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1.H. A. Macleod , " Thin Film Optical Filters ", Chap. 9 Production method and thin-film materials , Chap. 10 Layer uniformity and thickness monitoring , Adam Hilger Ltd.2.李正中 編著 , " 薄膜光學與鍍膜技術 ", 第二章 基本理論 ,第十二章 薄膜厚度之均勻 性及鍍膜厚度之監控 , 第十三章 光學薄膜特性的量測 ,藝軒圖書出版社 , 台北 , 19993.R Swanepoel ., 1983 " Determination of the thickness and optical constants of amorphous silicon ", J. Phy. E. Sci. Inst. 16, 1214-12224.J. C. Manifacier, J. Gasiot and J. P. Fillard, 1976, " A simple method for determination of the optical constant n , k and the thickness of weekly absorbing thin films ", J. Phy. E. Sci. Inst 9 , 1002-10045.J. P. Borgogno, F. Flory, P. Roche, B. Schmitt, G.. Albert, E. Pelletier, and H. A.Macleod, 1984, " Refractive index and inhomogeneity of thin films ", Appl. Opt. 23, 3567-3570 6.Bertrand Bovard., Fred J. Van Milligen., Michael J. Messerly ., Steven G. Saex, and H. Angus Macleod., 1985, "Optical constants derivation for an inhomogeneous thin film from in situ transmission measurements ",Apple. Opt. 24, 1803-1827.7.Liou Y. Y., Lee C. C., Jaing C. C. and Chu C. W., 1995, " Determination of the optical constant profile of thin weekly absorbing inhomogeneous films ", Jpn. J. Appl. Phys. 34, 1952-1957.8.A. V. Tikhonravov, et al " Influence of small inhomogeneities on the spectral characteristics of single thin films ", 1997 Optical Society of America, 7188-71989.M. Nowak , " Determination of optical constants and average thickness of inhomogeneous-rough thin films using spectral dependence of optical transmittgance ",Thin Solid Films 254 (1995) 200-210.10.Dorian Minkov ., Ryno Swanepoel., 1993, " Computerization of the optical characterization of a thin dielectric film ", Society of Photo-Optical Instrumentation Engineers (12) 3333-3337.11.Zhuomin M. Zhang ., " Optical properties of a slightly absorbing film for oblique incidence " , 1999 Optical Society of America, 205-207.12.Ivan Ohlidal ., Daniel Franta ., Miloslav Ohlidal ., and Karel Navratil., " Optical characterization of nonabsorbing and weakly absorbing thin films with the wavelengths related to extrema in spectral reflectances ", 2001 Optical Society of America, 5711-5717.13.Erwin Kreyszig., 8th edition , " Advanced Engineering Mathematics ", Chap. 17 , Chap.18 14.鄭明哲 編譯," 工程數值方法 ",第十章最小平方回歸法、第十一章內插法,全華科 技圖書股份有限公司,台北,198715.蔣崑旭 著," 數值方法 ",第四章差值法、第五章近似法,波前電腦圖書公司, 台北, 198716.袁帝文 編著," 應用數值方法 ",第六章數值內差、第七章曲線調適與近似值, 儒林圖書公司,台北,199717.劉裕永,1995," 光學薄膜之非均勻性研究 ",國立中央大學光電科學研究所博士論文
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