|
參考文獻
[1] L. R. Fox, J. W. Sofia, M. C. Shine, “Investigation of Solder Fatigue Acceleration Factor”, IEEE Transactions on Components, Hybrids and Manufacturing Technology, Vol. Chmt-8, No. 2, pp.275-282, June 1985. [2] R. V. Gestel, K. D. Zeeuw, L. V. Gemert, E. Bagerman, “Comparison of Delamination Effect between Temperature Cycling Test and Highly Accelerated Stress Test in Plastic Packaged Devices”, Delft University of Technology, pp.177-181, 1992. [3] J. Sauber, L. Lee, S. Hsu, T. Hongsmatip, “Fracture Properties of Molding Compound Materials for IC Plastic Packaging”, Digital Equipment Corporation, pp.164-170, 1994. [4] M. Guida, M. Giorgio, “Reliability Analysis of Accelerated Life-Test Data from a Repairable System”, IEEE Transactions on Reliability, Vol. 44, No. 2, pp.337-346, June 1995. [5] R. Iannuzzelli, “The Reliability Nomograph–A Quick, Easy-to-use Graphical Predictor of Package/Module Interconnect Reliability”, Intersociety Conference on Thermal Phenomena, pp.89-99, 1996. [6] B. K. Liew, N. W. Cheung, C. Hu, “Effects of High Current Pulses on Integrated Circuit Metallization Reliability”, 1998. [7] P. Lall, K. Banerji, “Assembly-level Reliability Characterization of Chip-Scale Packages”, Electronic Components and Technology Conference, pp.482-494, 1998. [8] H. Berek, V. Tiederie, T. Fritzsch, “New Methods in Accelerated Reliability Testing of Electronic Components for Automotives under Field Conditions”, IEEE/CPMT Electronics Manufacturing Technology Symposium, pp.143-146, 1998. [9] Z. Qian, M. Lu, W. Ren, S. Liu, “Fatigue Life Prediction of Flip-Chips in Terms of Nonlinear Behaviors of Solder and Underfill”, Electronic Components and Technology Conference, pp.141-148, 1999. [10] J. Kuang, S. Boggs, “Computation of Thermo-Chemical Phenomena Related to High Temperature HPFF Cable Operation”, IEEE Transactions on Power Delivery, Vol. 16, No. 4, pp.449-455, October 2001. [11] J. H. L. Pang, K. H. Ang, X. Q. Shi, Z. P. Wang, “Mechanical Deflection System (MDS) Test and Methodology for PBGA Solder Joint Reliability”, IEEE Transactions on Advanced Packaging, Vol. 24, No. 4, pp.507-514, November 2001. [12] A. Schubert, R.Doring, H. Walter, E. Auerswald, A. Gollhardt, B. Michel, “Thermo-mechanical Reliability of Lead-free Solder Interconnects”, 8th International Symposium on Advanced Packaging Materials, pp.90-96, 2002. [13] J. Y. Deletage, F. J. M. Verdier, B. Plano, Y. Danto, “Reliability Estimation of BGA & CSP Assemblies Using Degradation Law Model and Technological Parameters Deviations”, Proceedings of 9th IPFA, 2002. [14] P. Towashiraporn, G. Subbarayan, B.C. Hunter, D. Love, and B. Sullivan, ”The Effect of Model Building on the Accuracy of Fatigue Life Predictions in Electronic Packages”, Intersociety Conference on Thermal Phenomena, pp.854-861, 2002. [15] W. Neher, W. Kempe, W. Wondrak, W. Saucr, “Finite Element Analysis to Develop a New Accelerating Test Method for Board Level Solder Joints for High Temperature Electronics”, Electronic Components and Technology Conference, pp.221-228, 2003. [16] 王新榮, 陳時錦, 劉亞忠, “有限元素法及其應用”, 中央圖書出版社, 1997. [17] Courtney, Thomas H., “Mechanical Behavior of Materials”, McGraw-Hill, N.Y., 1990. [18] Wiese, A. Schubert, H. Walter, R. Dudek, F. Feustel, E. Meusel, B. Michel, “Constitutive Behavior of Lead-free Solders vs. Leadcontaining Solders-Experiments on Bulk Specimens and Flip Chip Joints”, IEEE Electronic Components and Technology Conference,2001. [19] J. H. Lau, S.W. R. Lee, “Effects of Bulid-Up Circuit Board Thickness on The Solder Joint Reliability of a Wafer level Chip Scale Package (WLCSP)”, IEEE Transactions on Components and Packaging Technologies, Vol. 25, No.1, pp.3-14, March 2002. [20] 王仁, 黃文彬, 黃筑平, “塑性力學引論”, 北京大學出版社, 1992. [21] J. Wang, Z. Qian, S. Liu, “Process Induced Stress of a Flip-Chip Packaging by Sequential Processing Modeling Technique”, Journal of Electronic Packaging, Vol. 120, pp.309-313, September 1998. [22] K.N. Chiang, Z.N. Liu, C.T. Peng, “Parametric Reliability Analysis of No-Underfill Flip Chip Package”, IEEE Transactions on Components and Packaging Technologies, Vol. 24, No. 4, pp.635-640, December 2001. [23] J. A. Collins, “Failure of Materials in Mechanical Design:Analysis, Prediction, Prevention”, John Wiley & Sons, Inc., 1993. [24] H. D. Solomon, “Fatigue of 60/40 Solder”, IEEE Transactions on Components, Hybrids and Manufacturing Technology, Vol. Chmt-9, No. 4, pp.423-432, December 1986. [25] S. L. Chen, C. Z. Tsai, E. B. Wu, C. A. Shao, “A Study in The Effect by The Parameters of A Flip-Chip BGA”, Proceedings of The 18th National Conference on Mechanical Engineering, pp.359-366, 2001. [26] ANSYS Structural Analysis Guide. [27] Z. Cheng, L. Chen, G. Wang, X. Xie, Q. Zhang, ”The Effects of Underfill and Its Material Models on Thermomechanical Behaviors of Flip Chip Package”, International Symposium on Electronic Materials & Packaging, pp.232-239, 2000. [28] D. E. Riemer, “Prediction of Temperature Cycling Life for SMT Solder Joints on TCE-Mismatched Substrates”, Electronic Components and Technology Conference, pp.418-425, 1990. [29] B. A. Zahn, “Solder Joint Fatigue Life Model Methodology for 63Sn37Pb and 95.5Sn4Ag0.5Cu Materials”, Electronic Components and Technology Conference, pp.83-94, 2003. [30] D. G. Yang, G. Q. Zhang, L. J. Ernst, C. V. Hof, J. F. J. Caers, H. J. L. Bressers, J. H. J. Janssen, “Investigation on Flip Chip Solder Joint Fatigue with Cure-Dependent Underfill Properties”, IEEE Transactions on Components and Packaging Technologies, Vol. 26, No. 2, pp.388-398, June 2003. [31] 金重勛, “機械材料”, 復文書局, 1992. [32]J. H. Lau, “Thermal Stress and Strain in Microelectronics Packaging”, Van Nostrand Reinhold, New York, 1993.
|