跳到主要內容

臺灣博碩士論文加值系統

(44.220.247.152) 您好!臺灣時間:2024/09/16 22:13
字體大小: 字級放大   字級縮小   預設字形  
回查詢結果 :::

詳目顯示

: 
twitterline
研究生:梁家倫
研究生(外文):Chia-Lun Liang
論文名稱:微鏡面元件致動面之殘留應力的量測
論文名稱(外文):Residual Stress Measurement of Actuating Plane in Micromirror
指導教授:黃豐元黃豐元引用關係
指導教授(外文):Fuang-Yuan Huang
學位類別:碩士
校院名稱:國立中央大學
系所名稱:機械工程研究所
學門:工程學門
學類:機械工程學類
論文種類:學術論文
論文出版年:2004
畢業學年度:92
語文別:中文
論文頁數:74
中文關鍵詞:殘留應力微鏡面微機電
外文關鍵詞:MEMSMicromirrorXRDResidual Stress
相關次數:
  • 被引用被引用:0
  • 點閱點閱:229
  • 評分評分:
  • 下載下載:21
  • 收藏至我的研究室書目清單書目收藏:0
摘 要
在微鏡面元件致動面之殘留應力的量測研究中,為了使沉積材料達到堅韌之特性,故選擇以摻雜氮的鋁薄膜來作為微鏡面致動器之鉸鍊材料。在製程方面,以反應式濺鍍法來沉積、製作支撐柱及鉸鍊材料,藉此來改善選擇性鎢沉積後,薄膜會被氫氟酸所蝕刻的問題,並藉由調整沉積時之功率和氮氣流量的比例,來探討不同氮含量的氮化鋁(AlN)薄膜其材料性質之變化,包括薄膜所產生之熱應力、片電阻值及剛性等。
此外,為瞭解AlN薄膜之組成成分、晶格間距,以X光粉末繞射分析儀來分析試片薄膜的相結構,藉由元件在釋放犧牲層前、後所測得之晶格間距,推算出薄膜所產生之殘留應力值,探討其製程參數所造成之影響。以氮氣流量20%的薄膜沉積參數來作為殘留應力量測的結果中,以1000W的電漿功率下可產生一張應力,可供元件具彎曲後回復之力,以此作為製程之依據。
Abstract
In this study, in order to make the material reaching qualities of strength and toughness, so select aluminum nitride to do the hinge of micromirror actuator. In fabrication produce, to deposition and manufacture the contact holes and hinges by reactive sputtering deposition. By this way can improve the problem of membranes etched by hydrofluoric acid after selectivity tungsten deposition. To adjust deposition power and nitrogen flow rate also can confer the change in characters of aluminum nitride membranes for different nitrogen flow rate, including the thermal stresses, sheet resistances, and hardness that cased by membrane.
Furthermore, in order to understand the compose components, and lattice space in aluminum nitride membranes, used the X-ray powder diffractometer to analyze the phase structure in membranes. Employing the lattice space that measured in front and behind of sacrifical layer released, could calculate the residual stress value that cased from membrane, investigating the influences to fabrication process. And we could get that a twenty percent nitrogen flow and 1500 watts plasma power would cause a tensile force in actuating plane material.
目 錄
摘要……………………………………………………………………Ⅰ
目錄……………………………………………………………………Ⅱ
表目錄…………………………………………………………………Ⅳ
圖目錄…………………………………………………………………Ⅴ
第一章 緒論………………………………………………………1
1.1 前言………………………………………………………1
1.2 數位微鏡面元件(DMD)……………………………… 3
1.3 研究動機與目的…………………………………………7
第二章 實驗儀器設備與原理……………………………………9
2.1 實驗儀器簡介……………………………………………9
2.2 反應式濺鍍法原理簡介…………………………………17
2.3 奈米壓痕量測系統基本架構……………………………20
2.4 X光繞射原理…………………………………………… 23
2.4.1 X光繞射基本原理……………………………… 23
2.4.2 X光繞射法於殘留應力檢測之理論…………… 25
第三章 微鏡面懸浮結構製作與實驗方法………………………28
3.1 微鏡面懸浮結構製作……………………………………28
3.1.1 元件製作流程……………………………………30
3.1.2 製程參數設定……………………………………35
3.2 金屬薄膜材料分析參數之訂定…………………………40
3.3 微鏡面元件機械性質分析………………………………42
3.4 XRD懸浮鏡面材料結構分析…………………………… 44
第四章 實驗結果與討論…………………………………………46
