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研究生:陳昭蓉
研究生(外文):Jau-Rung Chen
論文名稱:微型半導體電阻式氧氣感測器感測薄膜之研究
論文名稱(外文):Study on Sensing Thin Films of Semiconductor-Type Oxygen Gas Sensors
指導教授:羅錦興羅錦興引用關係李國賓李國賓引用關係洪昭南洪昭南引用關係
指導教授(外文):Jin-Shing LuoGuo-Bin LiJau-Nan Hung
學位類別:碩士
校院名稱:國立成功大學
系所名稱:電機工程學系碩博士班
學門:工程學門
學類:電資工程學類
論文種類:學術論文
論文出版年:2004
畢業學年度:93
語文別:中文
論文頁數:74
中文關鍵詞:靈敏度多孔隙旋轉塗佈法濺鍍法氧氣感測器二氧化錫薄膜
外文關鍵詞:tin dioxide thin filmOxygen gas sensorsputteringsensitivityspin coating
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  本研究分別以濺鍍法與凝膠旋轉塗佈法沉積二氧化錫薄膜。主要目的是探討不同鍍膜方式與製程參數對二氧化錫薄膜的微結構與對氧氣的感測性之影響,並比較找出彼此間的關係。

  濺鍍過程中,本研究使用摻雜2wt%鋰原子的二氧化錫做為感測薄膜的靶材,氬氣與氧氣流量比為3:1的條件下作濺鍍製程,之後在空氣下做600℃、2小時的退火處理。經靜態量測後發現,當工作溫度在300℃時,對氧氣具有最高靈敏度,其值為25.1。

  另外,以凝膠旋轉塗佈法方式沉積二氧化錫薄膜可得到具多孔隙薄膜的微結構。鍍膜後,在空氣下做650℃,1小時的退火處理,薄膜具有比濺鍍產生的薄膜高的表面積。經靜態量測後,當工作溫度在250℃時,可得到對氧氣具有最高靈敏度,其值為111。

  因此,以凝膠旋轉塗佈法方式沉積二氧化錫感測薄膜會比濺鍍法沉積二氧化錫感測薄膜得到對氧氣有較高的靈敏度值,而工作溫度也較低。
 In this study, two fabrication methods were used to deposit the tin dioxide thin film to investigate the influence of the fabrication parameters on the lattice orientation and oxygen gas sensitivity of the tin dioxide thin films.

 The tin dioxide layer with the 2 wt% doped Li, which served as the sensing materials, was deposited by sputtering with Ar/O2 (3:1) gas mixtures and annealed in an oxygen gas at 600℃ for 2 hours. By the static measurement, the experimental data showed that the maximum sensitivity was 25.1, and it achieved when the tin dioxide film was grown at 300℃.

 With the spin coating process, the porous films with high surface areas can be generated, and the sensitivity for O2 gas can reach 111. By the static measurement, experimental data also indicated that the pours film will generate the maximum sensitivity when the tin oxide films are grown at 250℃.

 Thus, the sensitivity of the tin dioxide thin film used the spin coating process deposition is higher than that of sputtering method. In addition, the temperature of the former is also at lower than that of the latter.
目錄
中文摘要 I
英文摘要 II
致謝 III
目錄 V
表目錄 IX
圖目錄 X
符號說明 XV


第一章 諸論
1.1前言.........................................1
1.2研究動機.....................................2
1.3文獻回顧.....................................3
1.3.1半導體式氧氣感測器之感測材料應用.........5
1.3.2 二氧化錫感測薄膜沉積方式................7
1.3.3 二氧化錫的薄膜製程與微結構之關係........9
1.4 本研究之製程選擇與研究方法..................9
1.4.1 濺鍍法..................................9
1.4.2 旋轉鍍膜法 .............................10

第二章 理論基礎
2.1 二氧化錫結構與特性簡介.....................11
2.2 二氧化錫導電之機制.........................12
2.3 二氧化錫感測氣體之機制.....................13
2.3.1 氣體吸附於二氧化錫的機制...............13
2.3.2 氧氣的吸附.............................14
2.3.3 還原氣體的吸附.........................16
2.3.4 水氣的吸附.............................17
2.4 影響感測性質之因素.........................18
2.4.1 降低晶粒尺寸...........................18
2.4.2 表面催化劑的作用.......................19
2.5 溶膠-凝膠法基本理論........................21
2.6 旋轉塗佈法之原理...........................22

第三章 量測晶片之設計與製作
3.1 量測晶片基材、絕緣層與電極之材料選擇.......24
3.1.1 基材的選擇.............................24
3.1.2 電阻與絕緣層的材料選擇.................27
3.1.3 感測層的材料選擇.......................28
3.2量測晶片之製作..............................29
3.2.1 微機電製程技術的簡介...................30
3.2.1.1 光罩設計與製作.....................33
3.2.1.2 晶片的清洗.........................35
3.2.2 濺鍍法製程薄膜之晶片的製作流程.........36
3.2.3 旋轉塗佈成膜之晶片的製作流程...........40

第四章 實驗方法
4.1 實驗流程圖.................................45
4.2 實驗步驟...................................46
4.2.1利用濺鍍方式製備二氧化錫薄膜............46
4.2.2利用濺鍍方式製備二氧化錫薄膜............48
4.3 性質測試..................................48
4.3.1 X光繞射分析............................48
4.3.2 掃描式電子顯微鏡分析...................50
4.4 感測層之氣體靈敏度量測.....................50

第五章 結果與討論
5.1 濺鍍法製備二氧化錫之薄膜...................53
5.1.1 XRD與SEM結構分析........53
5.1.2 表面分析...............................55
5.1.3二氧化錫(2wt%鋰)薄膜對氧氣的感測特性....56
5.2旋轉鍍膜法製備二氧化錫之薄膜................57
5.2.1 XRD與SEM結構分析.......................58
5.2.2二氧化錫薄膜對氧氣的感測特性............58
5.3量測晶片製程之問題..........................60

第六章 結論與未來展望
6.1 結論.......................................62
6.2 未來展望...................................63

參考文獻.......................................64

自述...........................................74
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