|
[1]A. Y. C. Yu, “Electron tunneling and contact resistance of metal-silicon contact barriers,” Solid State Electron. 13 (1970) 239. [2]C. Y. Chang, Y. K. Fang, and S. M. Sze, “Specific contact resistance of metal-semiconductor barriers,” Solid State Electron. 14 (1971) 541. [3]S. M. Sze, Physics of Semiconductor Devices (Wiley, New York) (1981) 245. [4]F. A. Padovani and R. Stratton, “Field and thermionic-field emission in Schottky barriers,” Solid State Electron. 9 (1966) 695. [5]C. R. Crowell and V. L. Rideout, “Normalized thermionic-field (TF) emission in metal-semiconductor (Schottky) barriers,” Solid State Electron. 12 (1969) 89. [6]R. Stratton and F. A. Padovani, “Differential resistance peaks of Schottky barrier diodes,” Solid State Electron. 10 (1967) 813. [7]G. S. Marlow, and M. B. Das, “The effects of contact size and non-zero metal resistance on the determination of specific contact resistance,” Solid State Electron. 25 (1982) 91. [8]V. Y. Niskov and G. A. Kubetskii, “Characteristics of AuGeNi ohmic contacts to GaAs,” Sov. Phys. Semicond. 4 (1971) 1553. [9]W. G. Bickley, Bessel Functions, University Press, Cambridge (1960) 220-225. [10]J. J. Wierer, D. A. Steigerwald, M. R. Krames, J. J. O’Shea, M. J. Ludowise,G.Christenson, Y.C. Shen, C. Lowery, P. S. Martin, S. Subramanya, W. Götz,N. F. Gardner, R. S. Kern, and S. A. Stockmam, “High-power AlGaInN flip-chip light-emitting diodes,” Appl. Phys. Lett.78 (2001) 3379. [11]J.O. Song, J.S. Ha, and T.Y. Seong, “Ohmic-contact technology for GaN-based light-emitting diodes: role of P-type contact,” IEEE Trans. Electron Devices 57 (2010) 42. [12]Hidenori Ishikawa, Setsuko Kobayashi, Y. Koide, S. Yamasaki, S.Nagai, J. Umezaki, M. Koike, Masanori Murakami, “Effects of surface treatments and metal work functions on electrical properties at p-GaN/metal interfaces,” J. Appl. Phys. 81 (1996) 1315. [13]J. K. Kim, J. L. Lee, J. W. Lee, H. E. Shin, Y. J. Park, and T. Kim, “Low resistance Pd/Au ohmic contacts to p-type GaN using surface treatment,” Appl. Phys. Lett. 73 (1998) 2953. [14]J. Sun, K. A. Rickert, J. M. Redwing, A. B. Ellis, F. J. Himpsel, andT. F. Kuech, “p-GaN surface treatments for metal contacts,” Appl. Phys. Lett. 76 (2000) 415. [15]H. Ishikawa, S. Kobaya,Y. Koide, S. Yamasaki, S. Nagai, J. Umezaki, M. Koike, and M. Murakami, “Effects of surface treatments and metal work functions on electrical properties at p-GaN/metal interfaces,” J. Appl. Phys. 81 (1997) 1315. [16]Y. Ohba and A. Hatano, “H-atom incorporation in Mg-doped GaN grown by metalorganic chemical vapor deposition,” Jpn. J. Appl. Phys. 33 (1994) L1367. [17]Shuji Nakamura, Naruhito Ieasa, Masayuki Senoh and Takashi Mukai, “Hole compensation mechanism of p-type GaN films,” Jpn. J. Appl. Phys, 31 (1992) 1258. [18]Hiroshi Amano, Masahiro Kito, Kazumasa Hiramatsu, Isamu Akasaki, “P-type conduction in Mg-doped GaN treated with low-energy electron beam irradiation (LEEBI) ,” Jpn. J. Appl. Phys, 28 (1989) L2112. [19]Shuji Nakamura, Takashi Mukai, Masayuki Senoh, Naruhito Iwasa, “Thermal annealing effects on p-type Mg-doped GaN films,” Jpn. J. Appl. Phys, 31 (1992) 139. [20]Yow-Jon Lin, “Activation mechanism of annealed Mg-doped GaN in air,” Appl. Phys. Lett, 84 (2004) 2760. [21]李正中,薄膜光學與鍍膜技術,藝軒圖書出版社,2002年,144頁。 [22]J. O. Song, J. S. Kwak, Y. Park, and T. Y. Seong, “Ohmic and degradation mechanisms of Ag contacts on p-type GaN,” Appl. Phys. Lett.86 (2005) 062104. [23]S. K. Sharma, “Hillock formation,hole growth and agglomeration in thin silver films,” J. Spitz, Thin Solid Films. 