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Abstract Electronic components miniaturization process now, passive component also need to enter the miniature field with active IC, And the key factor that control passive components following the miniaturization process is electroplating. Therefore, how to achieve plating size control effective is most important thing. In this paper study, we discuss the simulation result for known flush fields, from 2007 paper by Shau-Huang, Shiau “Study on the uniformity of coating thickness of the plated electroplating flow field”, we known using entire angle (β=3∘) cone-shaped flow field, it is possible to get better a uniformity on a circular copper sheet, which is applied in the field of smaller passive component size, In this paper, mainly method is DOE (Design of Experiment) used to design a plating bath suitable for square wafers, and finding more robust plating design, from DOE method, first to select important factor selections, and find out best combination through eight basic principles of Taguchi experiment design parameter to find out best combination, after experimental verification, the S/N ratio of the original swing bath is 15.2, and from the DOE optimization is flush plating mechanism has great increase S/N ratio to 25.99,which is more effective to improve the wafer plating thickness uniformity
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