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研究生:張清義
研究生(外文):Ching-Yi Chang
論文名稱:最佳預燒時間與條件的研究~以具失效率下降之產品為考量
論文名稱(外文):Study on the Optimal Burn-In Time and Condition~Bound on the DFR Product
指導教授:周至宏周至宏引用關係
指導教授(外文):Jyh-Horng Chou
學位類別:碩士
校院名稱:國立高雄第一科技大學
系所名稱:機械與自動化工程所
學門:工程學門
學類:機械工程學類
論文種類:學術論文
論文出版年:2003
畢業學年度:91
語文別:中文
論文頁數:64
中文關鍵詞:預燒品質管制平均剩餘壽命韋氏分佈
外文關鍵詞:burn-inquality controlmean residual lifetime
相關次數:
  • 被引用被引用:0
  • 點閱點閱:269
  • 評分評分:
  • 下載下載:45
  • 收藏至我的研究室書目清單書目收藏:3


摘要
預燒的目的是要篩選掉一般品質管制無法剔除具潛在脆弱的群體,經合適的預燒程序,將可使整批產品之平均剩餘壽命提昇,期使產品之使用壽命持續達到較保固期更長。本研究探討預燒最常被應用的目標:最大化之產品平均剩餘壽命與最小化總成本之內涵,並與可靠度領域中常應用之韋式分佈來說明預燒程序後,產品之平均剩餘壽命的變化,並設定不同韋氏分佈中之參數,探討當經過不同預燒時間後,產品之平均剩餘壽命之增益變化,以及單位預燒時間對應產品之平均剩餘壽命之增益,以期望最佳預燒時間符合最小化總成本,同時說明常應用之預燒條件水準。



Abstract
The purpose of burn-in is to screen the latent weak group of the products which can not be eliminated by the traditional quality control system. The products have been passed adequate burn-in procedure, their mean residual lifetime will be improved and their useful lifetime be longer than their guarantee period. The general application objective of burn-in are maximizing the mean residual lifetime and minimizing total cost which their contents had been studied. Meanwhile the tendency of the product with Weibull distribution characteristics of the mean residual lifetime after burn-in procedures had been studied. Furthermore the gain of mean residual lifetime and unit time gain of mean residual lifetime in variable burn-in time versus various parameters of products with Weibull distribution had been studied in order to explore the optimal burn-in time and the level of conditions.



摘要i
Abstractii
誌 謝iii
目 錄iv
表 目 錄vii
圖 目 錄viii
符 號 說 明x
一、緒 論1
1.1 前言1
1.2 研究動機與目的2
1.3 論文組織架構3
二、文獻探討4
2.1預燒程序4
2.2元件壽命之機率分佈5
1.單一型態壽命分配5
(1)推廣型分佈6
(2)混合型分佈8
2.雙型態壽命分佈9
2.3 預燒模型目標9
(1)最小化總成本10
(a).單一型態壽命分配成本模式10
(b).雙型態壽命分配成本模式10
(2)平均剩餘壽命11
三、可靠度相關理論12
3.1可靠度的定義12
3.2失效率及失效率函數13
3.3平均壽命及平均剩餘壽命14
3.4浴缸曲線15
3.5預燒17
3.6 移位機率分佈或條件機率分佈17
3.7 常用壽命分佈18
(1)指數分佈19
(2)韋氏分佈19
(3)常態分佈21
四、預燒問題探討26
4.1定義與動機26
4.2預燒對可靠度之衝擊28
4.3預燒程序之條件29
4.4預燒模式30
(1)品質目標之設定(最大剩餘平均壽命)30
(2)最大利潤(或最小成本)35
A.產品之單位生產成本36
B.產品之單位保固成本37
(3)公司的策略與資源40
五、結論與展望60
5.1 結論60
5.2未來研究方向之建議60
六、參考文獻62



