跳到主要內容

臺灣博碩士論文加值系統

(18.97.14.85) 您好!臺灣時間:2024/12/07 11:00
字體大小: 字級放大   字級縮小   預設字形  
回查詢結果 :::

詳目顯示

我願授權國圖
: 
twitterline
研究生:林佑撰
研究生(外文):Yu-Chuan Lin
論文名稱:BGA錫球接點的機械特性與數值模型
論文名稱(外文):The Mechanical Characteristics and the Corresponding Mathematical Model of the Solder Ball Joint in BGA
指導教授:葉銘泉葉銘泉引用關係
指導教授(外文):Ming-Chuen Yip
學位類別:碩士
校院名稱:國立清華大學
系所名稱:動力機械工程學系
學門:工程學門
學類:機械工程學類
論文種類:學術論文
論文出版年:2003
畢業學年度:91
語文別:中文
論文頁數:103
中文關鍵詞:錫球無鉛銲料剪力測試潛變黏彈塑性
外文關鍵詞:solder balllead-free soldershear testingcreepviscoelastic-plastic
相關次數:
  • 被引用被引用:1
  • 點閱點閱:400
  • 評分評分:
  • 下載下載:0
  • 收藏至我的研究室書目清單書目收藏:0
本論文探討BGA基板端錫球,在不同溫度條件與夾頭速率下的強度差異。主要針對96.5Sn/3.5Ag,進行包含潛變試驗的各項實驗,並建立相關的數值模型。除了利用不同成份的植球試片進行實驗,也透過切割實際PBGA商品,來探討其錫球接點強度可靠與否。各項實驗如:時效作用、強度因溫度/夾頭速率而異的關係、潛變模型、都透過實驗值的曲線嵌合來獲得,另外經由試片破壞面觀察也了解相關的破壞機制。
在時效實驗中,Sn-Pb錫球接點強度會隨時間不斷遞減,且破壞面會由撓性轉移至脆性,而無鉛試片的時效作用也會在某段時間後達到穩定,但破壞轉移現象並不明顯。透過不同陣列配置的試片之剪力測試,與單顆錫球接點的球剪實驗,可發現試片各接點的強度均勻性良好,實驗過程中無某顆錫球會先行斷裂。以單一方程式來描敘錫球接點在不同溫度與夾頭速率下的強度變化,所獲得的曲線嵌合效果頗佳;但低溫實驗結果數據不足,此方程式尚不能應用至低溫狀態。至於潛變試驗中,所建構的數學模型,不僅可大致嵌合所有的實驗值,且其中的n、Q值也合理獲得。

The mechanical characteristic of the solder ball joint on the board level of BGA was studied at certain conditions. The lead-free solder material of 96.5Sn/3.5Ag was chosen to undergo several experiments such as aging effect on strength, strength decaying by the temperature increasing, creep behavior on different temperature or applied loading. Some mathematical model was adopted or built up to fit the experimental data and the observation in the fracture surface by SEM was also proceeded to interpret the fracture mechanism.
By the way of applying some different array patterns to shear testing or operating the ball shear test on single solder ball, it could be concluded that the strength allotted to the solder array was uniform. On the aging test, the joint strength of 63Sn/37Pb solder ball decreased by the time passed, and the fracture surface transferred from ductility to brittle. It is significant of difference in strength influenced by different temperature or loading rate and one experimental model was obtained in fitting all the data in good agreement. As to the aspect of creep, one reasonable value of stress exponent (n) or activation energy (Q) was settled on the modified Arrhenius-type power law.

一.導論…………………………………………………………………1
二.研究動機……………………………………………………………4
三.文獻回顧
3.1材料組成………………………………………………………6
3.2尺度與形狀……………………………………………………8
3.3 迴銲過程……………………..……………………………….9
3.4 測試方法……………………………..………………………11
3.5 錫球接點觀察與微結構分析……………..…………………13
四.相關黏彈/塑性理論與數值模型
4.1不同負載速率及溫度對銲錫強度的影響……………………15
4.2潛變行為………………………………………………………17
五.研究方法
5.1 試片製作…………………………………………………..…22
5.2 儀器設備……………………………………………………..24
5.3 測試方法…………………………………………………..…26
六.實驗數據結果
6. 1 63Sn/37Pb、96.5Sn/3.5Ag的剪力強度受時效影響之結果..29
6.2 不同溫度/夾頭速率下Sn-Ag的剪力強度差異與數值模型..31
6.3 96.5Sn/3.5Ag受剪力作用下的潛變行為與數值模型…….…34
6.4 固定夾頭速率下Sn-Pb剪力強度在不同溫度間的差異……35
6.5不同無鉛材料間的剪力強度差異…………………………….36
6.6 不同陣列下的剪力強度差異……………..……………..…...38
6.7 PBGA剪力強度受時效影響之結果…………....…….……...39
6.8固定夾頭速率下PBGA剪力強度在不同溫度下的差異……40
6.9不同夾頭速率下拉力和剪力強度的差異…………..…….…..42
七.結果與未來展望…………………………………………………….44
參考文獻
附表
附圖

