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研究生:徐喬威
研究生(外文):Chiao-Wei Hsu
論文名稱:橫電極化光波入射非對稱「金屬-介電質」多層結構之共振耦合研究
論文名稱(外文):Resonant Coupling of TE Wave Incidence to Asymmetric Metal-Dielectric Multilayered Structures at Optical Frequencies
指導教授:張殷榮張殷榮引用關係
指導教授(外文):Yin-Jung Chang
學位類別:碩士
校院名稱:國立中央大學
系所名稱:光電科學與工程學系
學門:工程學門
學類:電資工程學類
論文種類:學術論文
論文出版年:2013
畢業學年度:101
語文別:中文
論文頁數:54
中文關鍵詞:「金屬-介電質」多層結構橫電極化波耦合共振
外文關鍵詞:metal-dielectric multilayered structurestransverse electric waveresonant coupling
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本研究係以傳輸線理論計算與以有限時域差分法(finite-difference-time-domain method)為基礎之數值模擬,針對橫電(transverse electric, TE)極化波於光頻率範圍內入射二維「金屬-介電質」多層結構進行探討。兩者之計算結果均顯示於特定條件下具有極低反射之現象。其成因為電磁波會於高折射率材料內部形成導波模態。由導波理論可知電磁波於導波層兩介面間所累積之總相位變化,決定其是否於導波層內形成導波模態。因所累積之相位受到導波層厚度與折射率之影響,故反射率會隨著導波層厚度及折射率呈現週期性變化。除此之外,在相同結構下,入射波長越大則等效折射率越低,故形成導波模態之入射角度亦越小。此外,金屬厚度除了對TE波之反射率造成影響,亦影響反射率之角度頻譜中之半高全寬角度。金屬厚度越厚時,產生導波模態之入射角越小,且角度頻譜之半高全寬角度亦較小;反之,金屬厚度較薄時,產生導波模態所需之入射角則較接近 ,而其半高全寬角度會較大。但金屬厚度亦有其限制,若金屬厚度大於60 nm將使得電磁波無法進入導波層內部,自然亦無法形成導波模態。
This thesis employs the transmission line theory and a commercial software package based on Finite-Difference-Time-Domain method to investigate the transverse electric (TE) wave incidence upon two-dimensional planar metal-dielectric multilayered structures at optical frequencies. Results from both approaches show that a minimum reflectance could occur due to the resonant coupling between the incident electromagnetic wave and a guided mode in the high-index layer. From the guided-wave theory, since the phase accumulated by the wave at two boundaries in the guiding layer determines the guidance condition, the resonant coupling is largely affected by the thickness and refractive index of the high-index layer. It changes with the thickness and refractive index of the high-index layer periodically. In addition, under the same structure, since the effective index becomes smaller when the operating wavelength is increased, a smaller incident angle is required to excite the guided mode. On the other hand, metal thickness also affects the full-width-at-half-maximum (FWHM) angle of the reflectance. If the metal thickness becomes thicker, the incident angle required for the resonant coupling gets closer to the critical angle and the FWHM angle is smaller. On the contrary, the required incident angle is closer to when the thickness of the metal is decreased and the corresponding FWHM angle increases. Nevertheless, when the thickness of the metal is large than 60 nm, the TE resonant coupling vanishes.
中文摘要 i
Abstract ii
謝誌 iii
目錄 iv
圖目錄 vi
表目錄 ix
第一章 緒論 1
1.1 前言 1
1.2 文獻回顧 2
1.3 研究動機與結構介紹 6
第二章 分析方法 8
2.1 傳輸線方程式 9
2.2 具負載端之傳輸線 12
2.3 TE 波與TM 波於波導內之阻抗 15
2.4 傳輸線網路應用於多層結構 18
第三章 以數值模擬為基礎之反射率計算-以單一介面為例 21
3.1 數值模擬之平面波 21
3.2 雙層介電質結構之驗證 22
3.3 介電質與具吸收材料結構之驗證 30
第四章 結果與討論 35
4.1 理論計算與數值模擬之結果比較 35
4.2 入射波長對反射率之影響 44
4.3 導波層材料對TE 波反射率之影響 47
4.4 金屬材料對反射率之影響 48
第五章 結論 52
參考文獻 53
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