(3.227.208.0) 您好!臺灣時間:2021/04/21 01:57
字體大小: 字級放大   字級縮小   預設字形  
回查詢結果

詳目顯示:::

我願授權國圖
: 
twitterline
研究生:陳慧雯
研究生(外文):Hui-Wen Chen
論文名稱:貝氏方法應用於計量型戴明檢驗模式之研究
論文名稱(外文):Bayesian Analysis of Deming''s Inspection Model using Variables Sampling
指導教授:徐旭昇徐旭昇引用關係
指導教授(外文):Chiuh-Cheng Chuy
學位類別:碩士
校院名稱:元智大學
系所名稱:工業工程與管理學系
學門:工程學門
學類:工業工程學類
論文種類:學術論文
論文出版年:2003
畢業學年度:91
語文別:中文
論文頁數:99
中文關鍵詞:貝氏決策方法計量型抽樣檢驗計劃計數型抽樣檢驗計劃
外文關鍵詞:Bayesian Decision AnalysisSampling Plan by VariablesSampling Plan by Attriables
相關次數:
  • 被引用被引用:4
  • 點閱點閱:154
  • 評分評分:系統版面圖檔系統版面圖檔系統版面圖檔系統版面圖檔系統版面圖檔
  • 下載下載:0
  • 收藏至我的研究室書目清單書目收藏:0
本論文旨在提供製造商計量模式適用於其產品屬於可拆解再裝配狀況時,該如何進行進料抽樣檢驗及如何選擇組件供應商。針對兩種組件規格(1)雙邊規格及(2)單向規格,就戴明成本模式發展貝氏計量型檢驗計劃。研究模式假設情況是依據資料的分析,在雙邊規格限制下,可以假設組件功能值為常態分配但期望值未確定;而單向規格則假設功能值為指數分配同時期望值亦未確定。模式成本考慮的範圍涵蓋組件之檢驗成本、不良品所發生之額外檢驗成本及其所導致產品失效成本,而以最小期望成本為目標。以辛普森3/8法則來計算數學模式中之積分值,利用二分法求算出最小期望損失成本,並以Visual Basic語言撰寫程式來執行模式之數學運算。在相同假設條件下比較戴明模式在以貝式方法計算計量型與計數型,與傳統方法計算計數型三種情況作比較。結果發現,貝式計量型之成本與抽樣數皆比貝式計數型來得低,同時兩者之成本皆比傳統方法計算計數型來得低。最後,本研究對模式之相關參數諸如檢驗成本、驗前分配、與批量大小做敏感度分析。
This thesis studies a sampling inspection model discussed by Deming that can be applied to a situation where the quality characteristic measurement of items is on a continuous scale. In previous studies the model was discussed on the case of attributes sampling plan; i.e., sampling information is concerning the number of items being conforming or nonconforming. This study develops a variable sampling plan under the framework of Deming’s model using Bayesian approach with the objective to minimize the Bayes’ risk. We first derive the model from a general point of view and then discuss the model for two particular cases: one is double-sided specification limits with component performance assumed to be normal distribution and the other is single-sided specification limit with exponential distribution. For both cases the unknown parameter is mean. The models by attributes for both cases under the same probability model and cost structure are also derived and analyzed. In the numerical result we find that the sampling model by variables needs less samples and produces less cost than the model by attributes. We also conclude that the expected total cost of the model is smaller under Bayesian approach as compared to directly applying the Deming’s rule with classical approach. Finally, a sensitivity analysis on an example is presented in order to realize the effects of model parameters such as inspection cost, prior distribution, and lot size on the total cost and the optimal sample size of the problem.
目錄
中文摘要 VI
英文摘要 VII
致謝 VIII
目錄 IX
表目錄 XII
圖目錄 XIII
一、 緒論 1
1.1研究背景與動機 1
1.2研究目的 3
1.3論文架構 3
二、 文獻回顧 5
三、 研究模式 12
3.1問題簡介 12
3.2變數符號說明 13
3.3檢驗之決策問題 14
3.4戴明模式抽樣檢驗模式 17
3.4.1計量型檢驗模式 17
3.4.2計數型檢驗模式 19
3.5組件功能值屬雙邊規格 21
3.5.1計量型檢驗模式 21
3.5.2計數型檢驗模式 24
3.6組件功能值屬單向規格 26
3.6.1計量型檢驗模式 26
3.6.2計數型檢驗模式 29
3.7傳統抽樣檢驗計劃 30
四、 實驗結果與分析 33
4.1計量型成本決策模式之解算 33
4.2組件功能值屬雙邊規格 之參數分析 34
4.2.1抽樣數對期望損失成本與決策之影響 34
4.2.2組件品質對期望損失成本與決策之影響 35
4.2.3檢驗成本 對期望損失成本與決策之影響 38
4.2.4組件規格量測值期望值 之期望值固定、變異數改變,對期望損失成本與決策之影響 40
4.2.5計量型、計數型與傳統方法之比較對於期望損失成本與決策之影響 42