1. M. Abtew and G. Selvaduray, “Lead-free Solders in Microelectronics,” Materials Science and Engineering Reports: A Review Journal, 27, pp. 95-141, 2000.
2. A. Z. Miric and A. Grusd, “Lead-free alloys,” Soldering & Surface Mount Technology, pp. 19-25, 1998.
3. N. C. Lee, “Getting Ready for Lead-free Solders,” Soldering & Surface Mount Technology, Vol. 9, No. 2, pp. 65-69, 1997.
4. L. L. Mercado, V. Sarihan, Y. Guo and A. Mawer, “Impact of Solder Pad Size on Solder Joint Reliability in Flip Chip PBGA Packages,” IEEE Transactions on Advanced Packaging, Vol. 23, No. 3, pp. 415-420, 2000.
5. C. H. Lee, S. G. Lee and B. H. Moon, “Comparison of the Shear Strength and Reliability between Gold-Plated and Bare Copper Lands of a BGA Package,” IEEE Electronics Packaging Technology Conference, pp. 1103-1108, 1998.
6. C. H. Zhong, S. Yi and D. C. Whalley, “Solder Ball Failure Mechanismx in Plastic Ball Grid Array Packages,” Soldering & Surface Mount Technology, pp. 40-50, 2002.
7. F. P. Renken and G. Subbarayan, “A Two-Body Formulation for Solder Joint Shape Predition,” Journal of Electronic Packaging, Vol. 120, pp. 302-308, 1998.
8. J. Cai, S. Law, A. Teng and P. C. H. Chan, “Influences of Pad Shape and Solder Microstructure on Shear Force of Low Cost Flip Chip Bumps,” Int’l Symp on Electronic Materials & Packaging, pp. 91-98, 2000.
9. Y. P. Wu, P. L. Tu and Y. C. Chan, “The Effect of Solder Paste Volume and Reflow Ambient Atmosphere on Reliability of CBGA Assemblies,” Journal of Electronic Packaging, Vol. 123, pp. 284-289, 2001.
10. Y. P. Wu, Yan C. Chan and J. K. Lai, “Reliability Studies of Plastic Ball Grid Array Assemblies Reflowed in Nitrogen Ambient,” IEEE Electronics Components and Technology Conference, pp. 292-296, 1998.
11. N. C. Lee, “Optimizing the Reflow Profile via Defect Mechanism Analysis,” Soldering & Surface Mount Technology, pp. 13-20, 1999.
12. C. Mi. Garner, V. Gupta, V. Bissessur, A. Kumar and R. Aspandiar, “Challenges in Converting to Lead-free Electronics,” IEEE Electronics Packaging Technology Conference, pp. 6-9, 2000.
13. IPC/JEDEC J-STD-020B, “Moisture/Reflow Sensitivity Classification for Nonhermetic Solid State Surface Mount Devices,” 2002.
14. Y. C. Chan, P. L. Tu, C. W. Tang, K. C. Hung and Joseph K. L. Lai, “Reliability Studies of μBGA Solder Joints─Effect of Ni—Sn Intermetallic Compound,” IEEE Transactions on Advanced Packaging, Vol. 24, No. 1, pp. 25-32, 2001.
15. P. L. Tu, Y. C. Chan, K. C. Hung and Joseph K. L. Lai, “Comparative Study of Micro-BGA Reliability Under Bending Stress,” IEEE Transactions on Advanced Packaging, Vol. 23, No. 4, pp. 750-756, 2000.
16. S. H. Fan, Yan C. Chan and J. K. Lai, “Fatigue Lifetimes of PBGA Solder Joints Reflowed at Different Conveyor Speeds,” Journal of Electronic Packaging, Vol. 123, pp. 290-294, 2001.
17. S. H. Fan, Yan C. Chan, C. W. Tang and J. K. Lai, “Effect of Cooling Rate on the Isothermal Fatigue Behavior of CBGA Solder Joints in Shear,” IEEE Transactions on Advanced Packaging, Vol. 24, No. 1, pp. 10-16, 2001.
18. JEDEC JESD22-B117, ”BGA Ball Shear,” 2000 .
19. R. J. Coyle, P. P. Solan, A. J. Serafino and S. A. Gahr, “The Influence of Room Temperature Aginf on Ball Shear Strength and Microstructure of Area Array Solder Balls,” 2000 Electronic Components and Technology Conference.
