跳到主要內容

臺灣博碩士論文加值系統

(216.73.216.254) 您好!臺灣時間:2026/06/29 07:25
字體大小: 字級放大   字級縮小   預設字形  
回查詢結果 :::

詳目顯示

: 
twitterline
研究生:廖尚宇
研究生(外文):LIAO, SHANG-YU
論文名稱:封裝結構2D與3D有限元素分析比較
論文名稱(外文):Comparison of 2D and 3D Finite Element Analysis of Package Structures
指導教授:陳精一陳精一引用關係
指導教授(外文):Chen,Ching-I
口試委員:陳自豪涂聰賢
口試委員(外文):CHEN,ZI-HAUTU,TSUNG-HSIEN
口試日期:2017-07-22
學位類別:碩士
校院名稱:中華大學
系所名稱:機械工程學系
學門:工程學門
學類:機械工程學類
論文種類:學術論文
論文出版年:2017
畢業學年度:105
語文別:中文
論文頁數:75
中文關鍵詞:ANSYS封裝結構封裝應力有限元素法疊層元素
外文關鍵詞:ANSYSPackagingFEMThermal StressLayer Element
相關次數:
  • 被引用被引用:1
  • 點閱點閱:423
  • 評分評分:
  • 下載下載:22
  • 收藏至我的研究室書目清單書目收藏:0
IC產業不斷的發展使得電子元件輕薄短小、多功能,使人們生活更加的便利。電子元件中不同結構都是重要的元件之一,除了電訊導通,保持機械結構強度,因此元件可靠度是研究人員所探討的重點。本文以業界提供封裝做為探討,利用有限元素分析軟體,探討封裝結構在承受265 °C高溫度負載,在降至室溫 25 °C 下之結構的熱機行為。此外對於封裝結構中央切面的熱機行為,本文欲以2D平面結構進行模擬以了解兩者之間的差異,提供有限元素分析人員日後參考依據。
本文封裝結構有三種模型,稱為模型A、模型B和模型C。三個模型之差異為玻璃材料與晶片之間的結構。為了比較2D與3D有限元素模型將建立1/2對稱模型,結構中元件厚度較薄,3D結構採用疊層元素,並選用高階元素以增加收斂性。
高溫時模型A的位移量最大約為4 m,模型B與模型C的位移量約 3.2 m,降回室溫時位移量約 2.1 m至 2.5 m,其中模型C為最大。高溫時等效應力約896 MPa至 1140 MPa,其中模型B的等效應力最大,降回室溫時等效應力約642 MPa至 711MPa,其中模型B的等效應力最大,降幅約37 %。
高溫時2D有限元素模型顯示,除了模型B以外其他模型x方向變形大於3D有限元素模型 20 %,除了模型C以外其他模型y方向變形小於3D有限元素模型 20 %。降回室溫時2D有限元素模型顯示,所有模型x方向變形大於3D有限元素模型17~31 %,y方向變形大於3D有限元素模型但無規律。高溫時2D有限元素模型顯示,所有模型等效應力,皆小於3D有限元素模型約25 %,降回室溫時約40 %。本3D結構並非無限長很合理的可簡化為2D結構,但2D分析結果的位移與應力分布在定性上與3D分析結果可適度的對比。

The continuous development of IC has the electronic components thin, compact and versatile which makes our lives more convenient. Any components in the electronic packaging are important not only for telecommunications but also strength its mechanical structure, therefore, the reliability of any components becomes a study topic of the researchers.
The thermal-mechanical behavior of a packaging was investigated under 265 °C high temperature loading and down to room temperature 25 °C. In order to discuss the thermal behavior of the central section of the package structure, both 2D and 3D finite element models were created and compared. Due to small thickness of the packaging, the layer 3D solid element was selected in 3D finite element model and higher order element was used in both models to improve the convergence problem.
At high temperature, the displacement of model A is about 4 m, the displacement of model B and model C is about 3.2 m, and the displacement is about 2.1 m to 2.5 m at room temperature, and model C is the largest. The equivalent stress is about 896 MPa to 1140 MPa at high temperature, and the model B is the largest. The equivalent stress is about 642 MPa to 711 MPa at room temperature, and model B is the largest. The average equivalent stress was about 37 % lower.
The 2D finite element model at high temperature showed that the deformation of model A and C in x direction is greater than 20 % of the 3D finite element model. In addition to model C, the y-direction deformation of other models was less than 20 % of the 3D finite element model. At room temperature, the 2D finite element model showed that the deformation of all models was greater than that of the 3D finite element model by 17~31 %. The y-direction deformation of all models was greater than that of the 3D finite element model. The 2D finite element model at high temperature showed that the equivalent stress of all models is less than that of 3D finite element model by 25 %, and 40 % was found in back to room temperature. The 3D structure was not very reasonable by infinite long structure and can be simplified to 2D structure, but the displacement and stress distribution of 2D analysis results can be qualitatively compared with 3D analysis results

