跳到主要內容

臺灣博碩士論文加值系統

(44.210.21.70) 您好!臺灣時間:2022/08/11 15:58
字體大小: 字級放大   字級縮小   預設字形  
回查詢結果 :::

詳目顯示

: 
twitterline
研究生:蔡第奇
研究生(外文):Di-Chi Tsai
論文名稱:平衡式元件之向量網路分析儀量測技術
論文名稱(外文):Measurement of Balanced Devices Using Vector Network Analyzers
指導教授:洪子聖洪子聖引用關係
指導教授(外文):Tzyy-Sheng Horng
學位類別:碩士
校院名稱:國立中山大學
系所名稱:電機工程學系研究所
學門:工程學門
學類:電資工程學類
論文種類:學術論文
論文出版年:2002
畢業學年度:90
語文別:中文
論文頁數:68
中文關鍵詞:平衡式元件散射參數校正
外文關鍵詞:balanced devicess-parameterscalibration
相關次數:
  • 被引用被引用:31
  • 點閱點閱:557
  • 評分評分:
  • 下載下載:114
  • 收藏至我的研究室書目清單書目收藏:0
本論文提出一種能使用雙埠向量網路分析儀精確量測平衡式元件的方法,結合了重新正規化法及混合模態轉換法這兩種技術,可以用在同軸元件量測上。先以模擬的方式分別驗證上述兩種技術並確認方法是可行的之後,再實際以FR4基板製作一Marchand Balun並且使用本論文發展的系統進行量測。此系統純粹以軟體計算的方式求取平衡式元件特性,而不需要增加額外的硬體設備,此外,配合微波開關的使用亦能應用此方法到晶圓上元件之量測。
This thesis presented a complete measurement method for accurate characterization of balanced devices using two-port vector network analyzer. Combining renormalization and mixed-mode transformation techniques, this method is good for coaxial components. At first, the feasibility of the method was confirmed with the help of ADS simulation. Then a real example of Marchand balun fabricated on FR4 substrate was measured with calibrated mixed-mode S-parameters that have been further verified by full-wave simulations. The measurement system developed based on this method does not require any additional hardware to the vector network analyzer. This system can be also applied to the measurement of on-wafer components with the help of some microwave switches.
目錄I
圖表目錄II
第一章緒論1
第二章多埠校正理論4
2.1 簡介4
2.2 雙埠校正7
2.2.1 SOLT8
2.2.2 TRL9
2.2.3 TRM/LRM12
2.2.4 LRRM13
2.2.5 SOLR14
2.2.6 De-Embedding15
2.3 多埠校正23
2.3.1 全多埠校正25
2.3.2 迭代法28
2.3.3 重新正規化法29
2.3.4 多埠網路De-Embedding30
2.4 重新正規化法的驗證33
2.5 參考阻抗轉換39
第三章平衡式元件的量測44
3.1 簡介44
3.2 混合模態散射參數44
3.3 純模態向量網路分析儀47
3.4 混合模態轉換49
3.5 設計與量測實例51
第四章結論60
參考文獻61
附錄A
[1]J.C. Tippet and R.A. Speciale, “A Rigorous Technique for Measuring the Scattering Matrix of a Multiport Device with a 2-Port Network Analyzer,” IEEE Transactions on Microwave Theory and Techniques, vol. 30, no. 5, pp. 661-666, May 1982.[2]H. Dropkin, Comments on “A Rigorous Technique for Measuring the Scattering Matrix of a Multiport Device with a Two-Port Network Analyzer,” IEEE Transactions on Microwave Theory and Techniques, vol. 31, no. 1, pp. 79-81, Jan. 1983.[3]M. Schoon, “A Semi-Automatic 3-Port Network Analyzer,” IEEE Transactions on Microwave Theory and Techniques, vol. 41, no. 6/7, pp. 974-978, June/July 1993.[4]A. Ferrero, et al., “A New Implementation of a Multiport Automatic Network Analyzer,” IEEE Transactions on Microwave Theory and Techniques, vol. 40, no. 11, pp. 2078-2085, Nov. 1992.[5]D.E. Bockelman and W.R. Eisenstadt, “Combined Differential and Common-Mode Scattering Parameters: Theory and Simulation,” IEEE Transactions on. Microwave Theory and Techniques, vol. 43, no. 7, pp. 1530-1539, July 1995.[6]D.E. Bockelman and W.R. Eisenstadt, “Calibration and Verification of the Pure-Mode Vector Network Analyzer,” IEEE Transactions on Microwave Theory and Techniques, vol. 46, no. 7, pp. 1009-1012, July 1998.[7]D.E. Bockelman and W.R. Eisenstadt, “Pure-Mode Network Analyzer for On-Wafer Measuremetns of Mixed-Mode S-Parameters of Differential Circuits,” IEEE Transactions on Microwave Theory and Techniques, vol. 45, no. 7, pp. 1071-1077, July 1997.