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研究生:劉邦彥
研究生(外文):Pang-Yen Liu
論文名稱:考慮製程能力指標之量測能力評估
論文名稱(外文):Evaluating Measurement Capability Based on Process Capability Index Cpk
指導教授:陳建平陳建平引用關係
指導教授(外文):Jann-Pygn Chen
學位類別:碩士
校院名稱:國立勤益技術學院
系所名稱:工業工程與管理系
學門:工程學門
學類:工業工程學類
論文種類:學術論文
論文出版年:2006
畢業學年度:94
語文別:中文
論文頁數:42
中文關鍵詞:準確度穩定性種特性精密度誤差
外文關鍵詞:AccuracyPrecisionMSAProcess capability index
相關次數:
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量具對產品所量測出的數值是否精準是在品質改善上的一個關鍵,唯有一個好的量測系統才能保證所量測出來數值是可信的,而一般在做量測系統分析時都是依照QS-9000中量測系統分析(Measurement System Analysis,MSA)手冊所制訂之標準做為判定之準則。
為了符合QS-9000之要求,量測系統分析必須同時評估位置誤差與變異誤差,位置誤差通常包含偏倚、線性與穩定性三種特性;變異誤差包含重複性(Repeatability)與再現性(Reproducibility)二種特性。目前QS-9000及ISO/TS16949所探討都只是用來評估這五種特性之可接受的合理範圍以及進一步提出P/T(Precision- To-Tolerance)值的可接受範圍,而很少同時考慮與製程能力指標之相互關係。本研究主要是探討同時考慮準確度與精密度的製程績效指標Cpk 的要求下與P/T值可接受範圍之相互關係探討。首先找出Cpk 與 P/T 值、Ca 值之函數關係,並在不同的 Cpk 要求下,利用 Cpk 近似信賴下限決定P/T 值可接受的合理範圍。再利用此合理範圍進行一個二因子實驗評估量測系統變異誤差是否符合此範圍,最後以一個案實例來說明量測系統能力的實施步驟。
The measurement system analysis (MSA) is very important for quality improvement. A capable measurement system can be accurately to measure observed data. Normally, the evaluation standard of MSA by QS-9000 is used to judge the measurement capability.
However, the current QS-9000 or ISO/TS16949 only refer to the acceptable range of P/T value, the relationship between Process capability index and P/T value had been rarely proposed. The thesis discusses the acceptable range of P/T value under satisfying customer’s Cpk requirement which considering process accuracy and precision. Firstly, the functional relation between Cpk and P/T value, Ca is derived. The approximate lower confidence limit of Cpk is used to determine the acceptable range of P/T value under observed Cpk values. To utilize the reasonal range to conduct a two factor experiment to evaluate if measurement system variation error is within the range. Finally, a case study is derived the implementing step of evaluating measurement capability.
目錄
中文摘要 i
英文摘要 ii
目錄 iii
表目錄 iv
圖目錄 v
第一章 緒論 1
1.1 研究背景與動機 1
1.2 研究目的 1
1.3 研究限制 2
1.4 研究架構 2
第二章 文獻探討與回顧 4
2.1 位置誤差 5
2.2 變異誤差 8
第三章 變異誤差的估算方法之介紹 13
3.1 全距法 13
3.2 典型GR&R 14
3.3 長表格 15
3.4 變異數分析法(ANOVA) 21
第四章 GR&R判定準則P/T值與製程能力指標Cpk之關係探討 24
4.1 量測能力判定準則 24
4.2 製程能力指標Cpk與P/T值之函數關係 25
4.3 考慮Cpk指標下P/T值合理範圍建構 29
4.4 探討不同信賴水準與製程能力下P/T值之合理範圍 31
第五章 案例探討 36
5.1 量測設備之描述 36
5.2 產品數據收集與計算製程能力 37
5.3 量測設備之量測系統分析 38
第六章 結論與建議 40
6.1 結論 40
6.2 建議 40
參考文獻 41
附錄 43
參考文獻
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