(3.236.214.19) 您好!臺灣時間:2021/05/10 07:08
字體大小: 字級放大   字級縮小   預設字形  
回查詢結果

詳目顯示:::

我願授權國圖
: 
twitterline
研究生:馬大鈞
研究生(外文):Da-Jung Ma
論文名稱:PDIC用光偵測器之量測與模擬
論文名稱(外文):Characterization and simulation of photosensor applied in PDIC
指導教授:林浩雄林浩雄引用關係
指導教授(外文):Hao-Hsiung Lin
學位類別:碩士
校院名稱:國立臺灣大學
系所名稱:電子工程學研究所
學門:工程學門
學類:電資工程學類
論文種類:學術論文
論文出版年:2004
畢業學年度:92
語文別:中文
論文頁數:80
中文關鍵詞:光偵測器光電轉換晶片光學讀取頭
外文關鍵詞:optical pick-up headPDICphotodetector
相關次數:
  • 被引用被引用:0
  • 點閱點閱:179
  • 評分評分:系統版面圖檔系統版面圖檔系統版面圖檔系統版面圖檔系統版面圖檔
  • 下載下載:0
  • 收藏至我的研究室書目清單書目收藏:0
本論文針對用於DVD光學讀寫頭之PDIC (Photo- Detector Integrated Circuit)內部的光偵測器元件,建構一套量測系統,藉以量測其頻譜反應。此外我們也建立一套程式以模擬光偵測器之反應度(responsivity)藉以擷取各項光偵測器重要物理參數,包括絕緣層厚度、載子擴散長度、元件結構等。程式中包括利用傳輸矩陣法(transmission matrix method)來估計入射光在具有介電層材料的偵測器中之反射與吸收,以及求解連續性方程式來處理所吸收少數載子的分佈與所收集到的光電流。利用這套程式,我們成它a模擬實際的PDIC元件,並完成重要元件參數的擷取。
In this thesis, the characterization and simulation for Si photodetectors in PDIC (photodetector integrated circuit) designed for DVD pick-up heads have been studied. A measurement system was set up to characterize the responsivity spectrum of commercial PDIC photodetectors. Simulation programs based on transmission matrix method and continuity equation were also developed to calculate the light reflection and absorption in the dielectrics and semiconductor, the photo-generated carrier distributions and the collection currents. The simulation programs were successfully used to fit the experimental responsivity spectrum so as to extract device parameters including the dielectric thickness, minority carrier diffusion length, surface recombination velocity and so on. The parameters were presented and can be utilized to optimize the structure of the PDIC photodetectors.
目錄
中文摘要---------------------------------------------------------------------------I
Abstract---------------------------------------------------------------------------II
目錄-------------------------------------------------------------------------------III
附表索引------------------------------------------------------------------------V
附圖索引------------------------------------------------------------------------VI
第一章 緒論----------------------------------------------------------------------1
第二章 理論與模擬程式的建立--------------------------------------------12
2-1 求解少數載子濃度分佈函數與擴散電流------------------12
2-2 介電材料層反射率的計算------------------------------------16
第三章 模擬結果與討論-----------------------------------------------------25
3-1 表面復合速率對PD反應度頻譜的影響-------------------25
3-2 半導體內空乏區位置對PD反應度頻譜的影響----------26
3-3 SiO2厚度對PD反應度頻譜的影響--------------------------27
3-4 少數載子擴散長度對反應度頻譜的影響------------------28
3-5 兩組PN junction構成的PD之模擬與探討----------------29
3-6 三組PN junction構成的PD之模擬與探討----------------30
第四章 PD反應度量測與擬合結果----------------------------------------46
4-1實驗設置與量測方法-------------------------------------------46
4-2 反應度量測結果------------------------------------------------47
4-3 擬合之流程與演算法------------------------------------------49
4-4 擬合結果與討論------------------------------------------------51
第五章 結論--------------------------------------------------------------------71
參考文獻-------------------------------------------------------------------------72
附錄A 連續方程式一般解之齊性解和特解發生重根情形之解
決方法-----------------------------------------------------------------76
參考文獻
[1]CXA2636N, CXA2637N, CXA2632EM, “PDIC for CD-R/RW
Achieves 32×Speed CD-R Write Performance, in SONY Semiconductor & LCD news,” Sony Co., CX-NEWS, Vol.26.
[2]李源欽, “PDIC與光學頭設計原理,” 工業技術研究院光電工 業研究所, 民國九十三年三月.
[3]鍾俊元, “DVD光學讀寫頭市場現況與技術趨勢,” 工業技術研究院光電工業研究所, 民國八十九年十二月.
[4]2000年可讀寫型DVD產業及技術動態調查, 光電科技工業
協進會, 民國九十年三月.
[5]SLK3001PE, “Ultrahigh-speed Optical Integration Device that Achieves 10×Speed DVD Playback Laser Coupler in SONY Semiconductor & LCD news,” Sony Co., CX-NEWS, Vol.16. 2003.
[6]GA103T8R1MZ, “OPIC Light Detectors in Products Specification,” Sharp Co., 2004.
[7]HUL6274, “Products Specification in Hologram Unit,” Panasonic Co., 2003.
[8]Blu-ray FAQ, http://www.blu-ray.com
[9]Donald A. Neamen, “Semiconductor Physics & Devices,” IRWIN Ltd., pp.280-290, 1992.