[8]F. Sanpietro, et al., “Accuracy of a Multiport Network Analyzer,” IEEE Transactions on Instrumentation and Measurement, vol. 44, no. 2, pp. 304-307, Apr. 1995.[9]郭明哲, “微帶互連元件電性測試夾具製作與向量網路分析儀量測校正技術之研發,” 中山大學碩士論文, 1998.[10]陳棓煌, “向量網路分析儀量測校正方法之研究與實踐,” 中山大學碩士論文, 1996.[11]J.A. Jargon and R.B. Marks, "Two-Tier Multiline TRL for Calibration of Low-Cost Network Analyzers," 46th ARFTG Conference Digest, Dec. 1995.[12]黃輝祥, “應用於射頻積體電路之釘架型晶片尺寸封裝電性模型及效應評估,” 中山大學碩士論文, 2001.[13]G.F. Engen and C.A. Hoer. “ Thru-Reflect-Line: An ImprovedTechnique for Calibrating the Dual Six-Port Automatic Network Analyzer,” IEEE Transactions on Microwave Theory and Techniques, vol. 27, no. 12, pp. 987-993, Dec. 1979.[14]“In-Fixture Measurements Using Vector Network Analyzers,” Application Note 1287-9, Agilent Technologies.[15]D. Rubin, “De-Embedding mm-Wave MICs with TRL,” Microwave Journal, June 1990.[16]D. Williams, “De-embedding and Unterminating Microwave Fixtures with Nonlinear Least Squares,” IEEE Transactions on Microwave Theory and Techniques, vol. 38, no. 6, pp. 787-791, June 1990.[17]R.B. Marks, “A Multiline Method of Network Analyzer Calibration,” IEEE Transactions on Microwave Theory and Techniques, vol. 39, no. 7, pp.1205-1215, July 1991.[18]R.A. Soares, P. Gouzien, P. Legaud and G. Follot, “A Unified Mathematical Approach to Two-Port Calibration Techniques and Some Applications,” IEEE Transactions on Microwave Theory and Techniques, vol. 37, no. 11, Nov. 1989.[19]C. Wan, “Calibrating Network Analyzers Using a Through and a Line or a Transmission Parameter Measurement,” Microwave and Optical Technology Letters, vol. 20, no. 6, March 1999.[20]H.J. Eul and B. Schiek., “Thru-Match-Reflect: One Result of a Rigorous Theory for De-embedding and Network Analyzer Calibration,” Proceedings of the 1988 European Microwave Conference, Sep. 1988.[21]S. Lautzenhiser, et al, “Improve Accuracy of On-Wafer Tests via LRM Calibration,” Microwaves & RF, Jan. 1990.[22]A. Davidson, K. Jones, and E. Strid, “LRM and LRRM Calibrations with Automatic Determination of Load Inductance,” 36th ARFTG Conference Digest, Nov. 1990.[23]“Technique Verifies LRRM Calibrations for GaAs Measurements,” Technical Brief, Cascade Microtech.[24]J. Pence, “Verification of LRRM Calibration with Load Inductance Compensation for CPW Measurements on GaAs Substrates,” 42nd ARFTG Conference Digest, Dec. 1993.[25]A. Ferero and U. Pisani, “Two-Port Network Analyzer Calibration Using an Unknown Thru,” IEEE Microwave and Guided Wave Letters, vol. 2, no. 12, pp. 505-507, Dec. 1992.[26]S. Basu and L. Hayden, “An SOLR Calibration for Accurate Measurement of Orthogonal On-Wafer DUTs,” IEEE MTT-S International, vol. 3, pp.1335-1338, 1997.[27]M.Y. Li, et al, “A Simple Divide-by-De-Embedding Measurement Method,” Microwave Journal, Sep. 1993.[28]D.K. Walker, and D.F. Williams, “Comparison of SOLR and TRL Calibration,” 51st ARFTG Conference Digest, Dec. 1998.[29]T.E. Kolding, “On-Wafer Calibration Techniques for Giga-Hertz CMOS Measurements,” Proc. IEEE 1999 Int. Conf. on Microelectronic Test Structures, vol. 12, pp. 105-110, Mar. 1999.