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研究生:黃家麒
研究生(外文):Cha-Chi Huang
論文名稱:四道光干涉微影之曝光與顯影參數對微結構輪廓及深度之探討
論文名稱(外文):The influences of exposure and development parameters on the shape and depth of micro-structure for four-beam interferometric lithography
指導教授:陳志臣
指導教授(外文):J.C Chen
學位類別:碩士
校院名稱:國立中央大學
系所名稱:機械工程研究所
學門:工程學門
學類:機械工程學類
論文種類:學術論文
論文出版年:2006
畢業學年度:94
語文別:中文
論文頁數:71
中文關鍵詞:雷射干涉微影四道光曝光
外文關鍵詞:four-beam exposurelaser interference lithography
相關次數:
  • 被引用被引用:6
  • 點閱點閱:443
  • 評分評分:
  • 下載下載:64
  • 收藏至我的研究室書目清單書目收藏:1
摘要
雷射干涉微影(Laser Interference Lithography)只須簡單的光學鏡組及雷射光源,且不須通過光罩,便可由此系統得到一維條紋及二維點陣或洞陣的週期性結構。此系統的優點在於擁有極大的聚焦深度、易於大面積曝光、低成本、高解析度。
四道光單曝光除了有干涉微影的優點外,更有著高產能、高對比度、以及易形成深孔等優勢。因此,本研究將建立四道光單曝光強度分佈之數學模型並進行相關實驗,由實驗結果分析得知,在相同曝光與顯影參數下,四道光單曝光將會使光強重新分配,使得其所得到的微結構比兩道光雙曝光之結構更為尖銳(sharper)。
另外,隨著曝光時間與顯影時間的增加,結構的特徵尺寸將會縮小,高度上亦將有所變化。本研究在適當的曝光與顯影參數下,利用ICP乾蝕刻成功地在矽基板上得到四道光單曝光所建構出的二維週期性陣列結構。
Abstract
In this research, we have developed laser interference lithography system, such as one dimension linear gratings or two dimension arrays of dots and grids, to create periodical structures. The method of maskless laser interference lithography used for generation of infinite depth of focus, relative simplicity, low cost, deep sub-micron patterns and high resolution in large field of view is investigated.
The main advantage of four-beam exposure is that higher throughput process for patterning arrays and higher contrast images can be obtained. According to theoretical analysis and experimental results, four-beam exposure allows a greater percentage of the incident energy to be redistributed near the intensity maxima and generates structures sharper.
The effects of the process parameters on the shape and depth of the structure have been discussed. According to different critical dimension, this thesis also suggests several parameters for exposure and development, with which best pattern had been acquired in our experiments.
目錄
摘要 I
英文摘要 II
致謝 III
目錄 IV
表目錄 VII
圖目錄 VIII
第一章 緒論 1
1.1 前言 1
1.2 文獻回顧 1
1.2.1 干涉微影 2
1.2.2 傳統干涉微影之改良與應用 2
1.2.2.1 干涉品質與系統的穩定度的提升 3
1.2.2.2 大面積的曝光 4
1.2.2.3 結構週期縮小 4
1.2.2.4 二維干涉微影系統 5
1.2.2.5 干涉微影的應用 6
1.3 研究目的 7
第二章 實驗原理 9
2.1 實驗原理 9
2.1.1 干涉原理 9
2.1.2 干涉技術 14
2.1.3 基本雷射原理 16
2.1.4 空間濾波器(spatial filter) 17
2.1.5 擴束器(Beam Expander) 18
2.1.6 光阻的基本性質 19
第三章 實驗方法 21
3.1 實驗方法 21
3.1.1 系統架構 21
3.1.2 實驗流程 22
第四章 結果與討論 28
4.1 上下、左右兩道光分別之直線結構 29
4.2 曝光與顯影參數對輪廓的影響 29
4.3 兩道光雙曝光與四道光單曝光之比較 31
4.4 曝光與顯影參數對深度的影響 32
4.5 蝕刻後的陣列結構 34
第五章 結論 35
參考文獻 37
附錄一 44
參考文獻
[1]L. F. Johnson, G. W. Kammlott, and K. A. Ingersoll,”Generation of periodic surface corrugations”, Applied Opttics 17, 1165(1978)
[2]Saleem H. Zaidi and S. R. J. Brueck, ”Multiple-exposure interferometric lithography”,J. Vac. Sci. Technol. B 11,658(1993)
[3]A. Fernandez,J. Y. Decker, S. M. Herman, D. W. Phillion, D. W. Sweeney, and M. D. Perry,“Methods for fabricating arrays of holes using interference lithography”, J. Vac. Sci. Technol. B 15,6 (1997)
[4] 龍文安,”微電子材料與製程”,第六章微影技術
[5] Erik H. Anderson, Kazuhiko Komatsu, and Henry I. Smith, “Achromatic holographic lithography in the deep ultraviolet”, J. Vac. Sci. Technol. B 6, 216 (1988)
[6]T. A. Savas, Satyen N. Shah, M. L. Schattenburg, J. M. Carter, and Henry I. Smith, “Achromatic interferometric lithography for 100-nm-period gratings and grids”, J. Vac. Sci. Technol. B 13, 2732(1995).