4.1 多晶矽摻雜之電阻率結果分析…………………………46
4.2 影響微鏡面元件製作之因素與結果……………………48
4.2.1 元件製作結果……………………………………48
4.2.2 犧牲層去除之蝕刻液選擇………………………49
4.2.3 支撐柱蝕刻率測試………………………………52
4.3 金屬薄膜材料分析結果…………………………………55
4.4 XRD殘留應力分析結果………………………………… 60
第五章 結論………………………………………………………69
參考文獻………………………………………………………………71
參 考 文 獻
[1]Marc Madou, Fundametals of Microfabrication, 1997, CRC Press LLC, USA.
[2]Gregory T.A Kovacs, Micromachined Transducers Sourcebook, 1998, McGraw-Hill, USA.
[3]J. M. Younse, “Mirrors on a Chip”, IEEE Spectrum (1993), pp.27-31.
[4]S. Kurth, R. Hahn, C. Kanfmann, K. Kehr, J. Mehner, V. Wollmann, W. Dotzel, T. Gessner, “Silicon Mirrors and Micromirror Arrays for Spatial Laser Beam Modulation”, Sensors and Actuators A, Vol. 66 (1998), pp.76-82.
[5]H. Toshiyoshi, H. Fujita, “Electrostatic Microtorsion Mirrors for an Optical Switch Matrix”, Journal of Microelectromechanical System, Vol. 5, No. 4 (1996), pp.231-237.
[6]S. Kurth and W. Dotzel, “Experimental Adaption of Model Parameters for Microelectromechanical Systems (MEMS)”, Sensors and Actuators A, Vol. 62 (1997), pp.760-764.
[7]Seok-Whan Chung, Jong-Woo Shin, Yong-Kweon Kim, and Bong-Soo Han, “Design and Fabrication of Micromirror Supported by Electroplated Nickel Posts”, Sensors and Actuators A, Vol. 54 (1996), pp.464-467.
[8]L.J. Hornbeck, “Digital Light Processing and MEMS:Timely Convergence for a Bright Future”, Plenary Session, SPIE Micromachining and Microfabrication Instruments Digital Imaging Group, 214-995-2426.
[9]G. Hewlett and W. Wemer, “Analysis of Electronic Cinema Projection with the Texas Instruments Digital Micromirror DeviceTM Display System”, Proceedings of the 137th Society of Motion Picture and Television Engineers Technical Conference, September 1995.
[10]Richard Gale, “Principles and Applications of the Digital Micromirror Device in Projection Displays”, Lasers and Electro Optics Society 1999 12th Annual Meeting. LEOS ’99. IEEE, Vol. 1, pp.212-213.
[11]R.J.T. Bunyan, D.O. King, R.A. Wilson, and A.M. Scott, “Design, Modeling and Evaluation of Micromirrors”, Microengineering, Modelling and Design (Ref. No. 1999/052), IEE Seminar on (1999), pp.3/1-3/3.
[12]Jinghong Chen and Sung-Mo(Steve) Kang, “Dynamic Macromodeling of MEMS Mirror Device”, IEDM (2001), pp.925-928.
[13]Johannes Buhler, Jorg Funk, Jan G. Korvink, Franz-Peter Steiner, Pasqualina M. Sarro, and Henry Baltes, “Electrostatic Aluminum Micromirrors Using Double-Pass Metallization”, Journal of Microelectromechanical System, Vol. 6, No. 2, June (1997), pp.126-135.
[14]M.R. Douglass, “Lifetime Estimates and Unique Failure Mechanisms of the Digital Micromirror Device (DMD)”, Reliability Physics Symposium Proceedings, 1998, 36th Annual. 1998, IEEE International, 31 March-2 April (1998), pp.9-16.
