臺灣博碩士論文加值系統

我們以陽極氧化鋁奈米孔洞薄膜(AAO)作為生長奈米線的基板，製備過程中利用不同的電解液或電壓等參數可控制奈米孔洞的大小，配合溶膠凝膠法可製備出不同尺度的Y3Ba5Cu8O18-δ高溫超導奈米線。將薄膜外側的粉末以X-ray繞射研究樣品晶格結構，估算a軸為3.88A、b軸為3.81A、c軸為31.24A，並利用掃描式電子顯微鏡(SEM)拍攝表面形貌，之後藉由能量分散光譜(EDX)確認Y3Ba5Cu8O18-δ奈米線的元素成分無誤，再以場發射電子顯微鏡(FESEM)觀察奈米線在陽極氧化鋁奈米孔洞薄膜中的型態。最後利用超導量子干涉磁量儀(SQUID)量測Y3Ba5Cu8O18-δ奈米線的超導轉變溫度，比較塊材與不同尺度奈米線的超導轉變溫度，並推算出樣品相干長度4.7×〖10〗^(-9)m。

We use AAO as a substrate of the growth of nanowires, and during the preparation, by using a different electrolyte, voltage and other parameters, we are able to control the size of the nanopores. In coordination with the sol-gel method we can prepare different scales of the Y3Ba5Cu8O18-δ, high-temperature superconducting nanowires. Use X-ray diffraction to study sample lattice structure of the powder on the outside of the film and we can estimate the a-axis, b-axis, and c-axis. Simultaneously we can use a SEM to shoot the surface morphology, followed by an EDX to confirm the elemental composition of the Y3Ba5Cu8O18-δ nanowire is correct, then a FESEM to observe the types of nanowires in the AAO film. Finally, using the SQUID measurement to measure the Y3Ba5Cu8O18-δ nanowire superconducting transition temperature, and compare the bulk with different scale nanowire superconducting transition temperature to calculate the sample coherence length m.

摘要....................................................i
Abstrat................................................ii
目錄...................................................iii
圖表目錄..................................................v
第一章 序論.............................................1
1.1. 奈米科技的來臨.......................................................1
1.2. 研究的動機與目的.......................................................2
第二章 簡介.......................................................3
2.1. 超導體發現及理論.......................................................3
2.2. 超導體發展歷史...................................3
2.3. 超導體特性.......................................4
2.4. 超導體的分類.....................................6
2.5. 超導體Y3Ba5Cu8O18..............................................7
第三章 儀器介紹........................................................8
3.1. 磁性量測........................................................8
3.2. X-ray粉末繞射儀(XRD) .........................................................10
3.3. 掃描式電子顯微鏡(SEM)....................................................12
3.4. X射線能量散佈分析儀(EDS) .........................................................14
3.5. 穿透式電子顯微鏡(TEM) .........................................................15
第四章 實驗方法與製備........................................................16
4.1. 樣品製作與流程........................................................16
4.2. 樣品的製作......................................17
第五章 實驗成果分析與討論...................................21
5.1. X-ray成分分析....................................................21
5.2. SEM量測....................................................23
5.3. EDS量測....................................................27
5.4. TEM量測....................................................28
5.5. 磁性量測....................................30
第六章 結論...........................................43
參考文獻....................................................44

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