[7]Xiaolan Chen,Saleem H. Zaidi, and S. R. J. Bruecka), Daniel J. Devine,” Interferometric lithography of sub-micrometer sparse hole arrays for field-emission display applications”, J. Vac. Sci. Technol. B 14,5( 1996)
[8] A. Fernandez, H. T. Nguyen, J. A. Britten, R. D. Boyd, M. D. Perry, D. R. Kania, and A. M. Hawryluk, “Use of interference lithography to pattern arrays of submicron resist structures for field emission flat panel displays”, J. Vac. Sci. Technol. B 15, 729(1997)
[9]W. Hinsberg, F. A. Houle, J. Hoffnagle, M. Sanchez, G. Wallraff, M. Morrison, and S. Frank, “Deep-ultraviolet interferometric lithography as a tool for assessment of chemically amplified photoresist performance”, J. Vac. Sci. Technol. B 16, 3689(1998).
[10] M. A. M. Haast, J. R. Schuurhuis, L. Abelmann, J. C. Lodder, and Th. J. Popma, “Reversal mechanism of submicron patterned CoNi/Pt multilayers”, IEEE Trans. Magn. 34, 1006(1998).
[11] Brueck, S. R. J.; Zaidi, S. H.; Chen, X.; Zhang, Z, “Interferometric lithography from periodic arrays to arbitrary patterns”, Microelectron. Eng. 41-42, 145(1998).
[12] M. Zheng, M. Yu, Y. Liu, R. Skomski, S. H. Liou, and D. J. Sellmyer,” Magnetic nanodot arrays produced by direct laser interference lithography”, Applied Physics Letters 79, 2606 (2001)
[13] C. Daniel, F. Mu¨cklich, Z. Liu,” Periodical micro-nano-structuring of metallic surfaces by interfering laser beams”, Applied Surface Science 208–209, 317–321 (2003)
[14] Jinhai Si, Zhichong Meng, Shingo Kanehira, Jianrong Qiu, Bin Hua, Kazuyuki Hirao,” Multiphoton-induced periodic microstructures inside bulk zodye-doped polymers by multibeam laser interference”, Chemical Physics Letters 399 (2004)
[15] R. Murillo , H.A. van Wolferen, L. Abelmann, J.C. Lodder,” Fabrication of patterned magnetic nanodots by laser interference lithography”, Microelectronic Engineering 78–79, 260-265 (2005)
[16] Fayou Yu, Ping Li, Hao Shen, Sanjay Mathur, Claus-Michael Lehr, Udo Bakowsky, Frank Mucklich,” Laser interference lithography as a new and efficient technique for micropatterning of biopolymer surface”, Biomaterials 26,2307-2312 (2005)
[17]P Gregory Engleman; Anil Kurella; Anoop Samant; Craig A Blue; Narendra B Dahotre,” The Application of Laser-Induced Multi-Scale Surface Texturing”, Jom 57,46-50(2005)
[18]T. A. Savas, M. L. Schattenburg, J. M. Carter, and Henry I. Smith, “Large-area
achromatic interferometric lithography for 100 nm period gratings and grids”, J. Vac. Sci. Technol. B 14, 4167(1996).
[19]Xiaolan Chen and S. R. J. Brueck, “Imaging interferometric lithography: A wavelength division multiplex approach to extending optical lithography”, J. Vac. Sci. Technol. B 16, 3392(1999).
[20] Xiaolan Chen and S. R. J. Brueck, “Imaging interferometric lithography : approaching the solution limits of optics”, Optics Letters, 24, 124(1999).
[21]Juan Ferrera, M. L. Schattenburg, and Henry I. Smith, “Analysis of distortion in
interferometric lithography”, J. Vac. Sci. Technol. B 14, 4009(1996).
[22] Paul T. Konkola, Carl G. Chan, Ralf K. Heilmann, and M. L. Schattenburg, “Beam steering system and spatial filtering applied to interference lithography”, J. Vac. Sci. Technol. B 18, 3282(2000).
[23]M. L. Schattenburg, C. G. Chan, R. K. Heilmann, P. T. Konkola, and G. S. Pati, “Progress towards a general grating patterning technology using phase-locked scanning beams”, Proceedings of the SPIE, 4485, 4485-4461(2001).
[24] Ralf K. Heilmann, Paul T. Konkola, Carl G. Chan, G. S. Pati, and Mark L. Schattenburg, “Digital heterodyne interference fringe control system”, J. Vac. Sci. Technol. B 19, 2342(2001).