[30]M.C.A.M. Koolen, et al, “An Improved De-embedding Technique for On-Wafer High-Frequency Characterization,” IEEE 1991 Bipolar Circuits and Technology Meeting, pp. 188-191.[31]H. Cho and D.E. Burk, “A Three-Step Method for the De-Embedding of High-Frequency S-Parameter Measurements,” IEEE Transactions on Electronic Devices, vol. 38, no. 6, pp. 1371-1375, June 1991.[32]E.P. Vandamme, et al, “Improved Three-Step De-Embedding Method to Accurately Account for the Influence of Pad Parasitics in Silicon On-Wafer RF Test-Structures,” IEEE Transactions on Electronic Devices, vol. 48, no. 4, pp. 737-742, Apr. 2001.[33]T.E. Kolding, “A Four-Step Method for De-Embedding Gigahertz On-Wafer CMOS Measurements,” IEEE Transactions on Electronic Devices, vol. 47, no. 4, pp. 734-740, Apr. 2000.[34]T.E. Kolding, “Impact of Test-Fixture Forward Coupling on On-Wafer Silicon Device Measurements,” IEEE Transactions on Microwave and Guided Wave Letters, Vol. 10, No. 2, pp. 73-74, February 2000.[35]T.E. Kolding, “General Accuracy Considerations of Microwave On-Wafer Silicon Device Measurements,” IEEE MTT-S International, vol. 3, pp. 1839-1842, June 2000.[36]S.K. Park, et al, “A Method of Measuring Large-Signal S-Parameters of High Power Transistors,” Microwave Journal, Aug. 2001.[37]S. Bousnina, et al, “An Accurate On-Wafer De-Embedding Technique with Application to HBT Devices Characterization,” IEEE Transactions on Microwave Theory and Techniques, vol.50, no. 2, pp. 420-424, Feb. 2002.[38]A. Ferrero and U. Pisani, “QSOLT: a new fast calibration algorithm for two port S-parameter measurements,” 38th ARFTG Conference Digest, San Diego, Dec. 1991.[39]H.J. Eul and B. Schiek, “Reducing the number of calibration standards for network analyzer calibration,” IEEE Transactions on Microwave Theory and Techniques, vol. 40, no. 4, pp. 732-735, Aug. 1991.[40]J.C. Rautio, “Techniques for Correcting Scattering Parameter Data of an Imperfectly Terminated Multiport When Measured with a Two-Port Network Analyzer,” IEEE Transactions on Microwave Theory and Techniques, vol. 31, no. 5, pp. 407-412, May 1983.[41]T.E. Kolding, “Shield-Based Microwave On-Wave Device Measurement,” IEEE Transactions on Microwave Theory and Techniques, vol. 49, no. 6, pp. 1039-1044, June 2001.[42]T.E. Kolding, et al, “Microwave On-Wafer Characterization of Three-Port Devices using Shield-Based Test-Fixtures,” IEEE MTT-S International, vol. 3, pp.1535-1538, 2001.[43]C. Buoli, “3 dB, 90°, DC block Directional Coupler,” 19th European Microwave Conference, pp. 779-784, 1989.[44]D.M. Pozar, Microwave Engineering, 2nd Edition, John Wiley & Sons, N.Y., 1998.[45]R.J. Weber, Introduction to Microwave Circuits, IEEE Press, 2001.[46]K.S. Ang & I.D. Robertson, “Analysis and Design of Impedance- Transforming Planar Marchand Baluns,” IEEE Transactions on Microwave Theory and Techniques, vol. 49, no. 2, pp. 402-406, Feb. 2001.
QRCODE
 
 
 
 
 
                                                                                                                                                                                                                                                                                                                                                                                                               
第一頁 上一頁 下一頁 最後一頁 top
無相關期刊