臺灣博碩士論文加值系統

隨著產品品質的不斷提昇，消費者對各部份的零組件要求亦日趨嚴格。同時，新產品的開發由研究、測試至上市的時間與其產品的生命週期也日益縮短。其中有關步進實驗終止時間之決定時機，因涉及到實驗分析結果的準確性，與其有時間與成本上的考量，對實驗之進行者而言，一直是件很困難也急欲解決的事。

本研究嘗試提供一個加速實驗終止時間的判斷準則，希望能藉著線上即時的監測方式，辨識出資料漸趨穩定的時點，以作為切換實驗應力水準的適當時機。進而以在較短實驗時間下的實驗樣本，進行產品壽命之預測，希望能得到與完整實驗時間下所得預測近似的結果。如此即能有效的節省實驗時間與成本，更能發揮實驗的最大效益。

As higher of the acquired quality of the product, more criticized requirements for separate components are needed. Meanwhile, periods over the developing, testing, and going on the market and the life cycle of new product are shortened. It is considered for the accuracy of results and the costs of the test for choosing a right termination criteria for taking step-stress experiment. For the practical engineer, choosing a right termination criteria is difficult but eager to solve this problem.

In this study, a new approach to determine the termination time for the accelerated experiments was proposed. Basically, this method can be used to identify the appropriate moment for shifting the experimental stress to a higher level. In the other words, the experimental time can be shortening in terms of this on-line monitoring technique, without losing any prediction precision. To demonstrate the effectiveness of the proposed approach, lifetime forecasting is performed on LED products with partial or completed in formation. Results from this study indicate that the utility of proposed method significantly cut down the experimental time. In addition, the difference between the prediction results based on two data sets is less than 2.5%.

中文摘要
英文摘要
目錄
圖目錄
表目錄
第一章 緒論
1.1 前言
1.2 研究動機與目的
1.3 研究程序
第二章 文獻探討
2.1 加速壽命實驗
2.2 步進應力實驗
2.3 實驗設計與計劃
2.4 實驗終止規則
2.5 倒傳遞類神經網路
第三章 個案研究
3.1 資料描述
3.2 步進應力實驗建構程序
3.3 實驗終止規則之探討
3.4 實驗終止規則之評估
第四章 結論
參考文獻

Anderson, J. A. and Rosenfeld, E. (1988) Neurocomputing：Foundations of Research, Cambridge, MA：MIT Press.

Baffes, (1989) NETS User Guide, Software Technology Branch, Lyndon B. Johnson Space Center, Clear Lake, Texas.

Boulanger, M. and Escobar, L. A. (1994) "Experimental Design for A Class of Accelerated Degradation Tests," Technometrics, Vol. 36, No. 3, pp. 260-272.

Carey, M. B. and Koenig, R. H. (1991) "Reliability Assessment Based on Accelerated Degradation：A Case Study," IEEE Transactions on Reliability, Vol. 40, No. 5 pp. 499-506.

Chang, D. S. (1993) "Analysis of Accelerated Degradation Data in a Two-Way Design," Reliability Engineering and System Safety, Vol. 39, pp. 65-69.

Chang, T. S. and Chern S. G. (1997) "Assessment of Termination Criteria for Clay Permeability Testing," J. Chinese Institute of Environmental Engineering, Vol. 7, No. 2, pp. 73-85.

Lu, J. C. and Meeker, W. Q. (1993) "Using Degradation Measures to Estimate a Time-To-Failure Distribution," Technometrics, Vol. 35, No. 2, pp. 161-174.

Meeker, W. Q. and Escobar, L. A. (1993) "A Review of Reserch and Current Issues in Accelerated Testing," International Statistical Review, Vol. 61, pp. 147-168.

Nelson, W. (1990) Accelerated Testing: Statistical Models, Test Plans, and Data Analysis, New York: John Wiley.

Nelson, M. M. and Illingworth, W. T. (1990) A Practical Guide to Neural Nets, Addison-Wesley Pub. Co. Inc.
OSTDA STANDARDS (1990) 光電半導體工業技術標準, 光電半導體工業技術發展諮詢委員會, 中華民國七十九年初版.

Peirce, J. J. and Witter, K. A. (1986) "Termination Criteria for Clay Permeability Testing," J. Geotechnical Division, ASCE, Vol. 112, No. 9, pp. 841-854.

Ralston. J. M. and Mann, J. W. (1979) "Temperature and Current Dependence of Degradation in Red-Emitting GaP LED's," J. Applied Physics, Vol. 50, No. 5, pp. 3630-3637.

Rao, S. S. (1993) Reliability-Based Design, Macgraw-Hill.

Stern, H. S. (1996) "Neural Networks in Applied Statistics," Technometrics, Vol. 38, No. 3, pp. 205-214.

Tang, L. C. and Chang, D. S. (1995) "Reliability Prediction Using Nondestructive Accelerated Degradation Data： A Case Study on Power Supply Units," IEEE Transactions on Reliability, Vol. 44, No. 4, pp. 562-566.

Yale, K. (1997) "Preparing the Right Data Diet for Training Neural Networks," IEEE Spectrum Magazine, Vol. 34, No. 3, pp. 64-66.

Yamakoshi, S., Hasegawa, O., Hamaguchi, H., Abe, M. and Yamaoka, T. (1977) "Degradation of High-Radiance Ga1-xAlxAs LEDs," Applied Physics Letters, Vol. 31, No. 9, pp. 627-629.

Tseng, S. T. and Yu, H. F. (1997) "A Termination Rule for Degradation Experiments," IEEE Transactions on Reliability, Vol. 46, No. 1, pp. 130-133.

Yurkowski, W., Schafer, R. E., and Finkelstein, J. M. (1967) "Accelerated Testing Technology," Rome Air Development Center Tech. Rep. RADC-TR-67-420, Griffiss AFB, NY.