六、參考文獻
[1]Boukai, B., 1987, “Bayes sequential procedure for estimation and for determination of burn-in time in a hazard rate model with an unknown change-point ”, Sequential Analysis, 6(1), pp37-53.
[2]Chou, Kuocheng and Tang, Kwei, 1992,“Burn-in Time and estimation of change-point with Weibull — Exponential Mixture Distribution”, Decision Sciences, Vol. 23, pp973-990.
[3]Ebeling, Charles E. 1997, An introduction to Reliability and Maintainability Engineering, Published by the McGraw-Hill Companies, Inc., ISBN 0-07-115248-2.
[4]Elasyed, A. Elsayed, 1996, Reliability Engineering, , Addison Wesley.
[5]Gera, A.E. and Ashdod, E. 1997,The Modified Exponential-Weibull Distribution for lifetime Modeling, Proceedings Annual Reliability and Maintainability Symposium.
[6]Gironi, G. and Malberti, P., 1976, “A Burn-in Program for Wear-out Unaffected Equipments”, Microelectronics Reliability vol 15, pp227-232.
[7]Jensen, F. and Petersen, N. E., 1982, Burn-in: An Engineering Approach to the Design and Analysis of Burn-in Procedures, John Wiley & Sons, Inc.
[8]Kim,K.N.,(1998),“Optimal Burn-in for Minimizing Cost and Multi-objectives”,Microelectronics Reliability vol 38, pp1577-1583.
[9]Kapru, K.C., Lamberson L.R., 1977, Reliability Engineering Design, John Willey & Son, New York.
[10]Kuo, W., 1984, “Reliability Enhanceement Through Optimal Burn-in”, IEEE Transactions on Reliability, vol 3, pp145-156.
[11]Kuo, W. and Kuo, Y, 1983, “Facing he headaches of Early Failures: A State-of-the Art Review of Burn-in Decisions”, Proceedings of the IEEE, vol 71, No 11, pp1257-1266.
[12]Lawrence, M. J., 1966, “An Investigation of the Burn-in Problem”, Technometrics, 8(1), 61-71.
[13]Leemis, L. M. and Beneke, M., 1990, “Burn-in Models and Methods: A Review”, IIE Transactions, 22(2), pp172-180.
[14]Mudbolkar, G.S. and Srivastava, D.K., 1993, “Exponential Weibull Family for analyzing Bathtub Failure-rate Date”, IEEE Transaction on Reliability, vol. 14, No. 2, June, pp299-302.
[15]Nguyen, D. G. and Nurthy, D. N. P., 1982, “Optimal Burn-inTime to Minimize Cost for Products Sold under Warranty”, IIE Transactions, 14(3), pp167-174.
[16]Peck, D. S., and Trapp, O. D.,1987, Accelerated Testing Handbook. Technology Associates, CA.
[17]Tseng, S. T., and Tang, J., 2001, “Optimal Burn-in Time for Highly Reliable Products,” International Journal of Industrial Engineering, 8, pp 329-338.
[18]Tseng, S. T., Tang, J. and Ku, I. H., 2002, “ A Termination Rule for Degradation Experiment,” IEEE Transacation on Reliability, 46, pp130-133.
[19]Vollertsen, Rolf-P. 1999, “Burn-in”. IEEE Transactions on Reliability, pp167-173.
[20]Watson, G.S. and Wells, W.T. “On the Probability of Improving The Mean Useful Life of Items by Estiminating Those with Short Lives”, Technometrics, 3(2), pp281-298.
[21]Wadswoyh, H.M. and Stephns, K.S. and Godfrey, A.B. (1986), Modern Methods for Quality Control and Implementation, New York : Willey.
[22]彭健育,2001,使用衰變資料對高可靠度產品壽命函數之估計,國立清華大學統計研究所碩士論文。
[23]蕭安君,2001,最小化總成本模式下之預燒時間,國立清華大學工業工程研究所碩士論文。

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