2-base thick films,” Int. J. Elec., vol. 78, no. 1, pp.113-119, 1995
[13] Ashok V. Rao, Said A. Mansour, Arden L. Bement, Jr., “Fabrication of ferroelectric PZT thin film capacitors with indium tin oxide (ITO) electrodes,” Mater. Lett., no.29, pp. 255-258, 1996
[14] Carlos A. Paz De Argujo, L. D. Mcmillan, and J. F. Scott, “Processing of Ferroelectric Memories,” Mat. Res. Soc. Symp. Proc. Vol. 230, 1992 Materials Research Society.
[15] K. Sreenivas, Ian Reaney, T. Maeder, N. Setter, C. Jagadish and R. G Elliman, “ Investigation of Pt/Ti bilayer metallization on silicon for ferrelectric thin film integration, “ J. Apply. Phys. pp. 232~239, 1994
[16] Charles Kittel, Introduction to Solid State Physics, Sixth Edition, John Wiley & Sons, Inc., 1991
[17] A. Amin, M. J. H aum, B. Badger, H. Mckinstry band L. E. Cross, “A Phenomenological Gibbs Function for the Single Cell Region of the PbZrO3 : PbTiO3 Solid Solution System,” Ferroelectrics, Vol. 65, pp.1985
[18] D. P. Vijay, C. K. Kwok, W. Pan, I. K. Yoo, and S B. Desu, “Electrode Effects on Electrical Properties of Ferroelectric Thin Films,” Proc. IEEE, pp. 408-411.
[19] Miroslav Boundys, “Relations between Temperature Coefficients of Permittivity and Elastic Compliances in PZT Ceramics near the Morphotropic Phase Boundary,” IEEE Trans. Ultrason. Ferroelec. Freq. Contr. Vol. 38, NO. 6, pp. 569~571, 1991
[20] L. S. Phillips, Electron. Comp. 12, 523 (1971)
[21] Masaru Oikawa and Kohji Toda, “Preparation of Pb(Zr,Ti)O3 Thin Films by an Electron Beam Evaporation Technique,“ Appl. Phys. Lett.Vol. 29, No. 8, pp. 491~492, 1976
[22] Akira Okada, “Some Electrical and Optical Properties of Ferroelectric Lead-Zirconate-Lead-Titanate Thin Films,” J. of Appl. Phys. Vol. 48, No 7, pp. 2905~2909, 1977
[23] Akira Okada, “Electrical Properties of Lead-Zirconate-Lead-Titanate Ferroelectric Thin Films and their Composition Analysis by Auger Electron Spectroscopy,” J. of Appl. Phys. Vol. 49, No 8, pp. 4495~4499, 1978
[24] N. Castellano and L. G. Feinstein, “Ion-Beam Deposition of Thin Films of Ferroelectric Lead Zirconate Titanate (PZT),” J. Appl. Phys. Vol. 50, No. 6, pp. 4406~4411, 1979
[25] Wang, A. Pignolet, and F. Levy, “Properties of Pb(ZrxTi1-x)O3 Thin Films Prepared by RF Magnetron Sputtering and Heat Treatment,” Mat. Res. Bull. Vol. 25, pp. 1495~1501, 1990
[26] B. Krupanidhi, N. Maffei, M. Sayer, and K. El-Assl, “RF Planar Magnetron Sputtering and Characterization of Ferroelectric Pb(Zr,Ti)O3 Films,” J. Appl. Phys. Vol. 54, No. 11, pp. 6601~6609, 1983
[27] Braun, B. S. Kwak, and A. Erbil, “Exitaxial Lead Zirconate-Titanate Thin Films on Sapphire,” Appl. Phys. Lett. Vol. 63, No. 4, pp. 467~469, 1993
[28] Toyama, R. Kubo, E. Takata, K. Tanaka, and K. Owhada, “Characterization of Piezoelectric Properties of PZT Thin Films Deposited on Si by ECR Sputtering,” Sensors and Actuators A 45, pp. 125~129, 1994
[29] Auciello, “Synthesis and Characterization of Pb(ZrxTi1-x)O3 Thin Films Produced by an Automated Laser Ablation Deposition Technique,” J. Appl. Phys. Vol. 73, No. 10, pp. 5197~5207, 1993
[30] Frantti, and V. Lantto, “Characterization of Pb0.097Nd0.02(Zr0.55Ti0.15)O3 Thin Films Prepared by Pulsed Laser Ablation,” J. Appl. Phys. Vol. 76, No. 4, pp. 2139~2143, 1994
