1.簡禎富,資料探勘與大數據分析,2017。
2.彭新傑,利用資料挖礦找出影響產品品質之關鍵因素:以LED封裝為例,碩士論文,國立清華大學工業工程與工程管理學系碩士在職專班,2016。3.廖勝全,PCBA製程不良數據探勘以建構智慧決策規則,碩士論文,國立臺北科技大學工業工程與管理研究所,2015。4.徐仙陽,應用支援向量機建構半導體黃光升溫製程之FDC系統,碩士論文,國立清華大學工業工程與工程管理研究所,2011。5.王宣傑,應用資料採礦於台灣中小尺寸面板廠品質異常原因分析模式,碩士論文,東海大學工業工程與經營資訊研究所,2009。6.郭信宏,應用資料探勘技術於面板檢測實證研究,碩士論文,國立中央大學工業管理研究所,2008。7.Dietterich,T.G.(2000).“Ensemble methods in machine learning”,Proceedings of the First International Workshop on Multiple Classifier Systems (MCS00),pp. 1-15.
8.Breiman L. (2001a). Random Forests, Machine Learning, 45, 5-32
9.Japkowicz, N. and Stephen, S. (2002) The class imbalance problem: A
systematic study. Intelligent Data Analysis, pp. 4-21.
10.Gary M. Weiss.(2004,November).C5.0: An Informal Tutorial,http://storm.cis.fordham.edu/~gweiss/dmrg/c5-tutorial.html
11.Lunardon.N, Menardi.G, Torelli.N,ROSE: A Package for Binary Imbalanced Learning.N - The R Journal Vol. 6/1, June 2014.
12.Fayyad,U.M.,“ Data mining and knowledge discovery: making sense out of data”, IEEE Expert, Vol. 11 , no. 5 , 1996(a), pp.20 – 25
13.Kusiak, A.and Kurasek, C., “Data mining ofprinted-circuit board defects”, Robotics and Automation, IEEE Transactions on, Vol. 17(2), 2001,pp.191 – 196.
14.Tsuda H., Shiri H., Takagi O. and Take R.,“Yield analysis and improvement by reducing manufacturing fluctuation noise” ISSM 2000 proceeding,pp. 249-251.
15.Berry, M., and Linoff, G., Data Mining Techniques for Marketing, Sales and Customer Support, John Wiley and Sons, New York, 1997.
16.Cabena, P., Hadjinian P., Stadler R., Verhess J., and Zanasi A., Discovering Data Mining From Concept to Implementation, Prentice Hall PTR, Upper Saddle River, New Jersey, 1997.
17.Thuraisingham, B., “A primer for understanding and applying data mining”, IT Professional, Vol. 2(1), 2000, pp. 28–31.
18.Feelders, A., Daniels, H. and Holsheimer, M., “Methodological and practical aspec of data mining”, Information and Management, vol. 37(5),2000,pp. 271-281.