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This thesis discusses the methods for equivalent circuit
extraction by using time-domain reflection (TDR) measurement.
Through experiments and simulations, we verified two existing
methods: the equivalent lump circuit extraction and the layer
peeling transmission line synthesis. We introduced the hybrid
layer peeling model extraction, which combines the advantages of
the layer peeling transmission line synthesis for transmission
line and the mode extraction for lump elements. By using the
matrix-pencil approach, we can limit the mode number and
constrain the noise of the TDR information.Our ultimate goal is
to find the equivalent model of the device-under-test(DUT) ,
such as the discontinuity of the electronic package, and try to
get its concise representation.
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