[15]Andrew B. Sontheimer, “Digital Micromirror Device(DMD) Hinge Memory Lifetime Reliability Modeling”, Reliability Physics Symposium Proceedings, 2002, 40th Annual, 2002, IEEE Internationalb (2002), pp.118-121.
[16]Gary A Feather, “The Digital Micromirror Device for Projection Display”, IEEE Scssion 2:Application (1995), pp.43-51.
[17]丁志華、蕭鉉樺、陳勇志、潘扶民、貢中元,“懸浮結構鉸鏈材料之研製”,奈米通訊第十卷第一期。
[18]Sabina Gredelj, Andrea R. Gerson, Sunil Kumar, Giuseppe P. Cavallaro, “Characterization of Aluminium Surfaces with and without Plasma Nitriding by X-ray Photoelectron Spectroscopy”, Applied Surface Science 174 (2001), pp.240-250.
[19]莊達人,VLSI製造技術,2004年四版,高立出版社。
[20]Kiyotaka Wasa, Shigeru Hayakawa, Handbook of Sputter Deposition Technology, 1992, Noyer Publication, USA.
[21]丁志華、管正平、黃新言、戴寶通,“奈米壓痕量測系統簡介”,奈米通訊第九卷第三期。
[22]許樹恩、吳泰伯,X光繞射原理與材料結構分析,中國材料科學學會,1993。
[23]汪建民,材料分析,中國材料科學學會,1998。
[24]I. C. Noyan, J. B. Cohen, Residual Stress Measurement by Diffraction and Interpretation, Springer, New York, 1987.
[25]M. Harting, S. Woodford, D. Knoesen, R. Bucher, D.T. Britton, “Stress in Hydrogenated Amorphous Silicon Determined by X-ray Diffraction”, Thin Solid Films 430 (2003), pp.153-156.
[26]黃炳淮,“X光繞射在殘留應力之應用”,科儀新知,第22卷第二期(1990),p.22。
[27]Hong Xiao, Introduction to Semiconductor Manufacturing Technology, Prentice Hall, 2001.
[28]N. Kietipaisalsophon, W. Bunjongpru, W. Techitdheera, J. Nukeaw, “Structure Properties of Cubic-AlN Grown by Reactive Gas-Timing Rf Magnetron Sputtering”, IEEE ICIT, Bangkok, THAILAND, (2002) pp.1365-1367.
[29]Hwan-Chul Lee, Guen-Hong Kim, Soon-Ku Hong, Ki-Young Lee, Yoon-Joong Yong, Chang-Hwan Chun, Jai-Young Lee, “Influence of Sputtering Pressure on the Microstructure Evolution of AlN Thin Films Prepared by Reactive Spttering”, Thin Solid Films, 261 (1995), pp.148-453.
[30]Ichiro Yonenaga, Toshiyuki Shima and Marcel H. F. Sluiter, “Nano-Indentation Hardness and Elastic Moduli of Bulk Single-Crystal AlN”, Jpn. J. Appl. Phys. Vol. 41 (2002), pp.4620-4621.
[31]I. Kraus, N. Ganev, G. Gosmanova, H.D. Tietz, L. Pfeiffer, S. Bohm, “Residual Stress Measurement in Alumina Coatings”, Materials Science and Engineering, A199 (1995), pp.15-17.
[32]戴嘉信,懸浮結構之模擬與製作,2003年6月,國立中央大學機械工程系碩士論文。
[33]蕭鉉樺,摻雜氮之矽化鈷薄膜研究及微鏡面結構製作,2002年6月,國立中興大學電機 工程系碩士論文。
[34]丁志華、朱宏松、陳大中、蘇翔,“X光光罩吸收劑材料之評估”,奈米通訊第五卷第二期。
QRCODE
 
 
 
 
 
                                                                                                                                                                                                                                                                                                                                                                                                               
第一頁 上一頁 下一頁 最後一頁 top