臺灣博碩士論文加值系統

本論文主要研究重點為被動式無線射頻辨識系統電子標籤設計、製作和測試。採用德州儀器公司所生產的RI-UHF-STRAP-08標籤晶片，相較於其他標籤晶片，有著較小功率消耗。在電子標籤所採用的操作頻率下，使用TRL校正量測法，量測標籤晶片阻抗的特性。標籤天線和晶片的使用頻率之間必需為複數阻抗匹配，因此，採用Quasi Log-periodic antenna為主要標籤天線架構。輻射功率為EIRP=4W時，量測得到最大讀取距離為4.5公尺。

This thesis is devoted to the design, fabrication and testing of tags for passive UHF radio-frequency identification (RFID) system. RI-UHF-STRAP-08 form TI is identified at the chip IC strap for the tag due to its relative low DC power consumption. While the chip impedance of the tag IC was characterized through TRL calibrated measurement system, complex conjugate matching technique at desired frequency was adopted. In order to achieve good power match, across the entire frequency band of operation, quasi log-periodic antenna scheme was implemented
. The tested maximum readable was measured to be 4.5m at EIRP=4W output level.

中文摘要 I
ABSTRACT II
致謝…… III
目錄… IV
圖目錄 VII
表目錄 XI
第一章　被動式無線射頻辨識系統介紹 01
1.1　被動式電子標籤 02
1.1.1　標籤晶片 02
1.1.2　標籤天線 03
1.1.3　印刷電路基板 04
1.2　讀取器與主電腦應用系統 04
1.3　被動式無線射頻辨識工作原理 04
1.3.1　Forward Radio Link 05
1.3.1.1　自由空間路徑衰減 06
1.3.1.2　標籤天線所接受到能量 07
1.3.2　Backscatter Radio Link 09
1.3.2.1　雷達截面積 10
1.3.2.2　Scalar Differential RCS 11
1.3.2.3　電子標籤讀取距離 12
1.4　研究動機 14


第二章　TRL校正原理與設計 15
2.1　向量網路分析儀的誤差 15
2.2　雙埠SOLT 校正法模型簡介 16
2.3　TRL 校正法模型簡介 17
2.4　TRL 校正法模型簡介 19
2.4.1　穿透無損耗無相位延遲校正件 19
2.4.2　反射校正件 20
2.4.3　相位延遲校校正件 20
2.5　TRL校正件模擬、實作和效能驗証 21
2.5.1　Thru校正件 23
2.5.2　Line校正件 25
2.5.3　Open校正件 26
2.5.4　校正件效能驗証 28
第三章　標籤晶片阻抗量測 31
3.1　Ti RI-UHF-STRAP-08標籤晶片介紹 31
3.2　標籤晶片特性量測 31
3.3　標籤晶片等效電路推導 34
3.4　標籤晶片阻抗量測結果 40
3.5　標籤晶片等效電路 52
第四章　被動式無線射頻辨識電子標籤天線設計 54
4.1　標籤天線型式選取 54
4.2　寬頻標籤天線設計 55
4.3　TI Reference tag antenna與最佳化寬頻標籤天線 58
4.4　功率傳播係數探討 61
4.5　雷達截面積探討 62
4.6　Scalar Differential RCS探討 66
4.7　讀取距離量測 66
第五章　結論 71
參考文獻 74

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