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研究生:鄭明杰
研究生(外文):Ming-Chieh Cheng
論文名稱:記憶體可修複性及不可修複性之判斷策略
論文名稱(外文):Repairability and Unrepairability Decision for Memories
指導教授:梁新聰梁新聰引用關係
指導教授(外文):Hsing-Chung Liang
學位類別:碩士
校院名稱:長庚大學
系所名稱:半導體科技研究所
學門:工程學門
學類:電資工程學類
論文種類:學術論文
論文出版年:2003
畢業學年度:91
語文別:中文
論文頁數:61
中文關鍵詞:預留記憶體測試記憶體修複判斷可修複性判斷不可修複性
外文關鍵詞:Redundant MemoryTestingMemory repairRepairability decisionUnrepairability decision
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在記憶體的製造過程中,會因某些因素如微塵粒子造成記憶體的損壞,因此,會預留記憶體(redundant RAM)以做為修補(repair)之用;而如何在這些有限的redundant RAM中選擇row及column的修復方式,是相當重要的課題。
為了因應記憶體的快速成長所造成需要冗長的時間尋找修復解,本論文將著重於判斷記憶體可修復性及不可修復性之判斷策略。吾人利用前人所研究發現之判斷式,加以探索各個faulty line的特性,並利用其特性發展出新的判斷策略。在利用吾人所研究發現之判斷式後,可以更有效的判斷出有解及無解的例子,因此能更有效的加快尋找修復解。
During the process of producing memories, some factors like small dots may make the memory cells be out of function. For this reason we need to use redundant memory rows and columns to replace the faulty cells. As redundant lines are finite, how to choose redundant lines for replacement becomes a very important work. Large memories will require long time for deciding repair solutions, therefore in this thesis we target to make early decision about repairability and unrepairability for memories. We used previously provided strategies to explore the characteristics in faulty lines, and from that to develop new decision strategies. Our new decision strategies can effectively distinguish repairable and unrepairable memories, which make it be even faster to find repair solutions.
指導教授推薦書…………………………………………………………………
口試委員會審定書………………………………………………………………
授權書……………………………………………………………….……..……. iii
誌謝……………………………………………..……………………………..…. iv
中文摘要…………………………………………………………………...……. v
英文摘要…………………………………………………………………..…….. vi
目錄………………………………………………………………………....…… vii
圖目錄………………………………………………….……….………………… x
表目錄………………………………………………….………..……………… xii
第一章 簡介………………………………………………………………….. 1
1.1 研究動機……………………………………………………..……… 1
1.2 研究內容……………………………………………………………… 2
1.3 預備…………………………………………………………..……….… 3
1.4 章節概要……………………………………………………….……… 4
第二章 記憶體的修復方式……………………………………………….. 5
2. 1 unrepairability detection technique……………………………… 5
2.1.1 maximum maching……………………………………….…… 5
2.1.2 simple memory repair………………………………………… 8
2.2 尋找repair solution的修復方式………..……..…..………….…… 11
2.2.1 FLCA…………………………………..………………………. 11
2.2.2 有效係數法…………………………......…………………..…. 12
2.2.2.1 LECA…………………………………………..….…… 14
2.2.2.2 FCECA………………………………………………… 15
第三章 判斷記體可修復及不可修復之策略…………………………. 18
3.1不可修復及可修復之判斷策略……………………..…….…… 18
3.1.1策略1 largest number of total faults………………….…... 18
3.1.2策略2 must repair…………………...………………..……... 20
3.1.3策略3 theorem for unrepairability………………………... 22
3.1.4策略4 theorem for unrepairability………………………... 24
3.1.5策略5 theorem for repairability………………………….... 25
3.1.6策略6 method for searching ULE, UCR, UCC, etc.…... 26
3.1.7策略7 theorem for unrepairability………………………... 28
3.1.8策略8 method for replacing UCR and UCC………..…... 29
3.1.9策略9 method for probable unrepairability……….…...... 31
3.1.10策略10 theorem for repairability……………….……… 36
3.2判斷策略流程圖………………...……………………..…………… 38
第四章 實驗結果及討論…………………………………………………. 39
第五章 結論………….……………………………………………………. 40
參考文獻………………………………………………………………….…… 41
附錄……………………………………………………………………..….……. 42
[1]. S-Y. Kuo and W. K. Fuchs, “Efficient spare allocation in reconfigurable arrays”, in Proc. 1986 ACM/IEEE Design Automat. Conf. Pp. 385-390. Also in IEEE Design and Test, vol. 4, no. 1, pp 24-31, Feb. 1987.
[2]. C-L. Wey and F. Lombardi, “On the Repair of Redundant RAMS”, IEEE Trans. On CAD of ICAS, Vol. CAD 6, No. 2, pp.222-231, 1987.
[3]. Ramsey W. Haddad, T. Dahbura, and Anup B. Sharma, “Increased Throughput for the Testing and Repair of RAM's with Redundancy”, Proc. IEEE Intl. Conf. On Computer-Aided Design, pp. 230-233, February 1987.
[4]. F. Lombardi and W. K. Huang, “Approaches for the repair of VLSI/WSI RRAMs by row/column deletion”, in Proc. 18th Int. Conf. Fault-Tolerant Comput. Symp. (FTCS-18), July 1988, pp. 342-347.
[5]. Sung-Chuan Fang, Sao-Jie Chen and S. L. Lee, “NOVEL GRAPH-BASED ALGORITHMS FOR RECONFIGURABLE ARRAYS”, Circuits and Systems, 1991., IEEE International Sympoisum on , 11-14 June 1991 Page(s): 2866 —2869 vol.5
[6]. Wengang Che and Israel Koren, “Fault Spectrum Analysis for Fast Spare Allocation in Reconfigurable Arrays”, Defect and Fault Tolerance in VLSI Systems, 1992. Proceedings, 1992 IEEE International Workshop on , 4-6 Nov. 1992 Page(s): 60 —69.
[7]. 何文清(民91),記憶體修補之多餘行列選擇法。長庚大學半導體科技研究所碩士論文。
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