[25]H.H. Solak , C. David , J. Gobrecht , L. Wang , F. Cerrina,” Four-wave EUV interference lithography”, Microelectronic Engineering 61–62, 77–82 (2002)
[26]H. H. Solak,C. David, and J. Gobrecht, L. Wang and F. Cerrina,” Multiple-beam interference lithography with electron beam written gratings”, J. Vac. Sci. Technol. B 20,6 (2002)
[27]H.H. Solak , C. David , J. Gobrecht , V. Golovkina , F. Cerrina , S.O. Kim , P.F. Nealey,” Sub-50 nm period patterns with EUV interference lithography”, Microelectronic Engineering 67–68, 56–62 (2003)
[28]Harun H. Solak and Christian David,” Patterning of circular structure arrays with interference lithography”, J. Vac. Sci. Technol. B 21,6( 2003)
[29]V. N. Golovkina, P. F. Nealey,F. Cerrina, and J. W. Taylor, H. H. Solak, C. David, and J. Gobrecht,” Exploring the ultimate resolution of positive-tone chemically amplified resists: 26 nm dense lines using extreme ultraviolet interference lithography”, J. Vac. Sci. Technol. B 22,99-103(2004)
[30]Harun H. Solak,” Space-invariant multiple-beam achromatic EUV interference lithography”, Microelectronic Engineering 78–79, 410–416 (2005)
[31]M. L. Schattenburg, C. Chan, P. N. Everett, J. Ferrera, P. Konkola, and Henry I.
Smith, “Sub-100 nm metrology sing interferometrically produced fiducials”, J. Vac. Sci. Technol. B 17, 2692(1999).
[32] Carl G. Chan, Paul T. Konkola, Ralf K. Heilmann, G. S. Pati, and Mark L.
Schattenburg, “Image metrology and system controls for scanning beam interference lithography”, J. Vac. Sci. Technol. B 19, 2335 (2001).
[33]Carl G. Chen,Ralf K. Heilmann, Chulmin Joo, Paul T. Konkola, G. S. Pati, and Mark L. Schattenburg,” Beam alignment for scanning beam interference lithography”, J. Vac. Sci. Technol. B 20,6( 2002)
[34]G. S. Pati, R. K. Heilmann, P. T. Konkola, C. Joo, C. G. Chan, E. Murphy, and M. L. Schattenburg, “Generalized scanning beam interference lithography system for patterning gratings with variable period progressions”, J. Vac. Sci. Technol. B 20, 2617(2002).
[35]G. S. Pati,R. K. Heilmann, P. T. Konkola, C. Joo, C. G. Chen, E. Murphy, and M. L. Schattenburg,” Generalized scanning beam interference lithography system for patterning gratings with variable period progressions”, J. Vac. Sci. Technol. B 20,6(2002)
[36]Ralf K Heilmann1, CarlGChen, Paul TKonkola and Mark L Schattenburg,” Dimensional metrology for nanometre-scale science and engineering: towards sub-nanometre accurate encoders”, Nanotechnology 15, S504–S511 (2004)
[37]M. C. Hutley, “Coherent Photofabrication”, Opt. Eng. 15, 190 (1976).
[38]Willie W. NG, Chi-Shain Hong, Amnon Yariv, “Holographic Interference Lithography for Integrated Optics”, IEEE Trans. On Electron. Device. 25, 1193 (1978).
[39] J. A. Hoffnagle, W. D. HinSberg, M. Sanchez, and F. A. Houle, “Liquid immersion deep-ultraviolet interferometric lithography”, Proc. SPIE 138,3678 (1999).
[40]H. H. Solak, D. He, W. Li, S. Singh-Gasson, B. H. Sohn, X. M. Yang, and P. Nealey, “Exposure of 38 nm period grating patterns with extreme ultraviolet interferometric lithography”, Appl. Phys. Lett. 75, 2328(1999).
[41] H. H. Solak, D. He, W. Li, and F. Cerrina, “Nanolithography using extreme ultraviolet lithography interferometry : 19 nm lines and spaces”, J. Vac. Sci. Technol. B 17, 3052(1999).
[42]Saleem H. Zaidi and Steven R. J. Brueck, “High aspect-ratio holographic photoresist gratings”, Optical Society of America 27,2999 (1988)
[43] J. P. Spallas, A. M. Hawryluk, and D. R. Kania,”Field emitter array mask patterning using laser interference lithography”, J. Vac. Sci. Technol. B 13,5 (1995)
[44]Xiaolan Chen,Saleem H.Zaidi,and S.R.J.Brueck,“Interferometric lithography of sub-micrometer sparse hole arrays for field-emission display applications”, J. Vac. Sci. Technol. B 14,5(1996)
[45]L Mikulskas,J. Mickevicius,J. Vaitkus,R. Tomasiunas,V. Grigaliunas,V.Kopustinskas,S. Meskinis, ”Fabrication of photonic structures by means of interference lithography and reactive ion etching”, Applied Surface Science 186,599-603(2002)
[46]S.Pau, G. P. Watson and O. Nalamasu, “Writing an arbitrary non-periodic pattern
using interference lithography”, Journal of modern optics 48, 1211 (2001).