目錄
中文摘要 I
ABSTRACT II
致謝 III
目錄 IV
圖目錄 VI
表目錄 IX
第一章 緒 論 1
1-1前言 1
1-2文獻回顧 4
1-3研究動機與目的 7
1-4研究方法 7
第二章 有限元素模型分析 10
2-1構裝體幾何尺寸 10
2-2構裝體機械性質 14
2-3狀態應力(state of stress) 15
2-3-1平面應力 18
2-3-2平面應變 20
2-4有限元素模型建立策略 21
2-5負載及邊界條件 25
第三章 有限元素模型分析結果 27
3-1有限元素模型 27
3-2 3D模型分析結果 32
3-3 修正邊界條件3D模型分析 36
3-4 2D與3D模型分析比較 47
第四章 結 論 58
參考文獻 60


[1]陳精一,「電腦輔助實務工程分析」,全華圖書有限公司,2010年10月。
[2]謝國章,「上板掉落測試模擬與實驗分析之探討」,中華大學機械工程學系碩士畢業論文, 2010年8月。
[3]陳建偉,「上板掉落測試模擬與實驗分析之探討」,中華大學機械工程學系碩士畢業論文, 2010年8月。
[4]徐偉峻,「高銅柱堆疊晶片封裝熱機行為探討」,中華大學機械工程學系碩士畢業論文,2012年8月。
[5]李孟航,「SAC305錫球壽命預測模式探討」,中華大學機械工程學系碩士畢業論文,2013年8月。
[6]林若瑜,「Ankor 晶圓級晶片封裝之可靠度分析」,中華大學機械工程學系碩士畢業論文, 2014年8月。
[7]鄭本農,「晶圓製程之翹曲研究」,中華大學機械工程學系碩士畢業論文,2014年8月。
[8]葉哲榮,「JEDEC掉落模擬模式探討」,中華大學機械工程學系碩士畢業論文,2014年8月。
[9]鄭元鈞,「2.5D 埋入式中介層封裝之熱-機行為探討」,中華大學機械工程學系碩士畢業論文,2014年8月。
[10]蔡楠泓,「晶圓級封裝塑膠球心錫球熱機行為探討」,中華大學機械工程學系碩士畢業論文, 2015年8月。
[11]蔡巧怡,「CMOS影像感棄濕擴散與吸濕應力分析」,中華大學機械工程學系碩士畢業論文,2015年8月。
[12]楊雨碩,「封裝體壽命預估之探討」,中華大學機械工程學系碩士畢業論文,2015年8月。
[13]鄭博倫,「田口法對封裝體錫球壽限之評估」,中華大學機械工程學系碩士畢業論文, 2016年8月。
[14]Chang-Ming Liu, Kuo-Ning Chiang,” Solder Bumps Layout Design And Reliability Enhancement of Wafer Level Packaging,” International Conference on Electronic Packaging Technology, pp. 56-64, 2003.
[15]Chang-Chun Lee, Shu-Ming Chang, Kuo-Ning Chiang, ”Design of Double Layer WLCSP Using DOE with Factorial Analysis Technology,” Electronics Packaging Technology Conference, pp. 776-781, 2004.
[16]Chang-Ann Yuan, Cheng Nan Han, Ming-Chih Yew, Chan-Yen Chou, and Kou-Ning Chiang, ”Design, Analysis, and Development of Novel Three-Dimensional Stacking WLCSP,” IEEE Transactions on Advanced Packaging, Vol. 28, No. 3, pp. 387-396, August 2005.
[17]Chang-Ming Liu, Kuo-Ning Chiang, ”Reliability Enhancement of Wafer Level Packaging Using Solder Ball Layout Methodology,” International Conference on Electronic Packaging Technology, 2005.
[18]Ji-Cheng Lin, Hsien-Chie Cheng, and Kuo-Ning Chiang, ”Design and Analysis of Wafer-Level CSP With a Double-Pad Structure,” IEEE Transactions on Components and Packaging Technologies, Vol. 28, No 1, pp. 117-126, March, 2005.
[19]John H. Lau, S-W. Ricky Lee, ”Reliability of Wafer Level Chip Scale Package (WLCSP) with 96.5Sn-3.5Ag Lead-Free Solder Joints on Build-up Microvia Printed Circuit Board,” Int’l Symp. on Electronic Materials & Packaging, pp. 55-63, 2000.
[20]John H. Lau, ”Critical Issues of Wafer Level Chip Scale Package (WLCSP) with Emphasis on Cost Analysis and Solder Joint Reliability,” IEEE/CPMT Int’l Electronics Manufacturing Technology Symposium, pp. 33-46, 2000.
[21]John H. Lau, S-W. Ricky Lee and Chris Chang, ”Solder Joint Reliability of Wafer Level Chip Scale Packages (WLCSP): A Time-Temperature-Dependent Creep Analysis,” ASME Journal of Electronic Packaging, Vol. 122, pp. 311-316, December, 2000.
[22]John H. Lau, Stephen H. Pan and Chris Chang, ”Creep Analysis of Wafer Level Chip Scale Package (WLCSP) With 96.5Sn-3.5Ag and 100In Lead-free Solder Joints and Microvia Build-up Printed Circuit Board,” ASME Journal of Electronic Packaging, Vol. 124, pp. 69-76, June, 2002.
[23]John H. Lau, Stephen H. Pan and Chris Chang, ”A New Thermal-Fatigue Life Prediction Model for Wafer Level Chip Scale Package (WLCSP) Solder Joints,” ASME Journal of Electronic Packaging, Vol. 124, pp. 212-220, September, 2002.
