|
[1]SEMI (Semiconductor Equipment and Material International).http://www.semi.org [2]J. Lee and B. Wang, Computer-aided Maintenance — Methodologies and Practices, Kluwer Academic, 1999. [3]e-Diagnostics and EEC Workshop, International SEMATECH, Austin, Texas, USA, Oct. 19, 2001. http://www.sematech.org/ [4]Web site of the Center for Intelligent Maintenance Systems (IMS). http://www.imscenter.net/ [5]P. Singer, ”E-Diagnostics: Monitoring Tool Performance,” Semiconductor International, Mar. 2001. http://www.e-insite.net/semiconductor/ [6]e-Diagnostics and EEC Workshop, International SEMATECH, Munich, Germany, Apr. 16, 2002. http://www.sematech.org/ [7]e-Diagnostics Guidebook, version 1.5, International SEMATECH, Oct. 2002. http://www.sematech.org/ [8]EEC Guidelines, version 2.5, International SEMATECH, July, 2002. [9]M. Koc and J. Lee, “A System Framework for Next-Generation E-Maintenance System,” 2001. http://www.uwm.edu/CEAS/ims/pdffiles/E-Maintenance.PDF [10]J. Lee, “E-Manufacturing/E-Business: Transformation, Needs, Issues, and Collaborative Research Opportunities,” 2001. http://www.uwm.edu/CEAS/ims/ [11]NSF Workshop, NSF I/UCR Center, Oct. 1-2, 2001 [12]W. R. Hamel, “e-Maintenance Robotics in Hazardous Environments,” in 2000 IEEE International Conference on Intelligent Robots and Systems, pp. 838-842, 2000. [13]A.Imai, R.Miyamoto, and K.Ozawa, “Universal Architecture to Improve Equipment Maintenance Work” IEEE International Conference 2001. [14]Tung C. Hsieh, Kuo L. Su, and Chieh F. Tsai, “An Intelligent Remote Maintenance and Diagnostic System on Mobile Robot,”2002. [15]Benyong Zhang and Gary S. May “Towards Real-Time Fault Identification in Plasma Etching Using Neural Networks,” IEEE/SEMI Advanced Semiconductor Manufacturing Conference 1998. [16]Guy-Michel Cloarec and John Ringwood, “Incorporation of Statistical Methods in Multi-step Neural Network Prediction Models,” The 1998 IEEE International Joint Conference , Volume: 3 , 4-9 May 1998. Page(s): 2513 -2518 vol.3 [17]Tsung-Nan Tsai, Shih-Yaug Liu, and Taho Yang, ”A SMT Reflow Soldering Process Diagnosis System Using Neurofuzzy Approach,” International Journal of Fuzzy Systems,Vol.3, No. 4, December 2001. [18]Huang S, and Zhang H., “Neural Network in Manufacturing: A Survey,” IEEE/CPMT International Electronics Manufacturing Technology Symposium, pp.177-190, 1993. [19]Zhang H. C., and Huang S. H., “Applications of Neural Networks in Manufacturing,” International Journal of Production Research, Vol. 33, No. 3, pp705-728, 1995. [20]Stephen A. DeLurgio, “Forecasting Principles and Applications, McGraw-Hill, 1998. [21]J. Han and M. Kamber, Data Mining: Concepts and Techniques, Academic Press, 2001. [22]M. J. A. Berry and G. S. Linoff, Data Mining, WILEY, 2000. [23]Fredric M. Ham and Ivica Kostanic, Principles of Neurocomputing for Science & Engineering, McGraw-Hill, 2001. [24]Juran, J.M., Jurans Quality Control Handbook, McGraw-Hill, 1974 [25]Kane, V.E.,”Process Capability Indices,”Journal of Quality Technology, Vol.18, pp.41-45, 1986. [26]Rational. http://www.rational.com/uml [27]SEMI, “E98 for The Object-Based Equipment Model”, SEMI International Standard CD-ROM, Semiconductor Equipment and Materials International, 2001. [28]Java Native Interface 1.1 Specification. http://java.sun.com/products/jdk/1.2/docs/guide/jni/spec/jniTOC.doc.html [29]JmatLink v1.0 http://www.held-mueller.de/JMatLink/ [30]葉怡成,應用類神經網路,儒林圖書公司,民國八十六年七月. [31]葉怡成,類神經網路模式應用與實作,儒林圖書公司,民國九十二年三月. [32]方世榮,統計學導論,華泰書局,民國八十年七月. [33]陳順宇,多變量分析二版,華泰書局,民國八十七年六月. [34]羅華強,類神經網路--MATLAB的應用,清蔚科技,民國九十年九月. [35]張智星,MATLAB程式設計與應用,清蔚科技,民國八十九年二月.
|