Chap 2
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23.F. Hofer, W. Grogger and P. Warbichler, “Characterization of nanometer sized precipitation in solids by electron spectroscopic imaging”, Ultramicroscopy 59 (1995) p.15
24.W. Jager and J. Mayer, “Energy filtered transmission electron microscopy of SimGen superlattices and Si-Ge heterostructures”, Ultramicroscopy, 38 (1995) p.47
25.M. Schenner and P. Schattschneider, “Spatial resolution in selected-area EELS”, Ultramicroscopy. 55 (1996) p.31
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27.H. Shuman, C.F. Chang and A.P. Somlyo, “Elemental imaging and resolution in energy-filtered conventional electron microscopy”, Ultramicroscopy. 19 (1986) p.121
28.J. Mayer, U. Eigenthaler, J.M. Plitzko, and F. Dettenwanger, “Quantitative Analysis of Electron Spectroscopic Imaging Series”, Micron 5 (1997) p.361
29.L. Ponsonnet, B. Vacher and J.M. Martin, “High resolution chemical mapping in the energy-filtered TEM: application to interface layers ceramics”, Thin Solid Films 324 (1998) p.170
30.J. Marien, J.M. Plitzko, R. Spolenak, R.M. Keller and J. Mayer, “Quantitative electron spectroscopic imaging studies of microelectronic metallization layers”, J. Microsc. 194: (1998) p.71
31.P.J. Thomas and P.A. Midgley, “Image-Spectroscopy-I. The advantages of increased spectral information for compositional EFTEM analysis”, Ultramicroscopy, 88 (2001) p.179
32.P.J. Thomas and P.A. Midgley, “Image-Spectroscopy-II. The removal of plural scattering from extended energy-filtered series by Fourier deconvolution”, Ultramicroscopy, 88 (2001) p.187
33.J.M. Plitzko and J. Mayer, “Quantitative thin film analysis by energy filtering transmission microscopy”, Ultramicroscopy, 78 (1999) p.207
34.P.J. Thomas and P.A. Midgley, “Fourier Deconvolution of Image-Spectra: the Removal of Plural Scattering from Energy-Filtered Series”, Inst. Phys. Conf. Ser. 161: (1999) (EMAG 99) p.179
35.P.J. Thomas, P.A. Midgley, and P. Spellward, “Compositional Mapping in the EFTEM using Image-Spectroscopy”, Inst. Phys Conf. Ser. 161: (1999) (EMAG 99) p.239
36.W. Grogger, F. Hofer, P. Warbichler and G. Kothleitner, “Quantitative Energy-Filtering Transmission Electron Microscopy in Materials Science“, Microscopy and Microanalysis 6: (2000) p.161
37.C. Quintana, J.P. Lechaire, N. Bonnet, C. Risco and J.L. Carrascosa, “Elemental Maps From EFTEM Images Using Two Different Background Subtraction Models” Microscopy Research and Technique 53 (2001) p.147
38.P.J. Thomas and P.A. Midgley, “Extended image-series analysis in the energy-filtered TEM”, EUREM 12: (2000) I309-I310
39.M.H.F Overwijk and D. Reefman, “Maximum-entropy deconvolution applied to energy-loss spectroscopy”, Micron 31: (2000) p.325
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44.R.F. Egerton, in Electron-energy loss spectroscopy in the electron microscope (2nd Edition, Plenum Press, New York) (1996) pp.151-pp.154
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48.P.J. Ireland, “High aspect ratio contacts: A review of the current tungsten plug process”, Thin Solid Films, 304 (1997) p.1
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78. J. Mayer, U. Eigenthaler, J.M. Plitzko, and F. Dettenwanger, “Quantitative Analysis of Electron Spectroscopic Imaging Series”, Micron 5: (1997) p.361
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Chap4
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Chap5
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