[24]William E. R. Krieger, Sathyanarayanan Raghavan, and Suresh K. Sitaraman, ”Experiments for Obtaining Cohesive-Zone Parameters for Copper-Mold Compound Interfacial Delamination,” IEEE TRANSACTIONS ON COMPONENTS, PACKAGING AND MANUFACTURING TECHNOLOGY, Vol. 6, No. 9, pp. 1389-1398, September 2016.
[25]Bingbing Zhang, Daoguo Yang, et al, "Modeling of Mixed-Mode Delamination by Cohesive Zone Method," Proc. 14th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, pp. 1-7, 2013.
[26]Bingbing Zhang, Daoguo Yang, et al, “Cohesive Zone Modeling of Mixed-Mode Delamination Tests,” Proc. 14th International Conference on Electronic Packaging Technology, pp. 559-565, 2013.
[27]Bingbing Zhang, Daoguo Yang, et al, "2D/3D Cohesive Zone Modeling of a Mixed-Mode Delamination experiment," Proc. 15th Electronics Packaging Technology Conference, pp. 269-274, 2013.
[28]Weihai Zhang, Daoguo Yang, et al, "Interface crack propagation between Epoxy Molding Compound and Copper," Proc. 17th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, pp.1-8, 2016.
[29]Maofen Zhang, Daoguo Yang, Leo Ernst and Bingbing Zhang, ”Simulation of Delamination Initiation and Subsequent Propagation Using Cohesive Zones,” 18th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, 2017.
[30]J. Auersperg, E. Auerswald, C. Collet, Th. Dean, D. Vogel, Th. Winkler and S. Rzepka, ”Effects of Residual Stresses on Cracking and Delamination Risks of an Avionics MEMS Pressure Sensor,” 18th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, 2017.
[31]M. van Soestbergen, A. Mavinkurve, S. Shantaram, and J. J. M. Zaal, “Delamination-induced stitch crack of copper wires,” 18th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, 2017
[32]Yangming Liu, Zhongli Ji, Peng Chen, Xu Wang, Ning Ye and Chin-Tien Chiu, ”Moisture Induced Interface Delamination for EMI Shielding Package,” IEEE CPMT Symposium Japan (ICSJ), pp. 217-220, 2016.
[33]B. Wunderle, D. May, M. Abo Ras, S. Sheva, M. Schulz, M. Wöhrmann, J. Bauer and J. Keller, “In-situ Monitoring of Interface Delamination by Local Thermal Transducers Exemplified for a Flip-chip Package,” Therminic 2016 – 22nd International Workshop on Thermal Investigations of ICs and Systems, 2016.
[34]S. Papaleo and H. Ceric, “A Finite Element Method Study of Delamination at the Interface of the TSV Interconnects,” IEEE International Reliability Physics Symposium (IRPS), 2016.
[35]Ying Yang, ”Failure Analysis for Laminate Delamination,” 17th International Conference on Electronic Packaging Technology, 2016.
[36]S. Papaleo, W. H. Zisser, and H. Ceric, ”Factors That Influence Delamination at the Bottom of Open TSVs,” SISPAD http://www.sispad.org, 2015.
[37]Hanmin Zhang, M. Hu1, Sonder Wang, Schmadlak Ilko, B.G Yin, Q. C He and D. H Ye, “Power QFN Down Bond Lift and Delamination Study,” IEEE 16th Electronics Packaging Technology Conference (EPTC), 2014.

QRCODE
 
 
 
 
 
                                                                                                                                                                                                                                                                                                                                                                                                               
第一頁 上一頁 下一頁 最後一頁 top
無相關期刊