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[1] U. Knochel, “ 3D integration : Opportunities, design challenges and approaches,” IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits &; Systems, pp.4, 2012. [2] R. Iyer, ” Accelerator-rich architectures: Implications, opportunities and challenges,” Asia and South Pacific Design Automation Conference, pp.106-107, 2012. [3] S. Al-sarawi, D. Abbott and P. Franzon, “ A review of 3-D packaging technology,” IEEE Trans on Components, Packaging, and Manufacturing Technology, Vol.21, No 1, pp.2–14, 1998. [4] R. Wilson, “ Sips form good soc alternative, but designer beware,” EE Times, 2004. [5] L. Golick, J. Goodelle and T. Shilling, “ Sip modules call for right blend of tech,” EE Times, 2004. [6] J. Miettinen, “ System design issues for 3D system-in-package (SiP),” Electronic Components and Technology Conference, Vol.1, pp.610-615, 2004. [7] M. X. Sham, “ Challenges and Opportunities in System-in-Package (SiP) Business,” International Conference on Electronic Packaging Technology ,pp.1-5, 2006. [8] A. Fontanelli, “ System-in-Package Technology : Opportunities and Challenges,” International Symposium on Quality Electronic Design, pp.589-593, 2008. [9] B. S. Kumar, “ Process characterization of Cu &; Pd coated Cu wire bonding on overhang die : Challenges and solution,” Electronics Packaging Technology Conference , pp.859-867, 2010. [10] O. Yauw, “ Wire bonding optimization with fine copper wire for volume production,” Electronics Packaging Technology Conference, pp.467-472, 2010. [11] P. A. Collier, ” Processing and reliability of flip-chip on board connections,” Electronic Packaging Technology Conference, pp.251-258, 1997. [12] M. Sunohara, ” Silicon interposer with TSVs (Through Silicon Vias) and fine multilayer wiring, ” Electronic Components and Technology Conference, pp.847-852, 2008. [13] H. Roth, “ Inspection of through silicon vias (TSV) and other interconnections in IC packages by computed tomography,” Electronics Packaging Technology Conference, pp.438-441, 2009. [14] S. Sunter, ” Contactless test of IC pads, pins, and TSVs via standard boundary scan,” IEEE Design &; Test of Computers, pp.1, 2012 [15] G. A. Allan, ” A yield improvement technique for IC layout using local design rules,” IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, pp.1355-1362, 1992 [16] F. D. Mbairi, “ High-Frequency Transmission Lines Crosstalk Reduction Using Spacing Rules,” IEEE Transactions on Components and Packaging Technologies, pp.601-610, 2008 [17] A. Hashimoto and J. Stevens, “ Wire routing by optimizing channel assignment within large apertures,” the 8th Workshop on Design Automation, pp.155–169, 1971. [18] Y. C. Lin, W. K. Mak, C. Chu and T. C. Wang, “ Pad assignment for die-stacking system-in-package design,” International Conference on Computer-Aided Design, pp.249-255, 2009. [19] J. T. Yan, C. H. Kao , M. C. Huang and Z. W. Chen, ” Efficient assignment of inter-die signals in die-stacking SiP design,” International Symposium on Circuits and Systems, pp.3254-3257, 2012. [20] EIA(Electronic Industries Association) / JEDEC Standard No. 59:Bond wire modeling standard, June, 1997.http://www.jedec.org/download/search/ jesd59.pdf [21] lp_solve:an open source linear programming solver. [Online]. Available:http://sourceforge.net/projects/lpsolve
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