[1] 張振堶,自動光學檢測(AOI)市場及技術發展趨勢調查,新竹:工研院IEK系統能源組,2002。
[2] http://en.wikipedia.org/wiki/Computer_tomography
[3] http://www.tbcl.com.tw/Product/Xavis/TBCL-SX-090A-SMT.pdf
[4] http://www.yamato-china.cn/english/products/tdm1000/tdm1000.htm
[5] M. Sezign and B. Sankur, "Survey over image thresholding techniques and quantitative performance evaluation," 2003.
[6] N. Otsu, "A Tlreshold Selection Method from Gray-Level Histograms," IEEE, 1979.
[7] C. I. Chang, Y. Du, J.Wang and Thouin. "Survey and comparative analysis of entropy and relative entropy thresholding techniques," 2006.
[8] T. Pun, "A new method for grey-level picture thresholding using the entropy of the histogram," Signal process, vol. 2(3), 1980, pp. 223-237.
[9] T. Pun, "Entropic thresholding: a new approach," Compute. Graph. Image Process, vol. 16, 1981, pp. 210-239.
[10] J. N. Kapur, P. K. Sahoo and A. K. C. Wong, "A new method for gray-level picture thresholding using the entropy of the histogram," Computer Vision, Graphics, Image Processing, vol. 29(3), 1985, pp. 273-285.
[11] T. Cover and J. Thomas, Elements of information theory, John Wiley & Sons, 1991.
[12] R. Gonzalez and J. Woods, Digital image processing, 1992.
[13] A. S. Abutaleb, "Automatic thresholding of grey-level pictures using two-dimensional entropy," Comput. Vis. Graph. Image Process, vol. 47, 1989, pp. 22-32.
[14] N. R. Pal and S. K. Pan, "Entropic thresholding", Signal process, vol. 16, 1989, pp. 97-108.
[15] J. Kittler and J. Illingworth, "Minimun error thresholding," 1986.
[16] C. H. Li and C. K. Lee, "Minimum cross entropy thresholding," 1993.
[17] C. I. Chang, K. Chen, J. Wang and M. L. G. Althouse, "A relative entropy-based approach to image thresholding," 1994.
[18] S. S. Lee, S. J. Horng and H. R. Tsai. "Entropy thresholding and its parallel algorithm on the reconfigurable array of processors with wide," 1999.
[19] K. Pratt, S. Sawkar and O.Reilly, "Automatic blemish detection in liquid crystal flat panel displays," SPIE, vol. 3306, 1998, pp. 2-13.
[20] 郭家成,薄膜電晶體液晶顯示器Mura瑕疵檢測技術之研發,碩士論文,國立臺北科技大學自動化科技研究所,台北,2006。[21] Niblack, "An Introduction to Image Processing," 1986, pp. 115–116.
[22] O. Stepan, M. Jiri, "Image Retrieval Using Local Compact DCT-based Representation," Pattern Recognition, DAGM''03,25th, Germany, 2003.
[23] R. C. Gonzalez and R. E. Woods, Digital Image Processing, 2nd Edition, Prentic-Hall, NJ, 2002.
[24] J. M. S. Prewitt and M. L. Mendelsohn, "The analysis of cell images," in Ann. New York Acad. Sci., vol. 128, 1998, pp. 1035-1053.
[25] A. Rosenfeld and P. De La Torre, "Histogram concavity analysis as an aid in threshold selection," IEEE Trans. System Man Cybernet., vol. 13, 1983.
[26] W. Doyle, "Operation useful for similarity-invariant pattern recognition," J.Assoc.Comput.Mach, vol. 9, 1962, pp. 259-267.
[27] A. Khashman and B. Sekeroglu, "A Novel Thresholding Method for Text Separation and Document Enhancement," 11th Panhellenic Conference in Informatics, 2006, pp. 323-330.
[28] http://en.wikipedia.org/wiki/Fourier_transform
[29] http://en.wikipedia.org/wiki/Cooley-Tukey_FFT_algorithm
[30] J. G. Campbell, C. Fraley, D. Stanford, F. Murtagh and A. E. Raftery, Model-Based Mesed Methods for Textile Fault Detection, John Wiley & Sons, Inc., vol. 10, 1999, pp. 339-346.
[31] S. Golam and A.Ajith, "DCT based texture classification using soft computing approach," Malaysian Journal of Computer Science, 2004.
[32] J. Y. Lee and S. I. Yoo, "Automatic Detection of Region-Mura Defect in TFT-LCD," IEICE TRANS. INF. &SYST., vol. E87-D (10), 2004, pp. 2371-2378.
[33] K. N. Choi, J. Y. Lee and S. I. Yoo, "Area-Mura Detection in TFT-LCD Panel," The Interational Society for Optical Engineering 5300, 2004, pp. 151-158.
[34] 尹志瑋,應用二維離散餘弦轉換於雙穩態膽固醇液晶顯示器之表面瑕疵檢測,碩士論文,私立中原大學機械研究所,桃園,2008。
[35] 謝承恩,以累積差異及多重解析度背景相減偵測LCD Mura瑕疵,碩士論文,國立中央大學資訊工程研究所,桃園,2008。[36] 楊舜霖,基於奇異值分解法運用於薄膜電晶體液晶顯示器Mura瑕疵之自動化檢測技術,碩士論文,國立臺北科技大學自動化科技研究所,台北,2007。
[37] C. J. Lu and D. M. Tsai, “Automatic defect inspection for LCDs using singular value decomposition,” Int. J. Adv. Manuf. Technol., 2005, pp. 53–61.
[38] 薛昭能,應用奇異值分解法(SVD)於雙穩態膽固醇液晶顯示面板之表面瑕疵檢測,碩士論文,私立中原大學機械研究所,桃園,2008。