65 (1980) 348. [24]J. Y. Kim, S. I. Na, G. Y. Ha, M. K. Kwon, I. K. Park, J. H. Lim, and S. J. Park, “Thermally stable and highly reflective AgAl alloy for enhancing light extraction efficiency in GaN light-emitting diodes,” Appl. Phys. Lett. 88 (2006) 043507. [25]H. G. Hong, J. O. Song, T. Lee, I. T. Ferguson, J. S. Kwak, and T. Y. Seong, “Improvement of the reverse leakage behavior of Ag-based ohmic contacts for GaN-based light-emitting diodes using MgZnO interlayer,” Mater. Sci. Eng. B. 129 (2006) 176. [26]D. S. Zhao, S. M. Zhang, L. H. Duan, Y. T. Wang, D. S. Jiang, W. B. Liu, B. S. Zhang, and H. Yang, “Effects of Ag on electrical properties of Ag/Ni/p-GaN ohmic contact,” Phys. Lett. 24 (2007) 1741. [27]H. W. Jang and J. L. Lee, “Mechanism for ohmic contact formation of Ni/Ag contacts on p-type GaN,” Appl. Phys. Lett. 85 (2004) 5920. [28]J. Cho, H. Kim, Y. Park, and E. Yoon, “Effects of p-electrode reflectivity on extraction efficiency of nitride-based light-emitting diodes,” Appl. Phys. Expr. 1 (2008) 052001. [29]H. W. Jang and J. L. Lee, “Low-resistance and high-reflectance Ni/Ag/Ru/Ni/Au ohmic contact on p-type GaN,” Appl. Phys. Lett. 85 (2004) 4421. [30]L. C. Chen and Y. M. Ho, “Ag and zinc oxide-doped indium oxide ohmic contacts to p-type GaN for flip-chip LED applications,” J. Phys. D: Appl. Phys. 40 (2007) 6514. [31]W. K. Hong, J. O. Song, H. G. Hong, K. Y. Ban, T. Lee, J. S. Kwak, Y. Park, and T. Y. Seong, “Highly reflective and low resistance indium tin oxide/Ag ohmic contacts to p-type GaN for flip-chip light emitting diodes,” Electrochemical and Solid-State Lett. 8 (11) (2005) G320. [32]J. O. Song, J. S. Kwak, and T. Y. Seong, “Cu-doped indium oxide/Ag ohmic contacts for high-power flip-chip light-emitting diodes,” Appl. Phys. Lett. 86 (2005) 062103. [33]J. Y. Kim, S. I. Na, G. Y. Ha, M. K. Kwon, I. K. Park, J. H. Lim, and S. J. Park, “Thermally stable and highly reflective AgAl alloy for enhancing light extraction efficiency in GaN light-emitting diodes,” Appl. Phys. Lett. 88 (2006) 043507. [34]J. H. Son, G. H. Jung, and J. L. Lee, “Enhancement of light reflectance and thermal stability in Ag–Cu alloy contacts on p-type GaN,” Appl. Phys. Lett. 93 (2008) 012102. [35]H. Kim, K. H. Baik, J. Cho, J. W. Lee, S. Yoon, H Kim, S. N Lee, C. Sone, Y. Park, and T. Y. Seong, “High-reflectance and thermally stable AgCu alloy p-type reflectors for GaN-based light-emitting diodes,” IEEE Phot. Tech. Lett.19 (2007) 336. [36]J. H. Son, G. H. Jung, and J. L. Lee, “Highly reflective Ag-Cu alloy-based ohmic contact on p-type GaN using Ru overlayer,” Opt. Lett. 33 (2008) 2907. [37]R. Kawai, T. Mori, W. Ochiai, A. Suzuki, M Iwaya, H. Amano, S. Kamiyama, and I. Akasaki, “High‐reflectivity Ag‐based p‐type ohmic contacts for blue light‐emitting diodes,” Phys. Status Solidi C 6 (S2) (2009) S830. [38]Y. H. Song, J. H. Son, G. H. Jung, and J. L. Lee, “Effects of Mg additive on inhibition of Ag agglomeration in Ag-based ohmic contacts on p-GaN,” Electrochm. Solid-State Lett. 13 (2010) H173. [39]G. H. Jung, J. H. Son, Y. H. Song, and J. L. Lee, “Strain induced suppression of silver agglomeration of indium-containing silver contact,” Appl. Phys. Lett.96 (2010) 201904. [40]B. Y. Cheng, I. C. Chen, C. H. Kuo, and L. C. Chang, “Highly Reflective Ag∕ La Bilayer Ohmic Contacts to p-Type GaN,” ECS Transactions, 44 (2012) 1285. [41]楊承叡,國立清華大學材料與工程學系碩士學位論文, (2009)。 [42]時聖立,國立清華大學材料與工程學系碩士學位論文, (2014)。 [43]I. Karakaya, and W.T. Thompson, “The Ag-Sn (silver-tin) system,” Bul. Alloy Phase Diagrams 8 (4) (1987) 341. [44]P. R. Subramanian, and J. H. Perepezko, “The Ag-Cu (silver-copper) system,” J. Phase Equilibria 14 (1) (1993) 63. [45]S. M. Sze, Semiconductor devices, physics and technology (Wiley ; Bell Telephone Lab, New York) (1985) p.37
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