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研究生:邱垂勳
研究生(外文):chui-shun chiu
論文名稱:液晶顯示器之原始資料驅動IC測試-故障模型與測試方法
論文名稱(外文):TFT LCD Source Driver IC Testing-Fault Models and Test Generation
指導教授:李 崇 仁
指導教授(外文):Chung Len Lee
學位類別:碩士
校院名稱:國立交通大學
系所名稱:電資學院學程碩士班
學門:工程學門
學類:電資工程學類
論文種類:學術論文
論文出版年:2002
畢業學年度:90
語文別:中文
論文頁數:50
中文關鍵詞:液晶顯示器驅動IC測試
外文關鍵詞:TFT LCD source driver IC testing
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TFT LCD source driver IC 為近年來開發的新產品,具有多組非線性的DAC陣列與極性反轉的特性,傳統的測試方法無所依循,亦欠缺系統性的推導,過去的工程師憑藉著設計的規格,自己創造測試pattern,在由組裝廠回授的fault現象中,新增或修正測試pattern,造成無效率且浪費時間 !
此篇論文根據實際電路之研究,建立TFT LCD source driver IC主要電路的circuit model並透過SPICE 模擬(simulation)驗證後,建立了13種faults 及目前tests的對應關係,進而統計fault機率,及加入成本(test time)來推導專家系統(expert system), 產生較合理且最佳的測試tests組合,並由實驗驗證,效果是顯著有效的。

The high density and compact TFT LCD Source Driver IC has been developed recently. The IC contains many non-linear DAC arrays with a characteristic of polarity inversion during operating.
Because of these characteristics, there is no well-developed method of the testing the IC. In practice, the test patterns are developed by the test engineer according to design specifications and then modified according to the feedback of the end user of IC, i.e., the TFT_LCD panel manufacturer. The test patterns are inefficient and waste time.
In the paper, we have, through the SPICE simulation, developed thirteen fault models to accommodate the tests. And then we create an expert system, in accordance to the real-site IC test statistics, to achieve a better and more efficient set of test patterns. Experimental results have shown that the developed patterns are effective in reducing test time while achieve a good test coverage

第 1 章:簡介
第 2 章:目前的測試方法介紹
第 3 章:TFT LCD source driver IC faults之建立
第 4 章: TFT LCD source driver IC 之合理測試方法
第 5 章:實驗
第 6 章:結論

[1] Troutman, R.R.; Jenkins, L.C.; Polastre, R.J.; Wisnieff, R.L. “Characterization of TFT/LCD Arrays”, Display Research Conference, 1991., Conference Record of the 1991 International , 1991
[2] Byong-Deok Choi; Oh-Kyong Kwon ,“Stepwise Data Driving Method And Circuits For Low-Power TFT-LCD”, Consumer Electronics, IEEE Transactions on , Volume: 46 Issue: 4 , Nov. 2000
[3] Kato, H , “Equi-Transparency Test for LCD”, Instrumentation and Measurement Technology Conference, 1994. IMTC/94. Conference Proceedings. 10th Anniversary. Advanced Technologies in I & M., 1994 IEEE
[4] Hayashi, N.; Naito, H.; Osada, O.; Adachi, Y.; Kubota, Y.; Yoshifuku, T.; Atsumi, K.; Yamaya, Y.; Takeno, S.; Nakano, H. “Development of TFT-LCD TAB modules”, Electronic Manufacturing Technology Symposium, 1989, Proceedings. Japan IEMT Symposium, Sixth IEEE/CHMT International , 1989
[5] Chua-Chin Wang; Chi-Feng Wu; Sheng-Hua Chen; Chia-Hsiung Kao, “In-sawing-lane multi-level BIST for known good dies of LCD drivers”, Electronics Letters , Volume: 35 Issue:18,2Sept.1999
[6] Kuzmicz, W.; Pleskacz, W.; Raik, J.; Ubar, R. “Defect-oriented fault simulation and test generation in digital circuits”, Quality Electronic Design, 2001 International Symposium on , 2001
[7]財團法人自強工業科學基金會之液晶顯示原理與驅動電路設計

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