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研究生:鄭昇益
研究生(外文):Sheng-Yih Jeng
論文名稱:數位及類比電路之周邊掃瞄及自我測試之合成系統
論文名稱(外文):Automatic synthesis of boundary scan and BIST architectures for digital and analog circuits
指導教授:李昆忠李昆忠引用關係
指導教授(外文):Kuen-Jong Lee
學位類別:碩士
校院名稱:國立成功大學
系所名稱:電機工程研究所
學門:工程學門
學類:電資工程學類
論文種類:學術論文
論文出版年:1994
畢業學年度:82
語文別:英文
論文頁數:100
中文關鍵詞:易測試設計技巧週邊掃瞄自我測試
外文關鍵詞:DFTBoundary ScanBISTVHDL
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由於數位積體電路密度的快速增加,邏輯電路數目變得越來越多,使得電
路不易測試.所以有許多數位電路的易測試電路設計技巧相繼發展出來,
經由增加取得電路內部狀態的數目,以降低測試的困難度.在眾多的易測
試設計技巧中,週邊掃瞄及自我測試是兩種很受歡迎的方法.而隨著數位
及類比電路的整合在同一個電路中,使得混合模式電路的測試甚至比數位
電路還要困難.此問題的解決方法可仿效數位電路,發展一些類比電路的
易測試設計技巧.故在本文中,經由採用類似數位式週邊掃瞄的觀念,提
出了兩種類比式週邊掃瞄的架構.此外本文中亦發展出一套系統,用以自
動合成週邊掃瞄及自我測試之測試電路.此系統包含了週邊掃瞄和自我
測 試兩個子系統.根據數位式週邊掃瞄的標準及本文所提出的類比式週
邊掃瞄的架構,在週邊掃瞄子系統中可處理數位及混合模式電路.自我測
試的原則是在電路中加入測試用之電路使得測試向量之產生與測試結果之
驗證可在電路內完成.所以在自我測試自動合成子系統中,此類外加電路
可提供給類比及數位電路使用.

Due to the rapid increase in the density of digital integrated
circuit, the number of logic within a single chip has become
extremely high. This makes the chips hard to test since there
is little access to the internal circuit elements. Many digital
Design-For-Testability (DFT) techniques has been developed to
reduce the difficulty of test generation by increasing
accessibility to internal elements of a circuit. Boundary Scan
and BIST gain great popularity among several DFTs. With the
integration of analog and digital circuits on a signle device,
the testing of mixed-signal circuits is even more difficult
than digital circuits. A solution to the testing problem is the
development of an Analog Design for Testability that similar to
its digital counterpart. In this thesis, two new Analog
Boundary Scan architectures employing concepts similar to
digital Boundary Scan is proposed to provide structured access
to the analog signal in a mixed-signal device. Moreover, a
system which automatically inserts test circuits to a circuit
described in VHDL is developed. This system consists of two
subsystems: Boundary scan automatic insertion and BIST
automatic insertion. According to the proposed analog boundary
scan architecture and the digital boundary scan standard, the
Boundary Scan automatic insertion subsystem can cope with not
only digital but also mixed-signal circuits. The basic
principle of BIST is to insert extra circuitry so that the
generation of test patterns and verification of test results
occur within the circuit itself. In our BIST automatic
insertion subsystem, such extra circuitry is provided for both
digital and analog circuits.

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