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研究生:陳建龍
研究生(外文):CHEN,JIAN-LONG
論文名稱:晶圓倉應用條碼於流程工作效率與工作滿意之效益-以半導體封測廠A公司為例
論文名稱(外文):Effects of Application of Barcodes in Wafer Warehouse Process on Work Efficiency and Job Satisfaction-A Case Study of a Semiconductor Packaging and Testing Company A
指導教授:王明郎王明郎引用關係
指導教授(外文):Ming-Lang Wang
口試委員:王明郎
口試日期:2016-01-28
學位類別:碩士
校院名稱:中華大學
系所名稱:工業管理學系
學門:商業及管理學門
學類:其他商業及管理學類
論文種類:學術論文
論文出版年:2016
畢業學年度:104
語文別:中文
論文頁數:67
中文關鍵詞:半導體封測、效益分析、資料收集器、條碼、工作效率
外文關鍵詞:Semiconductor Packaging and Testing、Benefit Analysis、Personal Digital Assistant、Barcode, Work Efficiency
相關次數:
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  • 下載下載:29
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半導體產業伴隨著市場變化相較於其他產業來的競爭激烈而封測廠亦是如此。
在完整的半導體供應鏈中封測廠是其中一個區塊,然而一間中小型的封測企業若需具備競爭力是不可能只服務於某單一客戶。晶圓倉(warehouse)是收放所有客戶來料待進行封裝之晶圓的一個站點,在面對如此多家客戶相繼將WAFER送至A公司晶圓倉因此如何有效的管理是一大學問,在生產時間有限的情況下若晶圓倉在晶圓存貨作業中有任何一點缺失將造成整個生產線作業時間的延遲。
本研究是以晶圓倉在收貨系統不甚完善的情況下導入條碼系統後所產生的效益以及對企業內部其它部門的連鎖效應為主。回顧國、內外文獻中有發現研究有關半導體封測在管理的文獻很多,但是在整體運用條碼(barcode)改善物流收貨作業上的文獻卻甚少,因此本研究乃以一半導體封測廠的晶圓倉為例,探討運用條碼與資料收集器於晶圓倉之收料流程中的效益分析。
本研究以個案A公司在導入條碼系統後經由與相關人員進行專家訪談後,找出改善的關鍵因素並且設計問卷對相關人員進行問卷調查,問卷資料分析個案A公司在導入條碼系統後對整體晶圓倉員工的工作效率與工作滿意是否有明顯改善,並且分析是否可藉此以提升生管部門的整體效益。經由敘述性統計受訪人員的基本資料、運用信度分析以Cronbach’s α 係數以大於0.7為基準來檢定條碼系統與晶圓倉之作業各構面的內部一致性。因素分析方法步驟如下:1.KMO值為0.7以上為最佳。2.因素分析中的主成份分析來萃取共同因素,依據特徵值大過1作為選取共同因素個數的原則
。3.選取因素負荷量為大於0.45的因素進行構面重新命名。經由兩大構面提出的五項假設進行單因子變異數進行驗證,數據分析結果為條碼系統在取貨時間減少程度
、庫位準確度、資料透明度與工作滿意度以及工作成就感五構面上皆為<α=0.05具有顯著性,故期許本研究能為未來欲導入條碼系統之產業提供一分相關實用的資料與參考。

As the market change, the semiconductor industry has fiercer competition than other industries. Additionally, the IC packing and testing plants confront the same status. Packing and testing are one portion of the integrity of semiconductor supply chain and as sub-area in the factory. However, it is impossible for small and medium size seals only to serve one customer and still possess the competitive advantage. Nevertheless, the WAFER of a seal stand is the wafer warehouse that deposits in and sends away all customers. However, as more and more clients deliver WAFER to the A Corporation, how to effective management is a major issue. Under the situation of limited production time, if there is any missing on wafer warehouse in WAFER inventory that will create the detention of the entire production line operation.

This study is presenting a department unit after to receive goods in the system not really perfect situation to induct the benefit as well as to the enterprise interior other departments chain-like effect which the bar code system produces primarily. In the review country, inside and outside literature has the discovery research related semiconductor to seal measured are very many in the management literature, but receives goods in the work literature in the whole using the bar code improvement really to be actually few, therefore this research is seals by a semiconductor measured the factory the wafer warehouse is an example, discusses receives in the material flow using barcode and the material collector in the wafer warehouse the result analysis.

The study by way of discovering the key aspect with the case company personnel interview to design the questionnaire to carry on the analysis, by is connected the worker to work satisfaction as well as the whole working efficiency carries on by way of the narrative statistics the data the factor analysis. Reliability analysis: above a baseline of 0.7, a greater value of Cronbach’s α.The internal consistence between the barcode system and the constructs of wafer warehouse operations is tested with Cronbach’s α.The factor analysis in this study involves the following steps:1.KMO value above 0.7 considered optimal.2.Principal component analysis of the factor analysis that followed the KMO analysis is used to extract common factors by the criteria of eigenvalue greater than 1 for the number of factors to be chosen.3.Select the factors with factor loading greater than 0.45 as constructs and rename them. The extract primary factor five suppositions which proposed by way of two big construction surface carries on the confirmation, analysis results for the bar code system in pick up time is reduced, location accuracy, data transparency and job satisfaction and work achievement are all five surface structure <α = 0.05 significant hoped this research will be able to want for the future to induct industry of the bar code system to provide one is divided the correlation practical material and the reference.

摘要 i
Abstract ii
謝辭 iv
目錄 v
表目錄 vii
圖目錄 viii
第一章 緒論 1
第一節 研究背景及動機 1
第二節 研究目的與流程: 1
第二章 文獻探討 3
第一節 半導體封測產業的特性 3
第二節 條碼的定義與應用 4
第三節 條碼的效益與特性 8
第四節 工作效率與工作滿意 10
第五節 問卷調查 14
第三章 研究方法 22
第一節 研究對象 22
第二節 研究方法與架構 27
第三節 問卷設計與發放對象 27
第四節 因素分析 28
第五節 單因子變異數分析 29
第四章 資料分析 32
第一節 問卷信度分析 32
第二節 敘述性統計 34
第三節 因素分析 35
第四節 對萃取之主成分進行分析 41
第五節 單因子變異數分析結果 44
第六節 結果 47
第五章 結論與建議 48
參考文獻 50
附錄A 56

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