臺灣博碩士論文加值系統

此論文提出一種新型對數線性對數形輸出CMOS影像感測器。這種感測器再低亮度時擁有對數的輸出響應，在中間擁有線性的輸出響應，最後在高照度時又會回到對數型態的輸出響應。這種架構對低兩度時的靈敏度會特別的高，同時擁有0.53的輸出擺幅與120dB的動態範圍。此外相關兩次取樣電路一可應用在此電路中以減少固定影像雜訊。設計一操作在1.8伏特並具有72*54 解析度之相關感測電路與讀出電路之影像感測器於台灣積體電路公司2層多晶矽4金屬互補式金屬氧化物半導體0.35微米標準製程中實現。

A novel CMOS image sensor with log-lin-log response is presented. The pixel cell has logarithmic response in very low illumination intensity, linear response in low and medium illumination intensity, and logarithmic response in high illumination. In this scheme, the sensor is highly sensitive to very low light, while still owning the properties of high voltage swing of 0.53V (from 1.8V supply) and high dynamic range of 120dB. Furthermore, CDS technique can be applied to the proposed sensor array to reduce the fixed pattern noise. For the purpose of demonstration, a prototyped image sensor array of 75x54 with readout circuit and CDS is designed and realized from 1.8V supply in the TSMC 0.35µm CMOS 2P4M standard process.

Abstract
Chapter 1 Introduction………………………………………………………… 1
1.1 Motivation…………………………………………………………… 1
1.2 Improvements for Conventional CMOS Image Sensor……………... 2
1.3 CMOS Image Sensors Characteristics………………………………. 4
1.4 Thesis Organization…………………………………………………. 8
Chapter 2 Summary and Comparison of CMOS Image Sensors…………… 10
2.1 Charge-Coupled Device (CCD)……………………………………... 10
2.2 CMOS Image Sensors (CIS)...………………………………………. 10
2.2.1 Fundamentals of CMOS Image Sensor……………………….. 11
2.2.2 Passive Pixel Sensor (PPS)……………………………………. 13
2.2.3 Linear Response CMOS Active Pixel Sensors (APS)………… 14
2.2.4 Logarithmic Response CMOS APS………………...…………. 15
2.2.5 Lin-Log Response CMOS APS……………………………….. 16
2.3 Summary……………………...……………………………………... 17
Chapter 3 Proposed Pixel Structure and Operation…………………………. 19
3.1 Pixel Architecture……………………………………………………. 19
3.2 Analysis……………………………………………………………… 21
3.3 Implementation and Simulation Results…………………………... 26
3.4 Comparison with Other CIS ………………………………………… 29
Chapter 4 Proposed Pixel Structure and Operation…………………………. 31
4.1 CMOS Image Sensor System………………………………………... 31
4.1.1 System Block………………………………………………….. 31
4.1.2 Pixel Sensor…………………………………………………… 32
4.1.3 In-pixel CDS Technique………………………………………. 34
4.2 Analysis and Layout………………………………………………… 37
4.2.1 System Analysis……………………………………………….. 37
4.2.2 Analog Signal Chain…………………………………………... 38
4.2.3 Global Amplifier……………………………………………… 42
4.3 Digital Building Blocks……………………………………………... 46
Chapter 5 System Simulation and Measurement…………………………… 54
5.1 System Simulation…………………………………………………... 54
5.2 Measurement………………………………………………………… 55
5.2.1 Test Plan……………………………………………………….. 55
5.2.2 Measurement Result…………………………………………… 59
Chapter 6 Conclusion and Future Work……………………………………… 63
6.1 Conclusion…...……………………………………………………… 63
6.2 Future Work…………………………………………………………. 65
Bibliography…………………………………………………………………… 66

