|
1. M. Abtew and G. Selvaduray, “Lead-free Solders in Microelectronics,” Materials Science and Engineering Reports: A Review Journal, 27, pp. 95-141, 2000. 2. A. Z. Miric and A. Grusd, “Lead-free alloys,” Soldering & Surface Mount Technology, pp. 19-25, 1998. 3. N. C. Lee, “Getting Ready for Lead-free Solders,” Soldering & Surface Mount Technology, Vol. 9, No. 2, pp. 65-69, 1997. 4. L. L. Mercado, V. Sarihan, Y. Guo and A. Mawer, “Impact of Solder Pad Size on Solder Joint Reliability in Flip Chip PBGA Packages,” IEEE Transactions on Advanced Packaging, Vol. 23, No. 3, pp. 415-420, 2000. 5. C. H. Lee, S. G. Lee and B. H. Moon, “Comparison of the Shear Strength and Reliability between Gold-Plated and Bare Copper Lands of a BGA Package,” IEEE Electronics Packaging Technology Conference, pp. 1103-1108, 1998. 6. C. H. Zhong, S. Yi and D. C. Whalley, “Solder Ball Failure Mechanismx in Plastic Ball Grid Array Packages,” Soldering & Surface Mount Technology, pp. 40-50, 2002. 7. F. P. Renken and G. Subbarayan, “A Two-Body Formulation for Solder Joint Shape Predition,” Journal of Electronic Packaging, Vol. 120, pp. 302-308, 1998. 8. J. Cai, S. Law, A. Teng and P. C. H. Chan, “Influences of Pad Shape and Solder Microstructure on Shear Force of Low Cost Flip Chip Bumps,” Int’l Symp on Electronic Materials & Packaging, pp. 91-98, 2000. 9. Y. P. Wu, P. L. Tu and Y. C. Chan, “The Effect of Solder Paste Volume and Reflow Ambient Atmosphere on Reliability of CBGA Assemblies,” Journal of Electronic Packaging, Vol. 123, pp. 284-289, 2001. 10. Y. P. Wu, Yan C. Chan and J. K. Lai, “Reliability Studies of Plastic Ball Grid Array Assemblies Reflowed in Nitrogen Ambient,” IEEE Electronics Components and Technology Conference, pp. 292-296, 1998. 11. N. C. Lee, “Optimizing the Reflow Profile via Defect Mechanism Analysis,” Soldering & Surface Mount Technology, pp. 13-20, 1999. 12. C. Mi. Garner, V. Gupta, V. Bissessur, A. Kumar and R. Aspandiar, “Challenges in Converting to Lead-free Electronics,” IEEE Electronics Packaging Technology Conference, pp. 6-9, 2000. 13. IPC/JEDEC J-STD-020B, “Moisture/Reflow Sensitivity Classification for Nonhermetic Solid State Surface Mount Devices,” 2002. 14. Y. C. Chan, P. L. Tu, C. W. Tang, K. C. Hung and Joseph K. L. Lai, “Reliability Studies of μBGA Solder Joints─Effect of Ni—Sn Intermetallic Compound,” IEEE Transactions on Advanced Packaging, Vol. 24, No. 1, pp. 25-32, 2001. 15. P. L. Tu, Y. C. Chan, K. C. Hung and Joseph K. L. Lai, “Comparative Study of Micro-BGA Reliability Under Bending Stress,” IEEE Transactions on Advanced Packaging, Vol. 23, No. 4, pp. 750-756, 2000. 16. S. H. Fan, Yan C. Chan and J. K. Lai, “Fatigue Lifetimes of PBGA Solder Joints Reflowed at Different Conveyor Speeds,” Journal of Electronic Packaging, Vol. 123, pp. 290-294, 2001. 17. S. H. Fan, Yan C. Chan, C. W. Tang and J. K. Lai, “Effect of Cooling Rate on the Isothermal Fatigue Behavior of CBGA Solder Joints in Shear,” IEEE Transactions on Advanced Packaging, Vol. 24, No. 1, pp. 10-16, 2001. 18. JEDEC JESD22-B117, ”BGA Ball Shear,” 2000 . 