20. C. H. Zhong and S. Yi, “Solder Joint Reliability of Plastic Ball Grid Array Packages,” Soldering & Surface Mount Technology, pp. 44-48, 1999.
21. J. K. Lin, A. D. Silva, D. Frear, Y. Guo, J. W. Jang, L. Li, D. Mitchell, B. Yeung and C. Zhang, “Characterization of Lead-Free Solders and Under Bump Metallurgies for Flip-Chip Package,” 2001 Electronic Components and Technology Conference.
22. A. Syed, “Reliability and Au Embrittlement of Lead Free Solders for BGA Applications,” International Symposium on Advanced Packaging Materials, pp. 143-147, 2001.
23. S. W. R. Lee and X. Huang, “Analysis on Solder Ball Shear Testing Conditions with a Simple Computational Model,” Soldering & Surface Mount Technology, pp. 45-48, 2002.
24. A. Schubert, H. Walter, R. Dudek, B. Michel, G. Lefranc, J. Otto and G. Mitic, “Thermo-Mechanical Properties and Creep Deformation of Lead-Containing and Lead-Free Solders,” International Symposium on Advanced Packaging Materials, pp. 129-134, 2001.
25. X. Q. Shi, Z. P. Wang, W. Zhou, H. L. J. Pang and Q. J. Yang, “A New Creep Constitutive Model for Eutectic Solder Alloy,” Journal of Electronic Packaging, Vol. 124, pp.85-90, 2002
26. M. Amagai, M. Watanabe, M. Omiya, K. Kishimoto and T. Shibuya, “Mechanical Characterization of Sn-Ag-based Lead-Free Solders,” Microelectronics Reliability, 42, pp. 951-966, 2002.
27. S. Kikuchi, M. Nishimura, K. Suetsugu, T. Ikari and K. Matsushige, “Strength of Bonding Interface in Lead-Free Sn Alloy Solders,” Materials Science and Engineering A, pp. 475-479, 2001.
28. M. Sakane and H. Yamamoto, “A Strain Rate Ratio Approach for Assessing Creep-Fatigue of 63Sn-37Pb Solder under Shear Loading,” Inter Society Conference on Thermal Phenomena, pp. 187-192, 2000.
29. C. H. Raeder, G. D. Schmeelk, D. Mitlin, T. Barbieri, W. Yang, L. F. Felton, R. W. Messlter, D. B. Knorr and D. Lee, “Isothermal Creep of Eutectic SnBi and SnAg Solder and Solder Joints,” IEEE/CPMT Int’l Electronics Manufacturing Technology Symposium, pp. 1-6, 1994.
30. M. Lu, Z. Qian, W. Ren, S. Liu and D. Shangguan, “Investigation of Electronic Packaging Materials by Using a 6-axis Mini Thermo-Mechanical Tester,” International Journal of Solids and Structure, 36, pp. 65-78, 1999.
31. John H. L. Pang, K. H. Tan, X. Shi and Z. P. Wang, “Thermal Cycling Aging Effects on Microstructural and Mechanical Properties of a Single PBGA Solder Joint Specimen,” IEEE Transactions on Components and Packaging Technologies, Vol. 24, No. 1, pp. 10-15, 2001.
32. S. H. Fan, Y. C. Chan, C. W. Tang and J. K. L. Lai, “Aging Studies of PBGA Solder Joints Reflowed at Different Conveyor Speeds,” IEEE Transactions on Advanced Packaging, Vol. 24, No. 4, pp. 486-492, 2001.
33. S. H. Fan, Y. C. Chan, X. C. Zou and Z. Q. Yu, “The Effect of Reflow Condition on the Characteristics of PBGA Solder Joint,” IEEE/CPMT Electronics Packaging Technology Conference, pp. 264-268, 1998.
34. Y. Guo, J. K. Lin and A. D. Silva, “Reliability Evalutions of Chip Interconnect in Lead-Free Solder Systems,” 2002 Electronics Components and Technology Conference, pp.1275-1280..
35. JEDEC JESD22-B109, “Flip Chip Tensile Pull,” 2002.
