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In order to blue-shift the electroluminescence (EL) peak wavelength of anamorphous p-i-n thin-film light-emitting diode (TFLED), a higher optical-gapmaterial, a-SiN:H, was used as the luminescent i-layer. Further, to improve the device EL properties, the same material (a-SiN:H) was employed to from thep-i and n-i brightness of a finished device, having a n+-a- Si:H layer contactedwith the Al external electrode , was 200cd/ m2 at an injection current density of 4A/cm2. Its EL threshold voltage was 11.7V and peak wavelength of EL spectrum.However, its brightness is lower and not so good as expected. The current-conductionmechanism of the a-SiN:H p-i-n TFLEDs was also investigated. For a low applied voltage, the ohmic conduction is dominat. Whereas, for a high applied voltage, the Frenkel-Poole emission is the main conduction mechanism.
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