臺灣博碩士論文加值系統

太陽能電池的電位誘發衰減現象，又稱為PID(Potential Induced Degradation)現象，是一種當太陽能電池於封裝成太陽能電池模組板時[1]，安裝於太陽能發電系統端；在陽光下進行發電時，因太陽能模組為了提高系統電壓而進行大量串接後，使得太陽能模組板承受來自過高的端電壓的影響，產生一種經由電位差異誘發造成衰減的現象；由於此現象發生時，會造成太陽能電池模組板產生嚴重的功率衰減，造成發電效益降低，進而造成更嚴重的問題發生。本研究中準備了三種不同的RI(Reflection index)值的電池片，依照IEC62804的測試方法，比對了標準太陽能模組與單片電池片的迷你模組進行PID測試的結果；依據通過測試的百分比，確認測試結果為正相關，因此在標準測試下可省下模組材料的成本；另外本研究內也同時比對了迷你模組與單片太陽能電池測試儀的測試結果，依據通過測試的百分比得知兩者具有正相關性，因此在PID的測試上可以更精確地針對電池片進行PID測試；由於穩態單片電池片模擬測試時，並聯阻抗將隨著時間變化；因此我們引用了穩態時間法分析(settling time)單片太陽能電池片隨著時間變化的阻抗資料，成功的在14小時取得９４%預測PID現象的準確率；為了獲得更快以及更精確的測試結果，本研究更使用了類神經網絡的方法，進行數據分析與結果的預測與驗證。其實驗結果顯示，在利用類神經網路的黑盒子特性以及不需要詳細定義的數學模型的優勢下進行數據分析，進而佐以實驗的驗證下，太陽能電池片的PID現象在類神經網路的模測試下，可於２小時內獲得８０％的準確率；由於提前預測的電池片是否有PID現象的發生，可使得在工廠生產線上減少品質異常的太陽能電池片輸出至模組封裝廠進行封裝作業，減少生產成本的虛耗，進而提升整體太陽能模組的生產品質以及戶外的耐久性

Potential Induced Degradation (PID) is a kind of induced attenuation phenomenon which makes solar module panels to withstand the impact from the terminal voltage when solar cell is packaged into the PV modules and work at outdoors in sunlight to generate electricity. It will cause serious solar module panels’ power attenuation, and result in lower power generation efficiency and more serious problems when the terminal voltage is applied on solar modules, due to this phenomenon. In this study, we prepare the three kind cell of different Reflection Index, compare the standard module and mini-module test result base on the IEC 62804 test condition; We also compare the mini-module and signal cell PID test result. The result was show positive correlation between mini-module and signal cell. In addition, settling time method was applied to PID issue forecast. The average prediction hit rate is 94% at 14th hour test. At last, a data analysis method is by neural network theory and predict the cell whether the occurrence PID issue on PV module. Base on the neural network black box and no need the detail math mode characteristic for data analyze, it will be occur more than 80% hit rate at 2hr. If we predict the PID issue on cell level, that we can reduce the cost, and increase the quality and reliability at outside.

目錄
中文摘要 I
Abstract II
誌謝 III
目錄 IV
圖目錄 VII
符號索引 VIII
第一章 緒論 1
第一節 研究動機 1
第二節 研究背景 3
第三節 論文架構 12
第二章 相關技術介紹 13
第一節 PID (Potential Induced Degradation)現象介紹 13
第二節 太陽能迷你模組板測試PID的測試技術介紹 16
第三節 針對太陽能電池片的PID現象模擬測試法介紹 17
第四節 類神經網路架構介紹 19
第三章 研究方法 25
第一節 迷你模組PID測試 25
第二節 太陽能電池片PID模擬測試 27
第三節 穩態時間法(Settling Time)模擬測試 28
第四節 類神經網路系統模擬測試 37
第四章 實驗結果及討論 43
第一節 太陽能電池標準模組與迷你模組PID測試 43
第二節 使用PID測試儀之結果與迷你模組的PID測試結果進行比對 48
第三節 使用穩態時間法縮短太陽能電池片PID測試時間 51
第四節 使用類神經網路進行PID現象預測 54
第五章 結論及未來展望 57
參考文獻 59

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