[31] Kazushi Amanuma, Takashi Hase, and Yoichi Miyasaka, “Crystallization Behavior of Sol-Gel Derived Pb(ZrTi)O3 Thin Films and the Polarization Switching Effect on Film Microstructure,” Applied Physics Letter, Vol. No. 24, December 1994
[32] 盧平強著，鈦酸鉛鋯薄膜感音器之研製，碩士論文，1995
[33] 陳國雄著，鈦酸鉛鋯薄膜感超音波源賤特性分析，碩士論文，1996[34] 郭忠山著，鈦酸鉛鋯薄膜沉積於鎳酸欄基版及其應用於超音波半導體感測元件之特性分析，碩士論文，1996[35] Kushibiki, J.; Ohashi, Y.; Ujiie, T. “Standardized evaluation of chemical compositions of LiTaO/sub 3/ single crystals for SAW devices using the LFB ultrasonic material characterization system,” Ultrasonics, Ferroelectrics and Frequency Control, IEEE Page(s): 454 –465, 2002
[36] Joseph T. Evans, Richard Womack, ”An Experimental 512-bit Nonvolatile memory with ferroelectric storage cell,” IEEE Journal of Solid-State Circuits, Vol.23, No.5, pp. 1171~1175, 1988
[37] Q. M. Zhang, H. Wang, N. Kim, and L. E. Cross, “Direct Evaluation of Domain-Wall and Intrinsic Contributions to the Dielectric and Piezoelectric Response and Their Temperature Dependence on Lead Zirconate Titanate Cermics,” Journal of Applied Physics,Vol. 74, No, 1, 1994
[38] Yukio Sakashita and Hideo Segawa, “Dependence of Electrical Properties on Film Thickness in Pb (ZrxTi1-x)O3 Thin films produced by Metaloganic Chemical Vapor Deposition,” Journal of Applied Physics, Vol. 73, No.11,1993
[39] K. R. Udayakumar, P. J. Schuele, J. Chen, S. B. Krupanidhi, L. E. Cross, ”Thickness-dependent electrical characteristics of lead Zirconate Titanate thin films.” J. Appl. Phys, Vol. 77, No. 8, pp. 3981 ~ 3986, 1995
[40] N. Kim, “Grain size effect on the dielectric and piezoelectric properties in compositions which are near the mopphotropic phase boundary of lead Zirconate Titanate based ceramics,” Ph. D. dissertation, Penn Stste univ, 1994
[41] Yukio Sakashita, Hideo Segawa,”Dependence of electrical properties on film thickness in Pb(ZrxTi1-x)O3 thin films produced by metalo rganic chemical vapor deposition,” J, Appl. Phys. Vol. 73, No. 11, pp. 7857~7863, 1993
[42] M. J. Zipparo, K. K. Shung, T. R. Shrout, “Piezoelectric properties of fine grein PZT materials,” Proceeding of the IEEE ultrasonics symposium, Seattle, WA, UASA, Vol. 1, pp. 601~604, 1995
[43] Long Wu and Chung-Heuy Wang, “Dielectric and Piezoelectric Properties of PZT Ceramics Doped with 4PbO.B2O3,” Proceeding of the IEEE ultrasonics symposium, East Greenville, SC, USA, pp. 293~296,1992
[44] Robert Y. Ting, “A Review on The Development of Piezoelectric Composites for Underwater Transducer Applications,” Proceeding of the IEEE, PP. 410~413,1991
[45] Bowen, L. J.; Gentilman, R. L. ; Pham, H. T.; Fiore, D. F,; French, K. W. “Injection molded fine-scale piezoelectric composite transducers.” IEEE Ultrasonics Symposium, Vol. 1, Page(s): 799~503, 1993
[46] A. Tombak; J.-P. Maria; F. Ayguavives; Jin Zhang; G.T. Stauf; A.I. Kingon; A. Mortazawi “Tunable barium strontium titanate thin film capacitors for RF and microwave applications,” Microwave and Wireless Components Letters, IEEE , Volume: 12 Issue: 1 , Page(s): 3 –5, 2002
[47] 李新樂著，積體化COMS放大器及鋯鈦酸鉛薄膜超音波元件之研製與研究，碩士論文，2001