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研究生:林瀚元
研究生(外文):LIN, HAN-YUAN
論文名稱:TOC下退化性存貨作業指導原則-以某晶圓廠之檢驗站為例
論文名稱(外文):Design of Operational Guidelines for Deteriorating Inventory under TOC Environment-A Wafer Fab. Inspection Example
指導教授:林知行
指導教授(外文):LIN, JY-HSIN
學位類別:碩士
校院名稱:華梵大學
系所名稱:工業管理學系碩士班
學門:工程學門
學類:工業工程學類
論文種類:學術論文
論文出版年:2002
畢業學年度:90
語文別:中文
論文頁數:94
中文關鍵詞:限制理論緩衝區管理瓶頸站投料退化性存貨
外文關鍵詞:Theory of ConstraintsBuffer ManagementBottleneckOrder ReleaseDeteriorating Inventory
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本研究主要在探討當存貨品質具有退化的特性時,如何設定適當的緩衝,同時結合派工法則與檢驗計劃,以確保瓶頸作業的順暢並進而提升產出。針對瓶頸檢驗站前的緩衝區管理,本研究發展出派工法則來控制投料以確保緩衝區的固定大小與內容,同時改善瓶頸的保護與防止在製品因退化所形成的回流。研究的對象為某晶圓廠在潔淨室(Clean Room)中的最終檢驗站CR-80,該檢驗站為瓶頸工作站,由於在原來的作業設定下,部分產品檢驗採用抽檢,抽檢不通過即進一步實施全檢,使得作業時間存在著相當的變異。而經過清洗後置於緩衝區內等待檢驗的晶圓,隨著時間所附著的污染微粒(Particle)逐漸增加,品質發生退化的現象,退化至一定程度時,晶圓就必須重洗。因此,加工時間的變異以及回流重工的問題,影響了系統的產出。研究結果顯示,在維持原先的抽檢計劃下,運用本研究所發展出的作業方法對於系統產出率有9%-15%的改善,而瓶頸設備CR-80的使用率亦提升5﹪-15%。

The aim of the research, under deteriorating inventory condition, is to develop proper shop floor management guidelines that coordinate various order release mechanisms, sampling plan schemes and dispatch rules to smooth the bottleneck operation and to improve the system performance. The subject of this research is the final inspection station CR-80, which is the bottleneck and located in a class 10 clean room. The washed wafers are put into the buffer and wait for inspection, particles adhere to the wafers as queue time goes by. The quality of wafers deteriorates and causes unavoidable reflow of WIP. Currently, a sampling inspection plan is used to ensure the outgoing quality of of wafers. Once a lot failed to pass the sampling inspection, a full inspection is conducted immediately. Such inspection scheme varies the processing time greatly and introduces random behavior, which in term affects the system throughput. A dispatching rule based on minimization of process time variation was developed and several simulation experiments were conducted. The comparisons between the simulation results with the real life data indicated that without changing current sampling plan, the new dispatching rule improved about 10 % of the throughput with little increase in number of reflow. The degree of improvement of machine utilization varied under different sampling plans, within the range of 5 to 15%.

目錄
致謝 I
摘要 II
Abstract III
目錄 IV
表錄 VIII
圖錄 IX
符號說明 X
第一章 緒論 1
1.1研究背景 1
1.2 研究動機 2
1.3 研究目的 3
1.4研究範圍與限制 6
1.4.1 研究範圍 6
1.4.2 研究限制 6
1.5研究流程 7
1.6論文架構 8
第二章 相關文獻探討 9
2.1在製品(WIP)數量的控管 9
2.2限制理論(TOC) 10
2.3投料與派工策略 12
2.3.1均勻負荷法(Uniform Loading ; UL) 13
2.3.2避免飢餓法(Starvation Avoidance ; SA) 14
2.3.3雙界法(Two-Boundary ; TB) 15
2.3.4工作負荷調節法(Workload Regulating ; WR) 15
2.3.5及時生產法(JIT1)與修正即時生產法(JIT2) 16
2.3.6定量在製品法(Constant WIP ; CONWIP) 16
2.3.7鼓-緩衝區-繩投料法(Drum-Buffer-Rope) 17
2.4抽樣檢驗 17
2.4.1抽樣檢驗的基本名詞 20
2.4.2抽樣檢驗計劃的形式 21
2.4.3操作特性曲線(Operating Characteristic Curve) 25
2.4.4選別型抽樣檢驗計劃 27
2.5退化性存貨相關研究探討 28
第三章 研究方法 31
3.1情境假設 31
3.1.1晶圓等候情境假設 31
3.1.2最終檢驗機台判斷方式情境假設 32
3.2相關的作業指導原則發展 33
3.2.1投料方式與緩衝區大小控制 33
3.2.2檢驗站抽樣檢驗作業方式 34
3.2.3 派工策略 35
第四章 模型建構 36
4.1模型建構步驟 36
4.1.1基本模型問題界定與假設 37
4.1.2模型一般狀況設定 38
4.1.3模型1基本假設 40
4.1.4模型2基本假設 42
4.1.5基本模型模擬結果分析 44
4.2抽樣與派工模型 45
4.2.1抽樣模型的問題界定與假設 45
4.2.2派工模型的問題界定與假設 48
4.2.3抽樣及派工模型建構 49
4.2.4模型A1與模型A2基本假設 51
4.2.5模型A3與模型A4基本假設 52
4.2.6模型A5與模型A6基本假設 53
4.2.7抽樣及派工模型模擬結果分析 54
4.3總面積良率遞減模式模型假設 55
4.3.1總面積良率遞減模式模型建構 56
4.3.2總面積良率遞減模型模擬結果分析 56
4.4條件的寬放 58
4.4.1寬放模型的建構 58
4.4.2模型C1及模型C2基本假設 61
4.4.3模型C3及模型C4基本假設 62
4.4.4模型C5及模型C6基本假設 63
4.4.5模型C7及模型C8基本假設 65
4.4.6模型C9及模型C10基本假設 66
4.4.7模型C11及模型C12基本假設 67
4.4.8寬放模型模擬結果分析 68
第五章 結論 70
5.1結果與討論 70
5.1.1 TOC環境下退化性存貨作業指導原則 72
5.2未來研究方向建議 73
參考文獻 74
附錄一 基本模型程式碼 79
簡歷 94

中文部分
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英文部分
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