36. X. Q. Shi, W. Zhou, H. L. J. Pang and Z. P. Wang, “Effect of Temperature and Strain Rate on Mechanical Properties of 63Sn/37Pb Solder Alloy,” Journal of Electronic Packaging, Vol. 121, pp. 179-185, 1999.
37. W. J. Plumbridge and C. R. Gagg, ” Effects of strain rate and temperature on the
Stress-strain response of solder alloys,” Journal of Materials Science: Materials in Electronics, 10, pp. 461-468, 1999.
38. Ö. Ünal and J. C. Foley, “Effects of temperature and loading rate on the shear strength and shear yield stress of lead-free 97Cu-3Sn and 95.5Cu-4Sn-0.5Ag solder alloys,” Journal of Materials Science Letters, 20, pp. 1585 — 1587, 2001.
39. J. K. Chen, J. E. Beraun and D. Y. Tzou, “A Dual-Phase-Lag Diffusion Model for Predicting Intermetallic Compound Layer Growth in Solder Joints,” Journal of Electronic Packaging, Vol. 123, pp. 52-57, 2001.
40. C. E. Ho, S. Y. Tsai and C. R. Kao, ”Reaction of Solder With Ni/Au Metallization for Electronic Packages During Reflow Soldering,” IEEE Transactions on Advanced Packaging, Vol. 24, No. 4, pp. 493-498, 2001.
41. K. Y. Lee, M. Li, D. R. Olsen, W. T. Chen, B. T. C.Tan and S. Mhaisalkar, “Microstructure, Joint Strength and Failure Mechanism of Sn-Ag, Sn-Ag-Cu versus Sn-Pb-Ag Solders in BGA Packages,” IEEE Electronics Components and Technology Conference, 2001.
42. S. C. Hung, P. J. Zheng, S. C. Lee and J. J. Lee, “The Effect of Au Plating Thickness of BGA Substrates on Ball Shear Strength Under Reliability Tests,” IEEE/CPMT Int’l Electronics Manufacturing Technology Symposium, pp. 7-15, 1999.
43. H. Yang, P. Deane, P. Magill and K. L. Murty, “Creep Deformation of 96.5Sn-3.5Ag Solder Joints in a Flip Chip Package,” Electronic Components and Technology Conference, pp. 1136-1142, 1996.
44. S. Wiese, F. Feustel and E. Meusel, “Characterisation of Constitutive Behaviour of SnAg, SnAgCu and SnPb Solder in Flip Chip Joints,” Sensors and Actuators: A, pp. 188-193, 2002.
45. R. Darveaux and K. Banerji, “Constitutive Relations for Tin-Based Soldr Joints,” IEEE Transactions on Componets, Hybrids, and Manufacturing Technology, Vol. 15, No. 6, 1992.
46. M. L. Huang, L. Wang and C. M. L. Wu, “Creep Behavior of Eutectic Sn-Ag Lead-Free Solder Alloy,” Materials Research Society, pp. 2897-2903, 2002.
47. W. Ren, Z. Qian, M. Lu and S. Liu, “Investigation of a New Lead Free Solder Alloy Using Thin Strip Specimens,” Journal of Electronic Packaging, Vol. 121, pp. 271-274, 1999.
48. Rao R. Tummala, “Fundamentals of Microsystems Packaging,” McGraw Hill, 2001.
49. Glenn R. Blackwell, “The Electronic Packaging Handbook,” CRC Press LLC, 2000.
50. J. H. Lau, C. P. Wang, N-C. Lee and S. W. R. Lee, “Electronics Manufacturing with Lead-Free, Halogen-Free, and Conductive-Adhesive Materials,” McGraw Hill, 2003.
QRCODE
 
 
 
 
 
                                                                                                                                                                                                                                                                                                                                                                                                               
第一頁 上一頁 下一頁 最後一頁 top