19. R. J. Coyle, P. P. Solan, A. J. Serafino and S. A. Gahr, “The Influence of Room Temperature Aginf on Ball Shear Strength and Microstructure of Area Array Solder Balls,” 2000 Electronic Components and Technology Conference. 20. C. H. Zhong and S. Yi, “Solder Joint Reliability of Plastic Ball Grid Array Packages,” Soldering & Surface Mount Technology, pp. 44-48, 1999. 21. J. K. Lin, A. D. Silva, D. Frear, Y. Guo, J. W. Jang, L. Li, D. Mitchell, B. Yeung and C. Zhang, “Characterization of Lead-Free Solders and Under Bump Metallurgies for Flip-Chip Package,” 2001 Electronic Components and Technology Conference. 22. A. Syed, “Reliability and Au Embrittlement of Lead Free Solders for BGA Applications,” International Symposium on Advanced Packaging Materials, pp. 143-147, 2001. 23. S. W. R. Lee and X. Huang, “Analysis on Solder Ball Shear Testing Conditions with a Simple Computational Model,” Soldering & Surface Mount Technology, pp. 45-48, 2002. 24. A. Schubert, H. Walter, R. Dudek, B. Michel, G. Lefranc, J. Otto and G. Mitic, “Thermo-Mechanical Properties and Creep Deformation of Lead-Containing and Lead-Free Solders,” International Symposium on Advanced Packaging Materials, pp. 129-134, 2001. 25. X. Q. Shi, Z. P. Wang, W. Zhou, H. L. J. Pang and Q. J. Yang, “A New Creep Constitutive Model for Eutectic Solder Alloy,” Journal of Electronic Packaging, Vol. 124, pp.85-90, 2002 26. M. Amagai, M. Watanabe, M. Omiya, K. Kishimoto and T. Shibuya, “Mechanical Characterization of Sn-Ag-based Lead-Free Solders,” Microelectronics Reliability, 42, pp. 951-966, 2002. 27. S. Kikuchi, M. Nishimura, K. Suetsugu, T. Ikari and K. Matsushige, “Strength of Bonding Interface in Lead-Free Sn Alloy Solders,” Materials Science and Engineering A, pp. 475-479, 2001. 28. M. Sakane and H. Yamamoto, “A Strain Rate Ratio Approach for Assessing Creep-Fatigue of 63Sn-37Pb Solder under Shear Loading,” Inter Society Conference on Thermal Phenomena, pp. 187-192, 2000. 29. C. H. Raeder, G. D. Schmeelk, D. Mitlin, T. Barbieri, W. Yang, L. F. Felton, R. W. Messlter, D. B. Knorr and D. Lee, “Isothermal Creep of Eutectic SnBi and SnAg Solder and Solder Joints,” IEEE/CPMT Int’l Electronics Manufacturing Technology Symposium, pp. 1-6, 1994. 30. M. Lu, Z. Qian, W. Ren, S. Liu and D. Shangguan, “Investigation of Electronic Packaging Materials by Using a 6-axis Mini Thermo-Mechanical Tester,” International Journal of Solids and Structure, 36, pp. 65-78, 1999. 31. John H. L. Pang, K. H. Tan, X. Shi and Z. P. Wang, “Thermal Cycling Aging Effects on Microstructural and Mechanical Properties of a Single PBGA Solder Joint Specimen,” IEEE Transactions on Components and Packaging Technologies, Vol. 24, No. 1, pp. 10-15, 2001. 32. S. H. Fan, Y. C. Chan, C. W. Tang and J. K. L. Lai, “Aging Studies of PBGA Solder Joints Reflowed at Different Conveyor Speeds,” IEEE Transactions on Advanced Packaging, Vol. 24, No. 4, pp. 486-492, 2001. 33. S. H. Fan, Y. C. Chan, X. C. Zou and Z. Q. Yu, “The Effect of Reflow Condition on the Characteristics of PBGA Solder Joint,” IEEE/CPMT Electronics Packaging Technology Conference, pp. 264-268, 1998. 