[1]Liang-Wei Lai, Cheng-Hsiao Lai, Ya-Chin King, “A Novel Logarithmic Response CMOS Image Sensor With High Output Voltage Swing and In-Pixel Fixed-pattern noise Reduction,” IEEE Sensors Journal, vol. 4, No. 1, February. 2004.
[2]Hsien-Chun Chang, Ya-Chin King, Tunable Injection Current Compensation Architecture for High Fill-Factor Self-Buffered Active Pixel Sensor, Master Thesis, National Tsing Hua University, ROC, June 2002.
[3]H.S. Wong, “Technology and Device Scaling Considerations for CMOS Imagers,” IEEE Transaction on Electron Devices, vol.45, no. 12, pp.2131-.2142,.Dec.1996.
[4]C. Hong and R.I Hornsey, “Inverted Logarithmic Active Pixel with Current Readout,” 2001 IEEE Workshop on CCDs and Advanced Image Sensors, Crystal Bay, Nevada, June 2001.
[5]V. Gruev, et al., “Linear current-mode imager with low fix-pattern noise,” IEEE ISCAS’04, May 2004.
[6]Ying Huang, Current-Mode CMOS Image Sensor, Master Thesis, Waterloo University, 2002.
[7]Eric C. Fox, et al., “Wide-Dynamic-Range Pixel with Combined Linear and Logarithmic Response and Increased Signal Swing,” Proceedings SPIE, vol. 3965, Jan 2000.
[8]G.G. Storm, et al., “Combined Linear-Logarithmic CMOS Image Sensor,” ISSCC, 2004.
[9]Jih-shin Ho et al., ”A new design for 1280x1024 digital CMOS image sensor with enhanced sensitivity, dynamic range and FPN,” IEEE International Symposium on VLSI and Systems and Applications, pp.235-238, 1999.
[10]Kwang-Bo Cho, A 1.2V Micropower CMOS Active Pixel Sensor, Ph. D. dissertation, Southern California University, 2001.
[11]P. K. Hanumolu, Design of Low Noise, Low Power Linear CMOS Image Sensor, Master Thesis, Worcester Polytechnic Institute, 2001.
[12]K.M. Findlater, A CMOS Camera Employ a Double Junction Active Pixel, Ph. D. dissertation, Edinburgh University, 2001.
[13]K.M. Findlater, “A CMOS Image Sensor with a Double Junction Active Pixel,” IEEE Transaction on Electron Devices, vol.50, no.1, pp.32-42, Jan.2003.
[14]Hui Tian et al, “Analysis of Temporal Noise in CMOS Photodiode Active pixel,” IEEE J. Solid-State Circuits, vol.36, no.1, Jan.2001.
[15]S.O. Kasap, Optoelectronics and Photonics Principles and Practices, Prentice-Hall,1999.
[16]B. Razavi, Design of Analog CMOS Integrated Circuit, McGraw-Hill, 2001
[17]D. Johns and K. Marti, Analog Integrated Circuit Design, Jon Wiley and Sons,1996.
[18]Jonathan Coulombe, et al., ”Variable resolution CMOS current mode active pixel sensor,” International Symposium on Circuit sand Systems, vol.2, 28-31 pp.293-296, May 2000.
[19]F. Boussaid, et al., “A CMOS Image Sensor with a Double Junction Active Pixel,” IEEE Transactions on Consumer Electronics, vol.50, no.1, pp.46-52, Feb.2004.
[20]Sung-Mo Kang, Yusuf Leblebici, CMOS Digital Integrated Circuits Analysis and Design, 3rd ed., McGraw Hill, 2002.
[21]Abbas El.Gamal, “High Dynamic Range image sensors”, ISSCC tutorial, 2002.
[22]Y. Audet and G.H. Chapman, “Design of a Self-Correcting Active Pixel Sensor,” Intern. Symposium on Defect and Fault Tolerance in VLSI Systems, pg 18-27, San Francisco, CA. Oct. 2001.
[23]G.H. Chapman and Y. Audet, “Creating 35 mm Camera Active Pixel Sensors,” Proceedings Intern. Symposium on Defect and Fault Tolerance in VLSI Systems, Albuquerque, NM, pg 22-30, Nov. 1999.
[24]I. Koren, et al.,“A Self-Correcting Active Pixel Camera”, Proceedings Intern. Symposium on Defect and Fault Tolerance in VLSI Systems, Yamanashi, Japan, pg 56-64 Oct. 2000.
[25]I. Koren, et al.,“Advanced Fault-Tolerance Techniques for a Color Digital Camera on-a- Chip”, Proceedings Intern. Symposium on Defect and Fault Tolerance in VLSI Systems, pg 3-10, San Francisco, CA. Oct. 2001.
[26]E.R. Fossum, “Active Pixel Sensors: Are CCD’s Dinosaurs?,” Proceedings SPIE, Charge -Coupled Devices and Solid-State Optical Sensors III, Feb. 1993 Vol. 1900, pp. 2-14.
[27]G.H. Chapman, “Laser Applications to IC Defect Correction,” Proceedings SPIE Photonics West: Lasers as Tools for Manufacturing of Durable Goods and Microelectronics, v 3274, pg 79-89, San Jose, 1998.
[28]Chien-Ying Wu, Sau-Mou Wu, A New Low-voltage Log-Lin Response CMOs Image Sensor for XGA, Master Thesis, Yuan-Ze University, ROC, June 2005.
[29]Zhi-yao Wu, Yung-Jane Hsu, A Image Sensor with Automatic Gain Control Mechanism, Master Thesis, National Tsing Hua University, ROC, January 2007.