[47] Thomas E. Murphy, “Design, Fabrication and Measurement of Integrated Bragg
Grating Optical Filters”, Ph.D. Thesis, Massachusetts Institute of Technology (2001)
[48] Chan TYM, Toader O and John S, “Photonic band gap templating using optical
interference lithography”, Physical Review E 71, 4 (2005)
[49]Yang S, “Creating 3D microstructures by interference lithography: From 3D photonic crystals to biomimetic microlens arrays”, Abstracts of papers of the american chemical society 228 , U433-U433 ( 2004)
[50] Prodan L, Euser TG, van Wolferen HAGM, Bostan C, de Ridder RM, Beigang R, Boller KJ and Kuipers L, “Large-area two-dimensional silicon photonic crystals for infrared light fabricated with laser interference lithography” ,Nanotechnology 15 , 639(2004)
[51] C. O. Bozler, C. T. Harris, S. Rabe, D. D. Rathman, M. A. Hollis, and Henry I. Smith, “Arrays of gated field-emitter cones having 0.32 µm tip-to-tip spacing”, J. Vac. Sci. Technol. B 12, 629(1994)
[52]R. M. H. New, R. F. W. Pease,and R. L. White, “Submicron patterning of thin cobalt films for magnetic storage”, J. Vac. Sci. Technol. B 12, 3196(1994)
[53] S.Y. Chou, M. Wei, P. R. Krauss, and P. B. Fischer, “Study of nanoscale magnetic structures fabricated using electron-beam lithography and quantum magnetic disk”, J. Vac. Sci. Technol. B 12, 3695(1994)
[54] P. R. Krauss, and P. B. Fischer, and S.Y. Chou, “Fabrication of single-domain
magnetic pillar array of 35 nm diameter and 65 Gbits/in.2 density”, J. Vac. Sci. Technol. B 12, 3639(1994)
[55]S. R. J. BRUECK, FELLOW,” Optical and Interferometric Lithography—
Nanotechnology Enablers”, Proceedings Of The IEEE 93, 1704-1721 (2005)
[56]L Prodan, T G Euser, H AGMvan Wolferen, C Bostan,R M de Ridder, R Beigang, K-J Boller1 and L Kuipers,” Large-area two-dimensional silicon photonic crystals for infrared light fabricated with laser interference lithography”, Nanotechnology 15 ,639-642(2004)
[57]Frank J. van Soest, Henk A.G.M. van Wolferen, Hugo J.W.M. Hoekstra, Ren´e M. de Ridder, Kerstin W¨orhoff and Paul V. Lambeck,” Laser interference lithography with highly accurate interferometric alignment”, Proceedings Symposium IEEE 44,6568-6570(2003)
[58] M. Zheng, M. Yu, Y. Liu, R. Skomski, S. H. Liou, and D. J. Sellmyer, V. N. Petryakov, Yu. K. Verevkin, N. I. Polushkin, and N.N. Salashchenko, “Magnetic nanodot arrays produced by direct laser interference lithography”, Appl. Phys. Lett. 79, 2606(2001)
[59] C. W. Chien, J. C. Chen and J. Y. Lee, “Applying a Modified Interferometric Exposure Model to Analyze the Influences of Process Parameters on the Line Width”, submitted to Applied Optics
[60]李正中,”干涉光學Optical Interference and Interferometry”
[61] 丁勝懋,” 光電工程”,中國電機出版社(1996)
[62] W.M.Moreau, ”Semiconductor lithography; Plenum Press”(1988)
[63] Ngoc Diep Lai, Wen Ping Liang, Jian Hung Lin, Chia Chen Hsu, and Cheng Hsiung Lin,” Fabrication of two- and three-dimensional periodic structures by multi-exposure of twobeam interference technique”, OPTICS EXPRESS, 13, 23
[64]吳宜寧,”干涉微影之曝光與顯影參數對週期性結構外型之影響”國立中央大學機械系碩士論文(2005)
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6. 林瑞雯,〈國會調查權之探討〉,《立法院院聞》,臺北:立法院,第
7. 徐正戎,〈法國之國會調查權〉,《臺灣本土法學雜誌》,臺北:學林,
8. 梁杏絹,〈國會調查權初探〉,《華醫學報》,臺南:中華醫事學院,第
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10. 許志雄,〈國會調查權〉,《月旦法學雜誌》臺北:元照,第19期,1996,頁51-52。
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