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研究生:黃晨富
研究生(外文):Chen-Fu Huang
論文名稱:應用模擬退火演算法在晶片系統之測試排程研究
論文名稱(外文):SoC Test Scheduling using Simulated Annealing Algorithm
指導教授:李宗演李宗演引用關係
指導教授(外文):Trong-Yen Lee
學位類別:碩士
校院名稱:國立臺北科技大學
系所名稱:電腦通訊與控制研究所
學門:工程學門
學類:電資工程學類
論文種類:學術論文
論文出版年:2004
畢業學年度:92
語文別:中文
論文頁數:52
中文關鍵詞:模擬退火SoC測試排程序列對
外文關鍵詞:Simulated annealingSoC test schedulingSequence pair
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隨著半導體製程快速的進步,晶片系統(System-on-Chip, SoC)變成整合電腦通訊及消費性產品等整合之核心技術,其中測試排程在SoC測試自動化技術中是一個重要的關鍵。在本論文中我們提出了一個使用在晶片系統之測試排程研究的模擬退火演算法(Simulated annealing),並且使用序列對(Sequence pair)來表示各個SoC core之間的關係,因為晶片系統之測試排程可以轉換成一個二維的裝箱問題,在晶片系統之測試排程我們也同時考慮功率的限制問題和閒置時間(Idle time)的問題,我們以IEEE ICT’02 Benchmark中所提供的SoC Core的資料作為測試樣本,應用我們所提出的排程演算法之實驗結果與相關研究可以發現比本研究可減少3% ~ 24%的測試排程時間
As the semiconductor technology has made great progress, System-on-a-Chip (SoC) has become the kernel technologies for integrating computer, consumer, and communication. Test scheduling is an important problem in SoC test automation. In this paper, we propose a SoC test scheduling method which is based on simulated annealing algorithm. A data structure, called a sequence pair, is used to represent the placement of rectangles, because the scheduling is formulated as a two-dimensional bin packing problem. We also consider power consumption restriction and reduce idle time in SoC test scheduling. Experiments are conducted on ITC’02 benchmarks. Experiment results show our proposed method is efficiently and the test time is shorter than earlier methods about 3% ~ 24%.
中文摘要 i
英文摘要 ii
誌謝 iii
目錄 iv
表目錄 v
圖目錄 vi
第一章 導論 1
1.1 簡介 1
1.2 研究目的 3
1.3 本論文之貢獻 4
1.4 論文架構 4
第二章 測試排程的相關文獻 5
第三章 模擬退火演算法 10
3.1 模擬退火的原理及物理現象 10
3.1.1 波茲曼機率分布函數 11
3.1.2 梯度搜尋法 12
3.2 模擬退火法演算過程 13
3.3 序列對表示法 17
第四章 以模擬退火演算法解晶片系統測試排程的問題 21
4.1 柏拉圖最佳點(Pareto-optimal points) 21
4.2 擾亂的機制 25
4.3 考慮功率限制額度 30
4.4 閒置時間(Idel time)的消除 30
4.5 本論文所提出之演算法 32
第五章 實驗結果 35
第六章 結論與未來展望 45
6.1結論 45
6.2未來展望 45
參考文獻 46
附錄 A 2004 VLSI/CAD. Conference 已接受之論文
『SOC TEST SCHEDULING USING SIMULATED
ANNEALING ALGORITHM』 48
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[7] IEEE P1500 Standard for Embedded Core Test (SECT), http://grouper.ieee.org/groups/1500/
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[21] E. J. Marimissen, V. Iyenger and K. Chakrabarty. ITC2002 SoC benchmarkinginitiative, http://www.extra.research.philips.com/itc02SoCbenchm
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