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研究生:賴南成
論文名稱:一個改變向量種子的技術應用於以線性回饋移位暫存器為基礎的內建式自我測試
論文名稱(外文):A reseeding technique for LFSR-based BIST applications
指導教授:王行健
學位類別:碩士
校院名稱:國立中興大學
系所名稱:資訊科學研究所
學門:工程學門
學類:電資工程學類
論文種類:學術論文
論文出版年:2002
畢業學年度:90
語文別:中文
論文頁數:30
中文關鍵詞:分支點改變向量種子內建式自我測試線性回饋移位暫存器
相關次數:
  • 被引用被引用:0
  • 點閱點閱:1246
  • 評分評分:
  • 下載下載:114
  • 收藏至我的研究室書目清單書目收藏:3
在這篇論文中,我們提出了一項reseeding的技術是用來解決以線性回饋移位暫存器為主的測試向量產生器(LFSR -based test pattern generation)來偵測電路中包含了隨機向量難以偵測的錯誤(random-pattern resistant faults),這項reseeding技術其運作的方式是藉由一個反轉邏輯(inversion logic)來修改LFSR目前狀態(state)中的幾個位元來轉換到我們所需要的狀態(state),這樣一來,我們可以在一定的時間內將一個電路中所有的錯誤測完,而且我們還可以不需要唯讀記憶體來儲存種子(seed)。
因此,我們也提出了一個有效選擇reseeding points的演算法,而這個演算法的目標是一方面為了達到完整的錯誤涵蓋率(complete fault coverage),另一方面藉由減少reseeding的次數來降低反轉邏輯(inversion logic)的硬體耗費(hardware overhead)。
最後,我們將提出的技術及演算法運用到ISCAS ’85和ISCAS ’89的組合電路的部分,而在完整的錯誤涵蓋率(complete fault coverage)下實驗結果顯示了我們的方法所得出的硬體耗費(hardware overhead)比以前的方法所需的少10%~60%。

第一章 簡介……………………….…………………………….……….…1
1.1 研究動機……………………………………………….…………1
1.2 研究目的……………………………………………….…………1
第二章 背景知識……………………………………………….…………3
2.1 單晶片系統(Sstem-on-Chip,SOC )… … ….…………………3
2.2 內建自我測試(Built-in Self-test) ……………….……….4
2.3 線性回饋移位暫存器(Linear Feedback Shift Register)….5
2.4 測試方法……………………………………..………………...6
2.4.1 Test-per-Clock……………..………………………….......…6
2.4.2 Test-per-Scan……..........…….…………………………….8
2.5 何謂需要Reseed…………………... ……………………....10
第三章 Reseeding架構及演算法.………………………………………..12
3.1 Reseeding架構……………………… … ………………….…12
3.2 Reseeding演算法……………… …… …………………….…16
第四章 實驗結果…………………………………………………………28
第五章 結論………………………………………………………………30

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