[10]William Liu, “Fundamentals of III-V devices,” John Wiley & Sons Ltd., pp.42-50, 1999.
[11]L. A. Coldren, “Diode Lasers and Photonic Integrated Circuits,” John Wiley & Sons Ltd., pp.66-78, 1995.
[12]王鴻儒, “Excel 2002 VBA程式設計,” 博碩文化, pp.72-345, 2002.
[13]Sze, “Physics of semiconductor devices 2nd ed.,” John Wiley & Sons,
Inc., pp.800, 1985.
[14]Michael H. Jones, Stephen H. Jones, “Optical Properties of Silicon,”
Virginia semiconductor, Inc., Http://www.virginiasemi.com
[15]Erwin Kreyszig, “Advanced engineering mathematics 8th edition,” John Wiley & Sons, Ltd., pp.104-105, 1999.
[16]Erwin Kreyszig, “Advanced engineering mathematics8th edition,” John Wiley & Sons, Ltd., pp.74-75, 1999.
[17]Sze, “Physics of semiconductor devices 2nd ed.,” John Wiley & Sons,
Inc., pp.802-803, 1985.
[18]Shyh Wang, “SOLID-STATE ELECTRONICS,” McGRAW-HILL
Inc., pp.347, 1977 .
[19]Sze, “Physics of semiconductor devices 2nd ed.,” John Wiley & Sons,
Inc., pp.755, 1985.
[20]Sze, “Physics of semiconductor devices 2nd ed.,” John Wiley & Sons,
Inc., pp.749, 1985.

[21]R. Hull, “Properties of Crystalline Silicon,” INSPEC, IEE, pp.72-79,
1999.
[22]IOFFE Physico-Technical Institute, “n, k database,”
http://www.ioffe.rssi.ru/SVA/NSM/Semicond
[23]John P.,and McKelvey, “Solid State & Semiconductor Physics,”
New York : Harper & Row, pp.346-350, 1966.
[24]Harris Benson, “University Physics Revised Edition,” John Wiley & Sons, Inc., pp.766-768, 1995.
[25]Donald A. Neamen, “Semiconductor Physics & Devices,” IRWIN
Ltd., pp.184, 1992.
[26]Dietmar Knipp, Patrick G. Herzog, and Helmut Stiebig, “Stacked
amorphous silicon color sensors,” IEEE Transc. Electron Devices,
vol.49, No.1, 2002.
[27]Wyszecki, and Gunter, “Color science : concepts and methods,
quantitative data and formulae 2nd ,” John Wiley & Sons, Inc., 1982.
[28]Light intensity spectrum, ”Tungsten-Halogen Visible source,
ASB-W-030 in Products catalog,” ONSET Electro-Optics CO., Ltd.,
pp.8-50, 2004.
[29]Silicon photo-detector Responsivity spectrum, “Silicon photo-
detector, 818UV in Newport Corporation Detector Calibration
Report,” Newport Co., pp.1, 1992.

[30]“Model SR570 low-noise current amplifier manual, ”Stanford
Research Systems, Ltd., 1999.
[31]C. J. Savant, Martin S. Roden, Gordon L. Carpenter, “Electronic
Design Circuits and System,” pp.409, 1991.
[32]Light intensity spectrum, “Xenon Fiber Optic Light source,
ASB-XE-175EX in Products catalog,” ONSET Electro-Optics CO.
Ltd., pp.8-51, 2004.
[33]Sze, “Physics of semiconductor devices 2nd ed.,” John Wiley & Sons,
Inc., pp.393, 1985.
QRCODE
 
 
 
 
 
                                                                                                                                                                                                                                                                                                                                                                                                               
第一頁 上一頁 下一頁 最後一頁 top
系統版面圖檔 系統版面圖檔