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Due to the increasing complexity of integrated circuits(Ics), it is getting difficult to consider DFT(Design For Testability) at gate level. To shorten time to market of products,DFT has been considered at high level (Behavioral Level, Register Transfer Level ) rather than gate level in recent years. In this thesis, we present techniques that can be used to deal with the testabilityproblems caused by "CASE" conditional statement under Built-In Self-Test(BIST)(BIST) enviroment. We achive this goal by modifying the original behavioral code. As a result, the circuits synthesized from the modifiedcode can be effectively tested.
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