4.3組件功能值屬單向規格 之參數分析 44
4.3.1組件品質對期望損失成本與決策之影響 44
4.3.2檢驗成本 對期望損失成本與決策之影響 47
4.3.3組件規格對期望損失成本與決策之影響 48
4.3.4計量型、計數型與傳統方法之比較對於期望損失成本與決策之影響 50
五、 結論 52
參考文獻 54
附錄一 56
附錄二 59
附錄三 61
附錄四 69
附錄五 71
附錄六 81
參 考 文 獻
1. Anderson, M. T., B. S. Greenberg and S. L. Stokes,” Acceptance Sampling With Rectification When Inspection Errors Are Present,” Journal of Quality Technology, Vol. 33, No. 4, pp.493-505, 2001.
2. Barlow, R. E. and X. Zhang,” A Critique of Deming’s Discussion of Acceptance Sampling Procedure,” In: A.P. Basu, Ed., Reliability and Quality and Control, North-Holland, Amsterdam, pp21-32, 1986.
3. Barlow, R. E. and X. Zhang,” Bayesian Analysis of Inspection Sampling Procedures Discussed by Deming,” Journal of Statistical Planning and Inference, Vol.16, North-Holland, 1987.
4. Burke, R. J., D.D. Robert and F.C. Kaminsky,” The (k1, k2) game,” Quality Progress, Vol. 26, No. 2, pp.49-53, 1993.
5. Deming, W. E.,” Quality, Productivity, and Competitive Position,” Massachusetts Institute of Technology, Center for Advanced Engineering Study, Cambridge, MA, 1982.
6. Kaminsky, F. C. and K. R. Haberle,” Probability Distributions for the Deming Cost Models,” Journal of Quality Technology, Vol. 27, No. 4, pp.355-362, 1995.
7. Lam, Y. and C. V. Lam,” Bayesian double-sampling plans with normal distributions,” The Statistician, Vol. 46, No. 2, pp.193-207, 1997.
8. Lorenzen, T. J.,“ Minimum Cost Sampling Plan Using Bayesian Methods,” Naval Research Logistics Quarterly, Vol. 32, No. 1, pp.57-69, 1985.
9. Moskowitz, H. and K. Tang,” Bayesian Variables Acceptance- Sampling Plans: Quadratic Loss Function and Step-Loss Function,” Technometrics, Vol. 34, No. 3, pp. 340-347, 1992
10. Papadakis, E. P.,” The Deming Inspection Criterion for Choosing Zero or 100 Percent Inspection,” Journal of Quality Technology, Vol. 17, No. 3, pp.121-127, 1985.
11. Rigdon, S. E.,” Mood’s Theorem, Deming’s kp Rule, and The Death of Acceptance Sampling,” Quality Engineering, Vol. 8, No. 1, pp.129-136, 1995
12. Shachter, R. D., ” Evaluating Influence Diagrams,” Operations Research, Vol. 34, pp.871-882, 1986.
13. Sheil, J.,” Towards economically optimal first-off inspection,” European Journal of Operational Research, Vol. 94, pp.179-185, 1996.
14. Vander Wiel, S. A. and S. B. Vardeman,” A Discussion of All-or-None Inspection Policies,” Technometrics, Vol. 36, No. 1, pp.102-109, 1994
15. 林鴻欽,「貝氏檢驗計劃之設計」,元智大學工業工程研究所碩士論文,1992年6月。
16. 林世偉,「不可修復產品原料供應商之選擇─貝氏決策模式」,元智大學工業工程研究所碩士論文,1998年6月。
17. 徐旭昇,「可拆解再裝配產品之貝氏檢驗模式」,Journal of the Chinese Institute of Industrial Engineers, Vol. 16, No.2, pp.195-207, 1999。
18. 邵嘉瑀,「變異數不確定下計量型戴明抽樣檢驗模式之貝氏分析」,元智大學工業工程研究所碩士論文,2002年6月。
QRCODE
 
 
 
 
 
                                                                                                                                                                                                                                                                                                                                                                                                               
第一頁 上一頁 下一頁 最後一頁 top
系統版面圖檔 系統版面圖檔