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研究生:吳秋賢
研究生(外文):Chiu-Hsien Wu
論文名稱:串聯約瑟芬陣列元件之製作與其物理特性研究
論文名稱(外文):Fabrication and physics of Josephson junctions arrays
指導教授:楊鴻昌楊鴻昌引用關係
學位類別:碩士
校院名稱:國立臺灣大學
系所名稱:物理學研究所
學門:自然科學學門
學類:物理學類
論文種類:學術論文
論文出版年:2000
畢業學年度:88
語文別:中文
論文頁數:70
中文關鍵詞:串聯約瑟芬元件電壓雜訊
外文關鍵詞:Josephson junction arrays
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本論文在於探討高溫超導約瑟芬結元件之製作及串聯約瑟芬陣列元件物理特性。
利用顯影及蝕刻技術將氧化鎂MgO(100) 基座蝕刻成階梯形狀,由AFM(atomic force microscope)來確定階梯的品質,控制高溫超導薄膜(YBCO)品質,以及基座階梯高度與薄膜厚度的比例關係,製作出串聯約瑟芬陣列元件。
實驗量測到的電壓電流曲線(V-I Curve)與電阻分流模型(RSJ Model)所模擬出來的結果相同。當加微波於電壓電流曲線,可清楚的得出Shapiro常電壓階梯高度與微波頻率有著正比的關係,和受微波功率的影響,但與溫度則無關。在約瑟芬元件雜訊量測上,此實驗亦明顯觀察到低頻下約瑟芬結元件之雜訊有著1/f關係,我們亦可加以算出電流及電阻擾動之大小。
在N個串聯約瑟芬結元件下可發現常態電阻、Shapiro台階高度與單一約瑟芬結的常態電阻存在著N倍正比的關係。而雜訊量測上亦顯現出電壓雜訊將會隨著約瑟芬結串聯個數N的增加而呈現出正比之關係。電壓雜訊於低頻下亦滿足1/f的關係,實驗推出串聯約瑟芬元件電壓雜訊中之臨界電流及電阻擾動值約為單一元件之電壓雜訊值的兩倍大。

Abstract
In this thesis, the fabrication and physics of Josephson junctions arrays on the step-edge MgO substrate are investigated.
The high-Tc YBCO Josephson junctions arrays were fabricated using step-edge MgO substrates. We used the atomic force microscope to examine the surface morphology along the step edge of the fabricated substrate. The characteristics of the junctions were found to be dependent on the etching process, the film quality and the ratio of the film thickness to step height of the MgO substrate.
The V-I curves of the step-edge YBCO Josephson junction exhibit the RSJ behavior. By irradiating microwave radiation to the Josephson junction, the Shapiro steps are observed. We measured the low-frequency 1/f voltage noise of YBCO Step-edge grain-boundary Josephson junctions. The origins of the voltage noise of the junctions are fluctuations of the critical current and the normal resistance. The analysis of the noise spectrum showed that the critical current and resistance fluctuations are correlated each other.
The V-I curves of our series arrays (N junctions) were close to the prediction of the RSJ-Model. The normal state resistance are N times that of a single junction. Giant Shapiro steps are observed. The constant voltage step of the junctions array is N times that of a single junction. The voltage noise, ■, of series arrays increases with number N of the Josephson junction series arrays and follows the expression■where the is the voltage noise of a single junction.

第一章 緒論………………………………………………………1
第二章 樣品的製作………………………………………………5
2-1 階梯的製作……………………………………… 5
2-2 高溫超導薄膜的成長……………………………16
2-3 約瑟芬元件的製作………………………………21
第三章 單一約瑟芬元件特性…………………………………25
3-1 電壓-電流特徵曲線……………………………27
3-2 約瑟芬元件微波照射下電流電壓特性…………32
3-3 臨界電流溫度關係………………………………36
3-4 熱擾動效應………………………………………38
3-5 約瑟芬元件之電壓雜訊…………………………40
第四章 一維串聯約瑟芬元件…………………………………48
4-1 電壓電流曲線曲線量測…………………………48
4-2 常電壓台階的量測………………………………55
4-3 臨界電流和溫度的關係…………………………58
4-4 雜訊的測量………………………………………58
第五章 結論……………………………………………………65
參考資料 ………………………………………………………67

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