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研究生:林經祥
研究生(外文):Jin-Hsiang Lin
論文名稱:釩、鉻金屬薄膜與矽晶界面反應研究
論文名稱(外文):Interfacial Reactions of Vanadium and Chromium Metal Thin Films on Silicon
指導教授:陳力俊陳力俊引用關係
指導教授(外文):Lih-Juann Chen
學位類別:博士
校院名稱:國立清華大學
系所名稱:材料科學(工程)研究所
學門:工程學門
學類:材料工程學類
論文種類:學術論文
論文出版年:1995
畢業學年度:83
語文別:英文
中文關鍵詞:非晶質夾層短程有序結構
外文關鍵詞:Amorphous interlayersVanadiumChromiumShort-range-ordered
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在本研究中利用穿透式電子顯微鏡配合晶格影像模擬理論及表面分析儀器
來探討釩﹑鉻金屬薄膜層與矽晶界面反應的情形,並配合電流-電壓曲線
的量測探討釩﹑鉻金屬薄膜層與矽晶反應時,其蕭特基能障的變化。本研
究可分為以下幾部份 : A. 關於非晶質夾層部份 : 矽晶界面反應之非晶
質夾層成長動力學,非晶質夾層平均組成及非晶質夾層中短程有序結構之
分析。 B. 關於矽化物形成部份: 最初相以及多相共同生成現象之探討以
及至最終穩定相生成前多相消長現象探討,鉻與矽晶生成之二矽化鉻之成
長動力學研究。 C. 釩﹑鉻金屬薄膜與矽晶反應時之蕭特基能障之變化。
Cover
Contents
Part 1.
Chapter I The Technological and Scientific Aspects of Transition Metal Silicides
1-1. An Overview
1-2. Silicide Applications
Chapter 2 Formation of Amorphous Interlayer by Solid-State Diffusion of Polycrystalline Metal Thin-Films on Single-Crystal Si
2-1. An Over view
2-2. Thermodynamic Properties of the Melt and the Glass Formation Ability
2-3. Methods of Amorphization
2-4. Amorphization by Solid-State Reaction in Metal/Metal Diffusion Couples
2-5. Amorphization by Solid-State Interdiffusion in Metal/Si Diffusion Couples
2-6. Kinetic Aspects of Solid-State Amorphization
2-7. Thermodynamic Aspects of Solid-State Amorphization -- Miedema''s Model
2-8. Microstructural analyses for Amorphous Solids
Chapter 3 Interfacial Reactions of Metals Thin Films on Silicon
3-1. An Over view
3-2. Theories of Silicide Formation
3-3. Epitaxial Silicides
3-4. Structure of Silicide/Si Interfaces
Chapter 4 Electrical Properties of Interfacial Reactions of Metal thin Films on Si
4-1. An Over view
4-2. Schottky Barrier Height
4-3. Ohmic Contacts
4-4. Sheet Resistance
Part II. Experimental Procedures
Chapter 5 Experimental Procedures
5-1. Initial Wafer Cleaning
5-2. Thin Metal Film Deposition
5-3. Heat Treatments
5-4. Sample Preparation for Transmission Electron Microscope Observation
5-5. Transmission Electron Microscope Observation
5-6. Chemical Analysis
5-7. Electrical Property Measurement
5-8. Computer Simulation of High-Resolution Images
Part III Results and Discussion
Chapter 6 Growth Kinetics of Amorphous Interlayers by Solid-State Diffusion in Ultrahigh-Vacuum-Deposited Polycrystalline V Thin Films on (001)Si
6-1. Motivation
6-2. Experimental Procedures
6-3. Results and Discussion
6-4. Summary and Conclusions
Chapter 7 The Determination of Average Compositions of the Amorphous Interlayers in V/Si System Using Buried Ultrathin Oxide Layer and Capping Mo Layer to Define the Reference Planes for Interdiffusion
7-1. Motivation
7-2. Experimental Procedures
7-3. Results and Discussion
7-4. Summary and Conclusions
Chapter 8.Auto-Correlation Function Analysis of Phase Formation in the Interfacial Reactions of Ultrahigh Vacuum Deposited Polycrystalline V Thin Films on (001)Si
8-1. Motivation
8-2. Experimental Procedures
8-3. Results and Discussion
8-4. Summary and Conclusions
Chapter 9 Simultaneous Occurrence of Multiphases in the Interfacial Reactions of Ultrahigh Vacuum Deposited V and Cr Thin Films on Si
9-1. Motivation
9-2. Experimental Procedures
9-3. Results and Discussion
9-4. Summary and Conclusions
Chapter 10 Reaction Kinetics in the Interfacial Reactions of Cr Thin Films on (001)Si
10-1. Motivation
10-2. Experimental Procedures
10-3. Results and Discussion
10-4. Summary and Conclusions
Chapter II. Electrical Properties of interfacial Reactions of V and Cr Thin Films on Si
11-1. Motivation
11-2. Experimental Procedures
11-3. Results and Discussion
11-4. Summary and Conclusions
Part IV Summary and Conclusions
Part V Future Prospects
References
List of Tables
List of Diagrams
Others
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