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研究生:郭國君
研究生(外文):Kuo-Chun Kuo
論文名稱:適用於超大型積體電路虛擬窮蒐測試法之加強式樹狀結構掃描串鏈架構分析與研究
論文名稱(外文):An Enhanced Tree-Structured Scan Chain for Pseudo-Exhaustive Testing of VLSI Circuits
指導教授:饒建奇
指導教授(外文):Jiann-Chi Rau
學位類別:碩士
校院名稱:淡江大學
系所名稱:電機工程學系
學門:工程學門
學類:電資工程學類
論文種類:學術論文
論文出版年:2003
畢業學年度:91
語文別:中文
論文頁數:55
中文關鍵詞:鑲入式自我測試虛擬窮蒐測試線性回授位移暫存器線性回授位移暫存器/掃描暫存器樹狀線性回授位移暫存器/掃描暫存器加強式樹狀掃描串鏈
外文關鍵詞:BISTPseudo-exhaustive testingLFSRLFSR/SRTLSEnhanced tree-structured scan chain
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隨著IC設計製程及技術的進步,電路的設計也就隨著功能的強大而需要相對多的輸入腳位。然而不論是組合或是序相電路,在電路設計的測試階段中,因輸入腳位的增加而導致所需的詳盡測試測試向量也隨著大量增加。在許多的測試策略中,虛擬窮蒐測試所需的測試向量遠小於傳統的窮蒐測試策略,以致所需的測試時間可以大幅的降低,所以許多的測試方法及結構已提出,來實行虛擬窮蒐測試策略。在這些方法及測試架構中,線性回授位移暫存器是一種相當受歡迎的測試向量產生器,其產生電路測試時所需的窮蒐虛擬隨機測試向量。儘管這些策略及架構應用線性回授位移暫存器來產生電路測試時所需的測試向量可以大幅的減少測試週期,無效測試向量的問題仍須被再次探討。為了要避開這些無效的測試向量,新的測試方法必須被提出來解決這個問題。此外,在線性回授位移暫存器中,給予不同的種子將會導致不同的測試結果,這些結果和影響也將會在本論文中提出來討論。基於種子選擇的觀念,一種加強式樹狀架構掃描串鍊架構的提出試圖克服無效測試向量的問題。這種加強式樹狀架構掃描串鍊的架構將配合著原先的測試架構,使得整這測試的過程分成兩個階段。在第一個階段,原有的架構用於測試大部分可测的錯誤。在第二個階段時,此加強式樹狀架構掃描串鍊架構用來偵測剩下的可测的錯誤。藉由此種測試策略,我們可以有效的避免這些無效測試向量且進而在縮短測試所需要的時間及功率。此外,在本論文中,我們亦定義一個建議停止點的計算方法用於分辨兩種測試結構所需執行的臨界週期。
As the number of input pins of a circuit grows with the technique, the requirement of the test patterns for a circuit, no matter combinational or sequential circuits, to obtain the fault coverage over some confidence level is much more than before in the test stage. Since the test pattern requirement of a pseudo-exhaustive testing is fewer than the traditional exhaustive testing, many strategies and architectures have been proposed to implement the pseudo-exhaustive testing.
Among these approaches and architectures, linear feedback shift register (LFSR) is the most popular test pattern generator to produce the exhaustive pseudo-random test patterns in the built-in self-test (BIST) environment. Although these methods and structures employing LFSR to generate the exhaustive pseudo-random test patterns could successfully cut down the test time, the same problem of “invalid test patterns” should still be considered. The “invalid test patterns” are those cannot detect new testable faults in the entire test process. To avoid the invalid test patterns, it requires new strategy to solve this problem.
Since different seeds of the LFSR dominate different simulation results, seed selection is not arbitrary any more. The influences and some phenomenon that caused by the seed selection are first presented to explain the proposed idea. Based on the concept of the seed selection, the enhanced tree-structured scan chain is proposed to try to avoid the “invalid test patterns”. Combining with the original test architecture, the entire test process becomes two epochs. In the first epoch, the original test structure is employed to detect most testable faults. And in the second phase, the proposed enhanced tree-structured scan chain is performed to detect the remaining ones. By this strategy, we can effectively avoid those “invalid test patterns” and save total test time and power. Besides, a suggestive threshold stop point for new strategy, which tries to identify the threshold cycle, is also defined in this thesis.
ABSTRACT I
CONTENTS IV
CONTENTS OF FIGURES AND TABLES V
Chapter 1 Introduction 1
1.1 Built-In Self-Test (BIST) 1
1.2 Motivation 6
Chapter 2 Background for Enhanced Tree-Structured Scan Chain 10
2.1 Strategies for BIST 10
2.1.1 Exhaustive testing vs. pseudo-exhaustive testing 11
2.1.2 Partitioning for pseudo-exhaustive testing 12
2.2 LFSR and LFSR/SR 15
2.3 Tree-LFSR/SR (TLS) 18
2.3.1 Backbone Generation 19
2.3.2 Tree Growing 21
2.3.3 XOR-Tree Generation 23
Chapter 3 Seed Selection 26
Chapter 4 The Enhanced Tree-Structured Scan Chain 32
4.1 Configuration of the Enhanced Tree-Structured Scan Chain 33
4.2 Architecture analysis 39
4.2.1 Branch connecting selections 39
4.2.2 Stuck-at value implementation 43
4.3 Simulation Results 45
Chapter 5 Conclusions 50
5.1 Summary 50
5.2 Future works 51
BIOBLIOGRAPHY 52
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