|
參考文獻 【1】 侯春麟等著,靜電之放電與防制, http://www.t-esda.org/tech/TESDC-2002/01.html 【2】 經濟部工業局, 經濟部工業局89年度電子檢測人才培訓講 議,經濟部工業局,2000 【3】 Tim Williams, EMC for Product Designers,3rd edition Newnes , 2001 【4】 Clayton R. Paul, Introduction to Electromagnetic Compatibility, 1992 【5】 Douglas C. Smith , High Frequency Measurements and Noise in Electronic Circuits: A Practical guide of Successful Techniques for Designing Degugging, and Reducing noise, Van Nostrand Reinhold 1992 【6】 Basics of Electrostatic Discharge Part Five--- Device Sensitivity and Testing,By ESD Association,1998 【7】 Mark I. Montrose, Edward M. Nakauchi原著, Testing for EMC Compliance Approaches and Techniques, 姚啟 元 編譯, EMC電磁相容測試與對策技術,全華科技圖書, 2005 【8】 EN61000-4-2:1995 Electromagnetic Compatibility- Part 4-2 Testing and measurement techniques — Electrostatic discharge immunity test 【9】 IEC61000-4-2:1995 Electromagnetic Compatibility- Part 4 Testing and measurement techniques , Section 2 Electrostatic discharge immunity test 【10】 James E. Vinson et al. , ESD Design and Analysis Handbook, Kluwer Academic, 2003
|