34. Y. Guo, J. K. Lin and A. D. Silva, “Reliability Evalutions of Chip Interconnect in Lead-Free Solder Systems,” 2002 Electronics Components and Technology Conference, pp.1275-1280.. 35. JEDEC JESD22-B109, “Flip Chip Tensile Pull,” 2002. 36. X. Q. Shi, W. Zhou, H. L. J. Pang and Z. P. Wang, “Effect of Temperature and Strain Rate on Mechanical Properties of 63Sn/37Pb Solder Alloy,” Journal of Electronic Packaging, Vol. 121, pp. 179-185, 1999. 37. W. J. Plumbridge and C. R. Gagg, ” Effects of strain rate and temperature on the Stress-strain response of solder alloys,” Journal of Materials Science: Materials in Electronics, 10, pp. 461-468, 1999. 38. Ö. Ünal and J. C. Foley, “Effects of temperature and loading rate on the shear strength and shear yield stress of lead-free 97Cu-3Sn and 95.5Cu-4Sn-0.5Ag solder alloys,” Journal of Materials Science Letters, 20, pp. 1585 — 1587, 2001. 39. J. K. Chen, J. E. Beraun and D. Y. Tzou, “A Dual-Phase-Lag Diffusion Model for Predicting Intermetallic Compound Layer Growth in Solder Joints,” Journal of Electronic Packaging, Vol. 123, pp. 52-57, 2001. 40. C. E. Ho, S. Y. Tsai and C. R. Kao, ”Reaction of Solder With Ni/Au Metallization for Electronic Packages During Reflow Soldering,” IEEE Transactions on Advanced Packaging, Vol. 24, No. 4, pp. 493-498, 2001. 41. K. Y. Lee, M. Li, D. R. Olsen, W. T. Chen, B. T. C.Tan and S. Mhaisalkar, “Microstructure, Joint Strength and Failure Mechanism of Sn-Ag, Sn-Ag-Cu versus Sn-Pb-Ag Solders in BGA Packages,” IEEE Electronics Components and Technology Conference, 2001. 42. S. C. Hung, P. J. Zheng, S. C. Lee and J. J. Lee, “The Effect of Au Plating Thickness of BGA Substrates on Ball Shear Strength Under Reliability Tests,” IEEE/CPMT Int’l Electronics Manufacturing Technology Symposium, pp. 7-15, 1999. 43. H. Yang, P. Deane, P. Magill and K. L. Murty, “Creep Deformation of 96.5Sn-3.5Ag Solder Joints in a Flip Chip Package,” Electronic Components and Technology Conference, pp. 1136-1142, 1996. 44. S. Wiese, F. Feustel and E. Meusel, “Characterisation of Constitutive Behaviour of SnAg, SnAgCu and SnPb Solder in Flip Chip Joints,” Sensors and Actuators: A, pp. 188-193, 2002. 45. R. Darveaux and K. Banerji, “Constitutive Relations for Tin-Based Soldr Joints,” IEEE Transactions on Componets, Hybrids, and Manufacturing Technology, Vol. 15, No. 6, 1992. 46. M. L. Huang, L. Wang and C. M. L. Wu, “Creep Behavior of Eutectic Sn-Ag Lead-Free Solder Alloy,” Materials Research Society, pp. 2897-2903, 2002. 47. W. Ren, Z. Qian, M. Lu and S. Liu, “Investigation of a New Lead Free Solder Alloy Using Thin Strip Specimens,” Journal of Electronic Packaging, Vol. 121, pp. 271-274, 1999. 48. Rao R. Tummala, “Fundamentals of Microsystems Packaging,” McGraw Hill, 2001. 49. Glenn R. Blackwell, “The Electronic Packaging Handbook,” CRC Press LLC, 2000. 50. J. H. Lau, C. P. Wang, N-C. Lee and S. W. R. Lee, “Electronics Manufacturing with Lead-Free, Halogen-Free, and Conductive-Adhesive Materials,” McGraw Hill, 2003.
|