臺灣博碩士論文加值系統

本研究成功開發出一套機能型衣物標籤的光學檢測系統。此系統硬體包含馬達驅動的運輸平台，以馬達帶動滾筒達到傳輸標籤之用途，並搭配影像擷取模組，同時探討光源對檢測影響，進而選擇所需的光源。檢測程式根據標籤被判定為瑕疵的原因進行撰寫，其中包括變形、缺陷、劃線記號等。對於變形與缺陷標籤，系統使用參考相減法進行檢測，以人眼判斷合格的標籤作為標準片，將測得的待測標籤中心點與標準片中心重疊後，兩者影像相減，並將影像區分成前端、尾端、全部檢測，從剩餘像素值進行判斷，若標籤變形嚴重，中心點位置會相差甚遠，剩餘像素值則會愈大，若超出各區域的判斷閥值時，便能有效地判定瑕疵。劃線記號的瑕疵標籤在白光照射下，不易顯現劃線部位，故嘗試使用不同色光進行照射，其中以藍色光最為適當，然而在標籤尖端處微小的劃線部位仍然不易顯示，故在區域部位撰寫不同影像處理演算法進行檢測。實作中使用包含正常與瑕疵且經過品管人員確認的樣本測試，以評估開發出的檢測系統之檢測能力。

This study successfully developed an optical detection system for functional clothing labels. The system hardware includes a motor-driven transport platform with an image capture module. Also explore the impact of the light source on the detection, and then select the desired light source. The software is written based on the reason the label is judged to be defective, including deformation, defects, and underline marks. For deformation and defect labels, the system uses the reference subtraction method for detection. A label that is judged to be qualified by the human eye as a standard film. Then, overlapping and subtracting the standard label and the label to be tested. Divide the image into front end, tail end, and all detections, and judge from the remaining pixel values. If the label is severely deformed, the position of the center point will be far apart, and the remaining pixel values will be larger. When the judgment threshold of each area is exceeded, the defect can be effectively determined. The label of the underline mark is not easily visible under the illumination of white light. Therefore, it is attempted to use different color lights for illumination, and the experimental results are most appropriate for blue light. However, the small underline mark at the tip of the label is still difficult to display, so different image processing algorithms are written for detection in the area. Finally, samples including normal and defected parts have been tested to verify the capability of the inspection system developed.

摘要 I
Abstract II
誌謝 III
目錄 IV
圖索引 VI
表索引 IX
第一章 緒論 1
1.1研究背景與動機 1
1.2研究目的 2
1.3文獻回顧 3
1.4研究方法 6
1.5論文架構 7
第二章 標籤與系統硬體架構 9
2.1製程概述 9
2.2衣物標籤之瑕疵 10
2.3系統硬體架構 12
2.3.1視覺模組 12
2.3.2機構模組 18
2.3.3電控模組 21
2.3.4軟體模組 24
第三章 影像處理與研究方法 25
3.1空間域影像處理 25
3.1.1邊緣偵測 26
3.1.2濾波器 28
3.1.3影像二值化 31
3.1.4影像強化 32
3.1.5影像遮罩(Image Mask) 34
3.1.6影像迴積(Convolution) 35
3.2頻率域影像處理 36
3.3研究方法與流程 38
3.3.1劃線記號檢測 38
3.3.2參考相減法瑕疵檢測 39
3.3.4定位方式 41
3.3.4程式處理流程 42
第四章 實驗結果 44
4.1劃線記號檢測結果 44
4.2變形瑕疵檢測結果 48
第五章 結論與未來展望 55
5.1 機構改良 55
5.2 執行速度 56
5.3 ROI設置範圍 56
5.4 不同種類標籤檢測 57
參考文獻 58
附件一 61
附件二 62
附件三 63
附件四 65
附件五 68
附件六 70

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