|
In this thesis, we present a fast sensitized path decision
method for test pattern generation of combinational circuits.
This method accelerates any path sensitization test pattern
generation algorithm, such as D-algorithm, PODEM, FAN, or
SOCRATES. The performance improvement is based on two major
ideas: propagating the fault on a stem to all its fanout-
branches and desensitizing one or more input lines of a
reconvergent gate when the fault effect can not propagate
through the gate. In this way, the time for selecting paths to
be sensitized can be reduced. The idea of possible sensitized
path graphs is introduced to keep track of all the paths from
the fault site to primary outputs.
|